W -Band Complex Permittivity Measurements at High Temperature Using Free-Space Methods

Free-space measurement techniques can be contactless and are able to accommodate large, flat sheets of dielectric material, making them useful for characterization of high-temperature, millimeter-wave, window and radome candidate materials. As part of the present work, a high-temperature, W-band (75...

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Veröffentlicht in:	IEEE transactions on components, packaging, and manufacturing technology (2011) packaging, and manufacturing technology (2011), 2019-06, Vol.9 (6), p.1011-1019
Hauptverfasser:	Hilario, Martin S., Hoff, Brad W., Jawdat, Benmaan, Lanagan, Michael T., Cohick, Zane W., Dynys, Frederick W., Mackey, Jonathan A., Gaone, Joseph M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Ceramics complex permittivity dielectric losses dielectric measurement dielectric substrates Dielectrics high temperature Lenses Permittivity Permittivity measurement polymers Temperature measurement Uncertainty
Online-Zugang:	Volltext
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