Looking for Quality in TCAD-Based Papers

During the past few years, we have seen an increasing number of submissions of "physics-based simulation only" papers to the IEEE TRANSACTIONS ON ELECTRON DEVICES (T-ED). The popularity of such papers may be explained by the fact that the present widespread technology computer-aided design...

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Veröffentlicht in:IEEE transactions on electron devices 2019-08, Vol.66 (8), p.3252-3253
1. Verfasser: Ghione, Giovanni
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creator Ghione, Giovanni
description During the past few years, we have seen an increasing number of submissions of "physics-based simulation only" papers to the IEEE TRANSACTIONS ON ELECTRON DEVICES (T-ED). The popularity of such papers may be explained by the fact that the present widespread technology computer-aided design (TCAD) tools are a significant and welcome boost to creativity in the electronic device community. In fact, TCAD tools allow researchers to explore and optimize device structures without being burdened by technology concerns in terms of availability, cost, and time delay.
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_8768451</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8768451</ieee_id><sourcerecordid>2264429904</sourcerecordid><originalsourceid>FETCH-LOGICAL-c333t-f52a37cfa2170d44da6a7f92b027d384fd4dcd1d2ad4f8bc56f35d74aaa5c0c3</originalsourceid><addsrcrecordid>eNo9kEtLw0AURgdRsFb3gpuAGzeJ857Msqb1AQUVsh9u5yGpNYkzzaL_3pQUV5cL5_vu5SB0S3BBCNaP9WpZUEx0QTXlTOIzNCNCqFxLLs_RDGNS5pqV7BJdpbQdV8k5naGHddd9N-1XFrqYfQ6wa_aHrGmzulos8ydI3mUf0PuYrtFFgF3yN6c5R_Xzqq5e8_X7y1u1WOeWMbbPg6DAlA1AicKOcwcSVNB0g6lyrOTBcWcdcRQcD-XGChmYcIoDgLDYsjm6n2r72P0OPu3NthtiO140lB5f1hrzkcITZWOXUvTB9LH5gXgwBJujDjPqMEcd5qRjjNxNkcZ7_4-XSpZcEPYHLjlZrQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2264429904</pqid></control><display><type>article</type><title>Looking for Quality in TCAD-Based Papers</title><source>IEEE Electronic Library (IEL)</source><creator>Ghione, Giovanni</creator><creatorcontrib>Ghione, Giovanni</creatorcontrib><description>During the past few years, we have seen an increasing number of submissions of "physics-based simulation only" papers to the IEEE TRANSACTIONS ON ELECTRON DEVICES (T-ED). The popularity of such papers may be explained by the fact that the present widespread technology computer-aided design (TCAD) tools are a significant and welcome boost to creativity in the electronic device community. In fact, TCAD tools allow researchers to explore and optimize device structures without being burdened by technology concerns in terms of availability, cost, and time delay.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2019.2924360</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>CAD ; Computer aided design ; Computer simulation ; Time lag</subject><ispartof>IEEE transactions on electron devices, 2019-08, Vol.66 (8), p.3252-3253</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c333t-f52a37cfa2170d44da6a7f92b027d384fd4dcd1d2ad4f8bc56f35d74aaa5c0c3</citedby><orcidid>0000-0002-2362-6458</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8768451$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8768451$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ghione, Giovanni</creatorcontrib><title>Looking for Quality in TCAD-Based Papers</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>During the past few years, we have seen an increasing number of submissions of "physics-based simulation only" papers to the IEEE TRANSACTIONS ON ELECTRON DEVICES (T-ED). The popularity of such papers may be explained by the fact that the present widespread technology computer-aided design (TCAD) tools are a significant and welcome boost to creativity in the electronic device community. In fact, TCAD tools allow researchers to explore and optimize device structures without being burdened by technology concerns in terms of availability, cost, and time delay.</description><subject>CAD</subject><subject>Computer aided design</subject><subject>Computer simulation</subject><subject>Time lag</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEtLw0AURgdRsFb3gpuAGzeJ857Msqb1AQUVsh9u5yGpNYkzzaL_3pQUV5cL5_vu5SB0S3BBCNaP9WpZUEx0QTXlTOIzNCNCqFxLLs_RDGNS5pqV7BJdpbQdV8k5naGHddd9N-1XFrqYfQ6wa_aHrGmzulos8ydI3mUf0PuYrtFFgF3yN6c5R_Xzqq5e8_X7y1u1WOeWMbbPg6DAlA1AicKOcwcSVNB0g6lyrOTBcWcdcRQcD-XGChmYcIoDgLDYsjm6n2r72P0OPu3NthtiO140lB5f1hrzkcITZWOXUvTB9LH5gXgwBJujDjPqMEcd5qRjjNxNkcZ7_4-XSpZcEPYHLjlZrQ</recordid><startdate>20190801</startdate><enddate>20190801</enddate><creator>Ghione, Giovanni</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-2362-6458</orcidid></search><sort><creationdate>20190801</creationdate><title>Looking for Quality in TCAD-Based Papers</title><author>Ghione, Giovanni</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c333t-f52a37cfa2170d44da6a7f92b027d384fd4dcd1d2ad4f8bc56f35d74aaa5c0c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>CAD</topic><topic>Computer aided design</topic><topic>Computer simulation</topic><topic>Time lag</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ghione, Giovanni</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ghione, Giovanni</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Looking for Quality in TCAD-Based Papers</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2019-08-01</date><risdate>2019</risdate><volume>66</volume><issue>8</issue><spage>3252</spage><epage>3253</epage><pages>3252-3253</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>During the past few years, we have seen an increasing number of submissions of "physics-based simulation only" papers to the IEEE TRANSACTIONS ON ELECTRON DEVICES (T-ED). The popularity of such papers may be explained by the fact that the present widespread technology computer-aided design (TCAD) tools are a significant and welcome boost to creativity in the electronic device community. In fact, TCAD tools allow researchers to explore and optimize device structures without being burdened by technology concerns in terms of availability, cost, and time delay.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TED.2019.2924360</doi><tpages>2</tpages><orcidid>https://orcid.org/0000-0002-2362-6458</orcidid><oa>free_for_read</oa></addata></record>
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subjects CAD
Computer aided design
Computer simulation
Time lag
title Looking for Quality in TCAD-Based Papers
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T02%3A49%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Looking%20for%20Quality%20in%20TCAD-Based%20Papers&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Ghione,%20Giovanni&rft.date=2019-08-01&rft.volume=66&rft.issue=8&rft.spage=3252&rft.epage=3253&rft.pages=3252-3253&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/TED.2019.2924360&rft_dat=%3Cproquest_RIE%3E2264429904%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2264429904&rft_id=info:pmid/&rft_ieee_id=8768451&rfr_iscdi=true