Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning
Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase r...
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| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2020-06, Vol.62 (3), p.848-858 |
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| container_title | IEEE transactions on electromagnetic compatibility |
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| creator | Marathe, Shubhankar Chen, Zongyi Ghosh, Kaustav Kajbaf, Hamed Frei, Stephan Sorensen, Morten Pommerenke, David Min, Jin |
| description | Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as vector network analyzers (VNAs) and oscilloscopes at tens of GHz. This paper introduces and optimizes a cost-effective SA-based phase measurement method and compares the results to a VNA and oscilloscope-based methods for EMI signal sources. The measured-phase distribution obtained from the three different instruments is additionally compared with the simulated phase determined from full-wave simulation. The three measurement methods are compared based on the type of signal spectrum to be measured, such as single or multiple frequencies, signals requiring low-resolution bandwidth measurements, or transient signal events. The SA-based phase measurement technique is designed to operate from 5 to 12 GHz. However, the system frequency bandwidth is limited only by the frequency bandwidth of the individual RF components used in the SA measurement system. |
| doi_str_mv | 10.1109/TEMC.2019.2920344 |
| format | Article |
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Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as vector network analyzers (VNAs) and oscilloscopes at tens of GHz. This paper introduces and optimizes a cost-effective SA-based phase measurement method and compares the results to a VNA and oscilloscope-based methods for EMI signal sources. The measured-phase distribution obtained from the three different instruments is additionally compared with the simulated phase determined from full-wave simulation. The three measurement methods are compared based on the type of signal spectrum to be measured, such as single or multiple frequencies, signals requiring low-resolution bandwidth measurements, or transient signal events. The SA-based phase measurement technique is designed to operate from 5 to 12 GHz. However, the system frequency bandwidth is limited only by the frequency bandwidth of the individual RF components used in the SA measurement system.</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2019.2920344</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Attenuators ; Bandwidths ; Computer simulation ; Electromagnetic interference ; Electromagnetic interference (EMI) ; Far fields ; Frequency measurement ; Measurement methods ; Measurement techniques ; near-field measurements ; Network analysers ; oscilloscope ; Oscilloscopes ; Phase distribution ; Phase measurement ; phase-resolved measurements ; Probes ; Scanning ; Spectrum allocation ; Spectrum analysers ; spectrum analyzer (SA) ; Switches ; vector network analyzer (VNA) ; Voltage control</subject><ispartof>IEEE transactions on electromagnetic compatibility, 2020-06, Vol.62 (3), p.848-858</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c336t-ffe0873f5f18675bb403ad37073e1813065716fd3c8d32ff074e6caf96b5318f3</citedby><cites>FETCH-LOGICAL-c336t-ffe0873f5f18675bb403ad37073e1813065716fd3c8d32ff074e6caf96b5318f3</cites><orcidid>0000-0002-8917-3914 ; 0000-0003-1928-9580 ; 0000-0002-0649-8159 ; 0000-0002-8343-7413 ; 0000-0002-4267-2417 ; 0000-0002-1655-576X ; 0000-0002-3637-7833</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8743430$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8743430$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Marathe, Shubhankar</creatorcontrib><creatorcontrib>Chen, Zongyi</creatorcontrib><creatorcontrib>Ghosh, Kaustav</creatorcontrib><creatorcontrib>Kajbaf, Hamed</creatorcontrib><creatorcontrib>Frei, Stephan</creatorcontrib><creatorcontrib>Sorensen, Morten</creatorcontrib><creatorcontrib>Pommerenke, David</creatorcontrib><creatorcontrib>Min, Jin</creatorcontrib><title>Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as vector network analyzers (VNAs) and oscilloscopes at tens of GHz. This paper introduces and optimizes a cost-effective SA-based phase measurement method and compares the results to a VNA and oscilloscope-based methods for EMI signal sources. The measured-phase distribution obtained from the three different instruments is additionally compared with the simulated phase determined from full-wave simulation. The three measurement methods are compared based on the type of signal spectrum to be measured, such as single or multiple frequencies, signals requiring low-resolution bandwidth measurements, or transient signal events. The SA-based phase measurement technique is designed to operate from 5 to 12 GHz. However, the system frequency bandwidth is limited only by the frequency bandwidth of the individual RF components used in the SA measurement system.