Comments on "A Generic Approach for Permittivity Measurement of Dielectric Materials Using a Discontinuity in a Rectangular Waveguide"

This letter is intended to point out a few typing mistakes in the above paper [1] , which discusses computing the complex permittivity of a dielectric material embedded in a rectangular waveguide or a microstrip line, and to suggest corrections to its formulation.

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on microwave theory and techniques 2019-08, Vol.67 (8), p.3506-3506
Hauptverfasser:	Rotava, Andre, Silva, Renato A. O., Dias, Mauricio H. C., Santos, Jose C. A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Complex permittivity Dielectric materials Dielectrics Microstrip transmission lines Permittivity Permittivity measurement Rectangular waveguides Scattering parameters Waveguide discontinuities
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	3506
container_issue	8
container_start_page	3506
container_title	IEEE transactions on microwave theory and techniques
container_volume	67
creator	Rotava, Andre Silva, Renato A. O. Dias, Mauricio H. C. Santos, Jose C. A.
description	This letter is intended to point out a few typing mistakes in the above paper [1] , which discusses computing the complex permittivity of a dielectric material embedded in a rectangular waveguide or a microstrip line, and to suggest corrections to its formulation.
doi_str_mv	10.1109/TMTT.2019.2925005
format	Article
fullrecord	<record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_8759983</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8759983</ieee_id><sourcerecordid>2275627712</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-e5ef2848eb61ee122a59ba3406ee3d882b72b3c6d863a33dbe2fe7784a384b273</originalsourceid><addsrcrecordid>eNo9kM9KAzEQh4MoWKsPIF6Cnrfmz2aTHEvVKlgUWfG4ZLezNaXN1iQr9AV8brNUPIXJfN8M80PokpIJpUTflouynDBC9YRpJggRR2hEhZCZLiQ5RiNCqMp0rsgpOgthncpcEDVCP7NuuwUXA-4cvp7iOTjwtsHT3c53pvnEbefxK_itjdF-27jHCzCh9zBIuGvxnYUNNHFwFiYm12wCfg_WrbBJzdB0LlrXD6Z16estwcat-o3x-MN8w6q3S7g-RydtEuHi7x2j94f7cvaYPb_Mn2bT56xhmscMBLRM5QrqggJQxozQteE5KQD4UilWS1bzpliqghvOlzWwFqRUueEqr5nkY3RzmJuu--ohxGrd9d6llRVjUhRMSsoSRQ9U47sQPLTVztut8fuKkmqIuxriroa4q7-4k3N1cCwA_PNKCq0V5791hH10</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2275627712</pqid></control><display><type>article</type><title>Comments on "A Generic Approach for Permittivity Measurement of Dielectric Materials Using a Discontinuity in a Rectangular Waveguide"</title><source>IEEE Electronic Library (IEL)</source><creator>Rotava, Andre ; Silva, Renato A. O. ; Dias, Mauricio H. C. ; Santos, Jose C. A.</creator><creatorcontrib>Rotava, Andre ; Silva, Renato A. O. ; Dias, Mauricio H. C. ; Santos, Jose C. A.</creatorcontrib><description>This letter is intended to point out a few typing mistakes in the above paper <xref ref-type="bibr" rid="ref1">[1] , which discusses computing the complex permittivity of a dielectric material embedded in a rectangular waveguide or a microstrip line, and to suggest corrections to its formulation.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2019.2925005</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Complex permittivity ; Dielectric materials ; Dielectrics ; Microstrip transmission lines ; Permittivity ; Permittivity measurement ; Rectangular waveguides ; Scattering parameters ; Waveguide discontinuities</subject><ispartof>IEEE transactions on microwave theory and techniques, 2019-08, Vol.67 (8), p.3506-3506</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-e5ef2848eb61ee122a59ba3406ee3d882b72b3c6d863a33dbe2fe7784a384b273</citedby><cites>FETCH-LOGICAL-c293t-e5ef2848eb61ee122a59ba3406ee3d882b72b3c6d863a33dbe2fe7784a384b273</cites><orcidid>0000-0002-5545-251X ; 0000-0001-6812-5983 ; 0000-0002-6044-3431</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8759983$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8759983$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rotava, Andre</creatorcontrib><creatorcontrib>Silva, Renato A. O.</creatorcontrib><creatorcontrib>Dias, Mauricio H. C.</creatorcontrib><creatorcontrib>Santos, Jose C. A.</creatorcontrib><title>Comments on "A Generic Approach for Permittivity Measurement of Dielectric Materials Using a Discontinuity in a Rectangular Waveguide"</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>This letter is intended to point out a few typing mistakes in the above paper <xref ref-type="bibr" rid="ref1">[1] , which discusses computing the complex permittivity of a dielectric material embedded in a rectangular waveguide or a microstrip line, and to suggest corrections to its formulation.