Test method evaluation experiments and data

Test method evaluation experiments and data

Understanding the effectiveness of their production tests is a critical task for IC suppliers. Numerous trends suggesting that conventionally applied test methods must change to meet future needs will make the task even more critical-and difficult-in the future. This paper presents characterization...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Nigh, P., Gattiker, A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Acceleration
Added delay
Bridge circuits
Circuit testing
Failure analysis
Integrated circuit testing
Leakage current
Logic testing
Time to market
Voltage
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Beschreibung
Zusammenfassung:Understanding the effectiveness of their production tests is a critical task for IC suppliers. Numerous trends suggesting that conventionally applied test methods must change to meet future needs will make the task even more critical-and difficult-in the future. This paper presents characterization and diagnostic data and ideas aimed at helping IC suppliers understand test effectiveness.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2000.894237