Scattered packet method for the simulation of the spatio-temporal evolution of local perturbations
The classical impedance field method is one of the most powerful techniques to calculate electronic noise in semiconductor structures. This method fails when applied to deep submicron devices due to the presence of spatial correlations between noise sources. To overcome this drawback, a new techniqu...
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creator | Gaubert, P. Varani, L. Vaissiere, J.C. Nougier, J.P. Starikov, E. Shiktorov, P. Gruzhinskis, V. |
description | The classical impedance field method is one of the most powerful techniques to calculate electronic noise in semiconductor structures. This method fails when applied to deep submicron devices due to the presence of spatial correlations between noise sources. To overcome this drawback, a new technique (generalised impedance field) has been developed in the frame of a hydrodynamic simulator. Analogously to the classical method, the calculation of electronic noise requires the knowledge of two quantities: the local noise sources and the generalised impedance fields. Instead of using a hydrodynamic approach to obtain the generalised impedance fields and a Monte Carlo simulation for the noise sources, we have used a microscopic simulator (the Scattered Packet Method) to compute both quantities. |
doi_str_mv | 10.1109/IWCE.2000.869931 |
format | Conference Proceeding |
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This method fails when applied to deep submicron devices due to the presence of spatial correlations between noise sources. To overcome this drawback, a new technique (generalised impedance field) has been developed in the frame of a hydrodynamic simulator. Analogously to the classical method, the calculation of electronic noise requires the knowledge of two quantities: the local noise sources and the generalised impedance fields. Instead of using a hydrodynamic approach to obtain the generalised impedance fields and a Monte Carlo simulation for the noise sources, we have used a microscopic simulator (the Scattered Packet Method) to compute both quantities.</description><identifier>ISBN: 0852617046</identifier><identifier>ISBN: 9780852617045</identifier><identifier>DOI: 10.1109/IWCE.2000.869931</identifier><language>eng</language><publisher>IEEE</publisher><subject>Acceleration ; Distribution functions ; Electric resistance ; Fluctuations ; Hydrodynamics ; Impedance ; Microscopy ; Physics ; Scattering ; Semiconductor device noise</subject><ispartof>7th International Workshop on Computational Electronics. Book of Abstracts. IWCE (Cat. 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Instead of using a hydrodynamic approach to obtain the generalised impedance fields and a Monte Carlo simulation for the noise sources, we have used a microscopic simulator (the Scattered Packet Method) to compute both quantities.</description><subject>Acceleration</subject><subject>Distribution functions</subject><subject>Electric resistance</subject><subject>Fluctuations</subject><subject>Hydrodynamics</subject><subject>Impedance</subject><subject>Microscopy</subject><subject>Physics</subject><subject>Scattering</subject><subject>Semiconductor device noise</subject><isbn>0852617046</isbn><isbn>9780852617045</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1UMtKxDAUDYigjrMXV_mB1qS3zWMpZdSBARcOuBzyuGGqrSlpKvj3jlZXh_NcHEJuOCs5Z_pu-9puyooxViqhNfAzcsVUUwkuWS0uyHqa3k4mAw1KwCWxL87kjAk9HY17x0wHzMfoaYiJ5iPSqRvm3uQuftAYFmX8oUXGYYzJ9BQ_Yz__B_roTtKIKc_J_tama3IeTD_h-g9XZP-w2bdPxe75cdve74pOcF5IbGSoeCUtsKZxSgoOyjtva2bAClCgjUBbu1qArUEYDI4bZb23KiCTsCK3y2yHiIcxdYNJX4flBPgGoOJUqQ</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Gaubert, P.</creator><creator>Varani, L.</creator><creator>Vaissiere, J.C.</creator><creator>Nougier, J.P.</creator><creator>Starikov, E.</creator><creator>Shiktorov, P.</creator><creator>Gruzhinskis, V.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2000</creationdate><title>Scattered packet method for the simulation of the spatio-temporal evolution of local perturbations</title><author>Gaubert, P. ; Varani, L. ; Vaissiere, J.C. ; Nougier, J.P. ; Starikov, E. ; Shiktorov, P. ; Gruzhinskis, V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i611-7e57f2127b3055c876138dcdb40a3b63839a6eb4c463b436aefc1a8bddb8fe073</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Acceleration</topic><topic>Distribution functions</topic><topic>Electric resistance</topic><topic>Fluctuations</topic><topic>Hydrodynamics</topic><topic>Impedance</topic><topic>Microscopy</topic><topic>Physics</topic><topic>Scattering</topic><topic>Semiconductor device noise</topic><toplevel>online_resources</toplevel><creatorcontrib>Gaubert, P.</creatorcontrib><creatorcontrib>Varani, L.</creatorcontrib><creatorcontrib>Vaissiere, J.C.</creatorcontrib><creatorcontrib>Nougier, J.P.</creatorcontrib><creatorcontrib>Starikov, E.</creatorcontrib><creatorcontrib>Shiktorov, P.</creatorcontrib><creatorcontrib>Gruzhinskis, V.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gaubert, P.</au><au>Varani, L.</au><au>Vaissiere, J.C.</au><au>Nougier, J.P.</au><au>Starikov, E.</au><au>Shiktorov, P.</au><au>Gruzhinskis, V.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Scattered packet method for the simulation of the spatio-temporal evolution of local perturbations</atitle><btitle>7th International Workshop on Computational Electronics. Book of Abstracts. IWCE (Cat. No.00EX427)</btitle><stitle>IWCE</stitle><date>2000</date><risdate>2000</risdate><spage>77</spage><epage>78</epage><pages>77-78</pages><isbn>0852617046</isbn><isbn>9780852617045</isbn><abstract>The classical impedance field method is one of the most powerful techniques to calculate electronic noise in semiconductor structures. This method fails when applied to deep submicron devices due to the presence of spatial correlations between noise sources. To overcome this drawback, a new technique (generalised impedance field) has been developed in the frame of a hydrodynamic simulator. Analogously to the classical method, the calculation of electronic noise requires the knowledge of two quantities: the local noise sources and the generalised impedance fields. 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subjects | Acceleration Distribution functions Electric resistance Fluctuations Hydrodynamics Impedance Microscopy Physics Scattering Semiconductor device noise |
title | Scattered packet method for the simulation of the spatio-temporal evolution of local perturbations |
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