</description><subject>Attenuators</subject><subject>Bandwidths</subject><subject>Computer simulation</subject><subject>Electromagnetic interference</subject><subject>Electromagnetic interference (EMI)</subject><subject>Far fields</subject><subject>Frequency measurement</subject><subject>Measurement methods</subject><subject>Measurement techniques</subject><subject>near-field measurements</subject><subject>Network analysers</subject><subject>oscilloscope</subject><subject>Oscilloscopes</subject><subject>Phase distribution</subject><subject>Phase measurement</subject><subject>phase-resolved measurements</subject><subject>Probes</subject><subject>Scanning</subject><subject>Spectrum allocation</subject><subject>Spectrum analysers</subject><subject>spectrum analyzer (SA)</subject><subject>Switches</subject><subject>vector network analyzer (VNA)</subject><subject>Voltage control</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMFKAzEQhoMoWKsPIF4CnlOTnWSTPday1UKrQit4C-nuRLe0uzXZPdSnd0vF08_A9w8zHyG3go-E4NnDKl9MRgkX2SjJEg5SnpGBUMowYfTHORlwLgzLQKtLchXjph-lSmBA8uUeizZ0Ozqu3fbwg4E9uoglffvqgy7QxS7gDuuW-ibQF3SBTSvcljRfzOiycHVd1Z_X5MK7bcSbvxyS92m-mjyz-evTbDKeswIgbZn3yI0Gr7wwqVbrteTgStBcAwojgKdKi9SXUJgSEu-5lpgWzmfpWoEwHobk_rR3H5rvDmNrN00X-sOjTWT_EYBOsp4SJ6oITYwBvd2HaufCwQpuj7bs0ZY92rJ_tvrO3alTIeI_b7QECRx-AedJZCc</recordid><startdate>20200601</startdate><enddate>20200601</enddate><creator>Marathe, Shubhankar</creator><creator>Chen, Zongyi</creator><creator>Ghosh, Kaustav</creator><creator>Kajbaf, Hamed</creator><creator>Frei, Stephan</creator><creator>Sorensen, Morten</creator><creator>Pommerenke, David</creator><creator>Min, Jin</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-8917-3914</orcidid><orcidid>https://orcid.org/0000-0003-1928-9580</orcidid><orcidid>https://orcid.org/0000-0002-0649-8159</orcidid><orcidid>https://orcid.org/0000-0002-8343-7413</orcidid><orcidid>https://orcid.org/0000-0002-4267-2417</orcidid><orcidid>https://orcid.org/0000-0002-1655-576X</orcidid><orcidid>https://orcid.org/0000-0002-3637-7833</orcidid></search><sort><creationdate>20200601</creationdate><title>Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning</title><author>Marathe, Shubhankar ; Chen, Zongyi ; Ghosh, Kaustav ; Kajbaf, Hamed ; Frei, Stephan ; Sorensen, Morten ; Pommerenke, David ; Min, Jin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c336t-ffe0873f5f18675bb403ad37073e1813065716fd3c8d32ff074e6caf96b5318f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Attenuators</topic><topic>Bandwidths</topic><topic>Computer simulation</topic><topic>Electromagnetic interference</topic><topic>Electromagnetic interference (EMI)</topic><topic>Far fields</topic><topic>Frequency measurement</topic><topic>Measurement methods</topic><topic>Measurement techniques</topic><topic>near-field measurements</topic><topic>Network analysers</topic><topic>oscilloscope</topic><topic>Oscilloscopes</topic><topic>Phase distribution</topic><topic>Phase measurement</topic><topic>phase-resolved measurements</topic><topic>Probes</topic><topic>Scanning</topic><topic>Spectrum allocation</topic><topic>Spectrum analysers</topic><topic>spectrum analyzer (SA)</topic><topic>Switches</topic><topic>vector network analyzer (VNA)</topic><topic>Voltage control</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Marathe, Shubhankar</creatorcontrib><creatorcontrib>Chen, Zongyi</creatorcontrib><creatorcontrib>Ghosh, Kaustav</creatorcontrib><creatorcontrib>Kajbaf, Hamed</creatorcontrib><creatorcontrib>Frei, Stephan</creatorcontrib><creatorcontrib>Sorensen, Morten</creatorcontrib><creatorcontrib>Pommerenke, David</creatorcontrib><creatorcontrib>Min, Jin</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) Online</collection><collection>IEEE/IET Electronic Library</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Marathe, Shubhankar</au><au>Chen, Zongyi</au><au>Ghosh, Kaustav</au><au>Kajbaf, Hamed</au><au>Frei, Stephan</au><au>Sorensen, Morten</au><au>Pommerenke, David</au><au>Min, Jin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2020-06-01</date><risdate>2020</risdate><volume>62</volume><issue>3</issue><spage>848</spage><epage>858</epage><pages>848-858</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. 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| subjects | Attenuators Bandwidths Computer simulation Electromagnetic interference Electromagnetic interference (EMI) Far fields Frequency measurement Measurement methods Measurement techniques near-field measurements Network analysers oscilloscope Oscilloscopes Phase distribution Phase measurement phase-resolved measurements Probes Scanning Spectrum allocation Spectrum analysers spectrum analyzer (SA) Switches vector network analyzer (VNA) Voltage control |
| title | Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning |
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