Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network
The number of on-chip instruments, which are omnipresent in consumer electronics (CE) devices and used to monitor chips? performance, is increasing. The IEEE P1687 standard is used to streamline the access to on-chip instruments. However, the easy access to onchip instruments is prone to abuse. Atta...
Gespeichert in:
Veröffentlicht in: | IEEE consumer electronics magazine 2019-07, Vol.8 (4), p.62-66 |
---|---|
Hauptverfasser: | , , , , |
Format: | Magazinearticle |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 66 |
---|---|
container_issue | 4 |
container_start_page | 62 |
container_title | IEEE consumer electronics magazine |
container_volume | 8 |
creator | Kumar, Sudeendra K. Satheesh, Naini Mahapatra, Abhishek Sahoo, Sauvagya Mahapatra, K.K. |
description | The number of on-chip instruments, which are omnipresent in consumer electronics (CE) devices and used to monitor chips? performance, is increasing. The IEEE P1687 standard is used to streamline the access to on-chip instruments. However, the easy access to onchip instruments is prone to abuse. Attackers can easily access chip internals through an internal Joint Test Action Group (IJTAG) network and leak secret data. This article presents a physical unclonable function (PUF)-based access mechanism that enhances the security of the IJTAG network. |
doi_str_mv | 10.1109/MCE.2019.2905539 |
format | Magazinearticle |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_8732719</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8732719</ieee_id><sourcerecordid>2237693551</sourcerecordid><originalsourceid>FETCH-LOGICAL-c296t-4dce783d9b5aa49646686bfed6a3d5d084ac03d4b4faf8f543c031636f170b863</originalsourceid><addsrcrecordid>eNo9kL1PwzAQxSMEEhV0R2LxyJLij8SJ2aqqLUWFItHOkePYxJDawXaEOvKfk36ot9w93bun0y-K7hAcIQTZ4-tkOsIQsRFmME0Ju4gGGFEcY5zSy_Oc5NfR0Psv2BeFCCM2iP7e653XgjdgY0RjDS8bCWadEUFb44GyDqxMPKl1CxbGB9dtpQl8v3wCU1NzI7T5BKGW4EOKzumwA1Yd9MIE6Uwf_GK1CWAtfQDjQyyYO9u14E2GX-u-b6MrxRsvh6d-E21m0_XkOV6u5ovJeBkLzGiIk0rILCcVK1POE0YTSnNaKllRTqq0gnnCBSRVUiaKq1ylCeklooQqlMEyp-Qmejjmts7-dP03xVZ7IZuGG2k7X2BMMspImqLeCo9W4az3TqqidXrL3a5AsNgDL3rgxR54cQLen9wfT7SU8mzPM4IzxMg_dy19lg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>magazinearticle</recordtype><pqid>2237693551</pqid></control><display><type>magazinearticle</type><title>Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network</title><source>IEEE Electronic Library (IEL)</source><creator>Kumar, Sudeendra K. ; Satheesh, Naini ; Mahapatra, Abhishek ; Sahoo, Sauvagya ; Mahapatra, K.K.</creator><creatorcontrib>Kumar, Sudeendra K. ; Satheesh, Naini ; Mahapatra, Abhishek ; Sahoo, Sauvagya ; Mahapatra, K.K.</creatorcontrib><description>The number of on-chip instruments, which are omnipresent in consumer electronics (CE) devices and used to monitor chips? performance, is increasing. The IEEE P1687 standard is used to streamline the access to on-chip instruments. However, the easy access to onchip instruments is prone to abuse. Attackers can easily access chip internals through an internal Joint Test Action Group (IJTAG) network and leak secret data. This article presents a physical unclonable function (PUF)-based access mechanism that enhances the security of the IJTAG network.</description><identifier>ISSN: 2162-2248</identifier><identifier>EISSN: 2162-2256</identifier><identifier>DOI: 10.1109/MCE.2019.2905539</identifier><identifier>CODEN: ICEMCQ</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Consumer electronics ; Electronic devices ; Instruments ; Logic gates ; Network security ; Security ; System-on-chip</subject><ispartof>IEEE consumer electronics magazine, 2019-07, Vol.8 (4), p.62-66</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c296t-4dce783d9b5aa49646686bfed6a3d5d084ac03d4b4faf8f543c031636f170b863</citedby><cites>FETCH-LOGICAL-c296t-4dce783d9b5aa49646686bfed6a3d5d084ac03d4b4faf8f543c031636f170b863</cites><orcidid>0000-0003-2513-8519</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8732719$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>780,784,796,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8732719$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kumar, Sudeendra K.</creatorcontrib><creatorcontrib>Satheesh, Naini</creatorcontrib><creatorcontrib>Mahapatra, Abhishek</creatorcontrib><creatorcontrib>Sahoo, Sauvagya</creatorcontrib><creatorcontrib>Mahapatra, K.K.</creatorcontrib><title>Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network</title><title>IEEE consumer electronics magazine</title><addtitle>MCE</addtitle><description>The number of on-chip instruments, which are omnipresent in consumer electronics (CE) devices and used to monitor chips? performance, is increasing. The IEEE P1687 standard is used to streamline the access to on-chip instruments. However, the easy access to onchip instruments is prone to abuse. Attackers can easily access chip internals through an internal Joint Test Action Group (IJTAG) network and leak secret data. This article presents a physical unclonable function (PUF)-based access mechanism that enhances the security of the IJTAG network.