</description><subject>Complex permittivity</subject><subject>Dielectric materials</subject><subject>Dielectrics</subject><subject>Microstrip transmission lines</subject><subject>Permittivity</subject><subject>Permittivity measurement</subject><subject>Rectangular waveguides</subject><subject>Scattering parameters</subject><subject>Waveguide discontinuities</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM9KAzEQh4MoWKsPIF6Cnrfmz2aTHEvVKlgUWfG4ZLezNaXN1iQr9AV8brNUPIXJfN8M80PokpIJpUTflouynDBC9YRpJggRR2hEhZCZLiQ5RiNCqMp0rsgpOgthncpcEDVCP7NuuwUXA-4cvp7iOTjwtsHT3c53pvnEbefxK_itjdF-27jHCzCh9zBIuGvxnYUNNHFwFiYm12wCfg_WrbBJzdB0LlrXD6Z16estwcat-o3x-MN8w6q3S7g-RydtEuHi7x2j94f7cvaYPb_Mn2bT56xhmscMBLRM5QrqggJQxozQteE5KQD4UilWS1bzpliqghvOlzWwFqRUueEqr5nkY3RzmJuu--ohxGrd9d6llRVjUhRMSsoSRQ9U47sQPLTVztut8fuKkmqIuxriroa4q7-4k3N1cCwA_PNKCq0V5791hH10</recordid><startdate>20190801</startdate><enddate>20190801</enddate><creator>Rotava, Andre</creator><creator>Silva, Renato A. O.</creator><creator>Dias, Mauricio H. C.</creator><creator>Santos, Jose C. A.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-5545-251X</orcidid><orcidid>https://orcid.org/0000-0001-6812-5983</orcidid><orcidid>https://orcid.org/0000-0002-6044-3431</orcidid></search><sort><creationdate>20190801</creationdate><title>Comments on "A Generic Approach for Permittivity Measurement of Dielectric Materials Using a Discontinuity in a Rectangular Waveguide"</title><author>Rotava, Andre ; Silva, Renato A. O. ; Dias, Mauricio H. C. ; Santos, Jose C. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-e5ef2848eb61ee122a59ba3406ee3d882b72b3c6d863a33dbe2fe7784a384b273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Complex permittivity</topic><topic>Dielectric materials</topic><topic>Dielectrics</topic><topic>Microstrip transmission lines</topic><topic>Permittivity</topic><topic>Permittivity measurement</topic><topic>Rectangular waveguides</topic><topic>Scattering parameters</topic><topic>Waveguide discontinuities</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rotava, Andre</creatorcontrib><creatorcontrib>Silva, Renato A. O.</creatorcontrib><creatorcontrib>Dias, Mauricio H. C.</creatorcontrib><creatorcontrib>Santos, Jose C. A.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rotava, Andre</au><au>Silva, Renato A. O.</au><au>Dias, Mauricio H. C.</au><au>Santos, Jose C. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comments on "A Generic Approach for Permittivity Measurement of Dielectric Materials Using a Discontinuity in a Rectangular Waveguide"</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2019-08-01</date><risdate>2019</risdate><volume>67</volume><issue>8</issue><spage>3506</spage><epage>3506</epage><pages>3506-3506</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>This letter is intended to point out a few typing mistakes in the above paper <xref ref-type="bibr" rid="ref1">[1] , which discusses computing the complex permittivity of a dielectric material embedded in a rectangular waveguide or a microstrip line, and to suggest corrections to its formulation.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TMTT.2019.2925005</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0002-5545-251X</orcidid><orcidid>https://orcid.org/0000-0001-6812-5983</orcidid><orcidid>https://orcid.org/0000-0002-6044-3431</orcidid></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISSN: 0018-9480
ispartof	IEEE transactions on microwave theory and techniques, 2019-08, Vol.67 (8), p.3506-3506
issn	0018-9480 1557-9670
language	eng
recordid	cdi_ieee_primary_8759983
source	IEEE Electronic Library (IEL)
subjects	Complex permittivity Dielectric materials Dielectrics Microstrip transmission lines Permittivity Permittivity measurement Rectangular waveguides Scattering parameters Waveguide discontinuities
title	Comments on "A Generic Approach for Permittivity Measurement of Dielectric Materials Using a Discontinuity in a Rectangular Waveguide"
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T04%3A19%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comments%20on%20%22A%20Generic%20Approach%20for%20Permittivity%20Measurement%20of%20Dielectric%20Materials%20Using%20a%20Discontinuity%20in%20a%20Rectangular%20Waveguide%22&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Rotava,%20Andre&rft.date=2019-08-01&rft.volume=67&rft.issue=8&rft.spage=3506&rft.epage=3506&rft.pages=3506-3506&rft.issn=0018-9480&rft.eissn=1557-9670&rft.coden=IETMAB&rft_id=info:doi/10.1109/TMTT.2019.2925005&rft_dat=%3Cproquest_RIE%3E2275627712%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2275627712&rft_id=info:pmid/&rft_ieee_id=8759983&rfr_iscdi=true