</description><subject>Consumer electronics</subject><subject>Electronic devices</subject><subject>Instruments</subject><subject>Logic gates</subject><subject>Network security</subject><subject>Security</subject><subject>System-on-chip</subject><issn>2162-2248</issn><issn>2162-2256</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2019</creationdate><recordtype>magazinearticle</recordtype><sourceid>RIE</sourceid><recordid>eNo9kL1PwzAQxSMEEhV0R2LxyJLij8SJ2aqqLUWFItHOkePYxJDawXaEOvKfk36ot9w93bun0y-K7hAcIQTZ4-tkOsIQsRFmME0Ju4gGGFEcY5zSy_Oc5NfR0Psv2BeFCCM2iP7e653XgjdgY0RjDS8bCWadEUFb44GyDqxMPKl1CxbGB9dtpQl8v3wCU1NzI7T5BKGW4EOKzumwA1Yd9MIE6Uwf_GK1CWAtfQDjQyyYO9u14E2GX-u-b6MrxRsvh6d-E21m0_XkOV6u5ovJeBkLzGiIk0rILCcVK1POE0YTSnNaKllRTqq0gnnCBSRVUiaKq1ylCeklooQqlMEyp-Qmejjmts7-dP03xVZ7IZuGG2k7X2BMMspImqLeCo9W4az3TqqidXrL3a5AsNgDL3rgxR54cQLen9wfT7SU8mzPM4IzxMg_dy19lg</recordid><startdate>20190701</startdate><enddate>20190701</enddate><creator>Kumar, Sudeendra K.</creator><creator>Satheesh, Naini</creator><creator>Mahapatra, Abhishek</creator><creator>Sahoo, Sauvagya</creator><creator>Mahapatra, K.K.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2513-8519</orcidid></search><sort><creationdate>20190701</creationdate><title>Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network</title><author>Kumar, Sudeendra K. ; Satheesh, Naini ; Mahapatra, Abhishek ; Sahoo, Sauvagya ; Mahapatra, K.K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c296t-4dce783d9b5aa49646686bfed6a3d5d084ac03d4b4faf8f543c031636f170b863</frbrgroupid><rsrctype>magazinearticle</rsrctype><prefilter>magazinearticle</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Consumer electronics</topic><topic>Electronic devices</topic><topic>Instruments</topic><topic>Logic gates</topic><topic>Network security</topic><topic>Security</topic><topic>System-on-chip</topic><toplevel>online_resources</toplevel><creatorcontrib>Kumar, Sudeendra K.</creatorcontrib><creatorcontrib>Satheesh, Naini</creatorcontrib><creatorcontrib>Mahapatra, Abhishek</creatorcontrib><creatorcontrib>Sahoo, Sauvagya</creatorcontrib><creatorcontrib>Mahapatra, K.K.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE consumer electronics magazine</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kumar, Sudeendra K.</au><au>Satheesh, Naini</au><au>Mahapatra, Abhishek</au><au>Sahoo, Sauvagya</au><au>Mahapatra, K.K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network</atitle><jtitle>IEEE consumer electronics magazine</jtitle><stitle>MCE</stitle><date>2019-07-01</date><risdate>2019</risdate><volume>8</volume><issue>4</issue><spage>62</spage><epage>66</epage><pages>62-66</pages><issn>2162-2248</issn><eissn>2162-2256</eissn><coden>ICEMCQ</coden><abstract>The number of on-chip instruments, which are omnipresent in consumer electronics (CE) devices and used to monitor chips? performance, is increasing. The IEEE P1687 standard is used to streamline the access to on-chip instruments. However, the easy access to onchip instruments is prone to abuse. Attackers can easily access chip internals through an internal Joint Test Action Group (IJTAG) network and leak secret data. This article presents a physical unclonable function (PUF)-based access mechanism that enhances the security of the IJTAG network.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/MCE.2019.2905539</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0003-2513-8519</orcidid></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 2162-2248 |
ispartof | IEEE consumer electronics magazine, 2019-07, Vol.8 (4), p.62-66 |
issn | 2162-2248 2162-2256 |
language | eng |
recordid | cdi_ieee_primary_8732719 |
source | IEEE Electronic Library (IEL) |
subjects | Consumer electronics Electronic devices Instruments Logic gates Network security Security System-on-chip |
title | Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T13%3A42%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Physical%20Unclonable%20Functions%20for%20On-Chip%20Instrumentation:%20Enhancing%20the%20Security%20of%20the%20Internal%20Joint%20Test%20Action%20Group%20Network&rft.jtitle=IEEE%20consumer%20electronics%20magazine&rft.au=Kumar,%20Sudeendra%20K.&rft.date=2019-07-01&rft.volume=8&rft.issue=4&rft.spage=62&rft.epage=66&rft.pages=62-66&rft.issn=2162-2248&rft.eissn=2162-2256&rft.coden=ICEMCQ&rft_id=info:doi/10.1109/MCE.2019.2905539&rft_dat=%3Cproquest_RIE%3E2237693551%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2237693551&rft_id=info:pmid/&rft_ieee_id=8732719&rfr_iscdi=true |