Characteristic Curves and Cycle Time Control of Re-Entrant Lines

The characteristic curve (CC) of a production system is a function describing the behavior of cycle time ( CT ) versus throughput ( TP ). In systems with unlimited buffers, this function typically has a knee-type shape. Operating the system below the knee is not efficient, since TP can be increased...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on semiconductor manufacturing 2019-05, Vol.32 (2), p.140-153
Hauptverfasser: Yan, Chao-Bo, Monch, Lars, Meerkov, Semyon M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 153
container_issue 2
container_start_page 140
container_title IEEE transactions on semiconductor manufacturing
container_volume 32
creator Yan, Chao-Bo
Monch, Lars
Meerkov, Semyon M.
description The characteristic curve (CC) of a production system is a function describing the behavior of cycle time ( CT ) versus throughput ( TP ). In systems with unlimited buffers, this function typically has a knee-type shape. Operating the system below the knee is not efficient, since TP can be increased without an appreciable increase in CT . Operating above the knee is also counterproductive- CT becomes extremely large without a significant increase of TP . Thus, the desirable operating point is at the knee. In order to operate the system at or close to the knee, some knowledge of its CC is necessary. In this paper, an analytical/empirical method for calculating CCs of single-product re-entrant lines is developed using the so-called bottleneck workcenter model of systems at hand. Based on this method, open- and closed-loop raw material release policies, which ensure operating at the desired point of CC, are provided. The development is carried out in terms of the First Buffer First Served (FBFS) and Last Buffer First Served (LBFS) dispatch policies, although CCs for other dispatch policies can be investigated in a similar manner. In addition, it is shown by simulations that the method developed can be used for evaluating CC of a model of a scaled-down wafer fab, which includes multiple workcenters and batching, as long as the severity of the bottleneck workcenter is sufficiently high.
doi_str_mv 10.1109/TSM.2019.2908721
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_8680697</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8680697</ieee_id><sourcerecordid>2220125032</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-2c1f29e6143bcf662cf9cf9387ec1f99bd76d263307e29455aa1a3f63351670e3</originalsourceid><addsrcrecordid>eNo9kN9LAzEMx4soOKfvgi8Fn2-m6bW9vimHv2Ai6HwuXZfDG9vdbG_C_ns7NoRASPL9JuTD2LWAiRBg72afbxMEYSdooTIoTthIKFUVKEt1ykZQ2bLQCsw5u0hpCSDK0poRu6-_ffRhoNimoQ283sZfStx3C17vwor4rF0Tr_tuiP2K9w3_oOIxF74b-LTtKF2ys8avEl0d85h9PT3O6pdi-v78Wj9Mi4BWDAUG0aAlLUo5D43WGBqbQ1aG8sTa-cLoBWopwRDaUinvhZdNbiihDZAcs9vD3k3sf7aUBrfst7HLJx1ifhwVSMwqOKhC7FOK1LhNbNc-7pwAt-fkMie35-SOnLLl5mBpiehfXukKtDXyDwOGYgA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2220125032</pqid></control><display><type>article</type><title>Characteristic Curves and Cycle Time Control of Re-Entrant Lines</title><source>IEEE Electronic Library (IEL)</source><creator>Yan, Chao-Bo ; Monch, Lars ; Meerkov, Semyon M.</creator><creatorcontrib>Yan, Chao-Bo ; Monch, Lars ; Meerkov, Semyon M.</creatorcontrib><description>The characteristic curve (CC) of a production system is a function describing the behavior of cycle time ( CT ) versus throughput ( TP ). In systems with unlimited buffers, this function typically has a knee-type shape. Operating the system below the knee is not efficient, since TP can be increased without an appreciable increase in CT . Operating above the knee is also counterproductive- CT becomes extremely large without a significant increase of TP . Thus, the desirable operating point is at the knee. In order to operate the system at or close to the knee, some knowledge of its CC is necessary. In this paper, an analytical/empirical method for calculating CCs of single-product re-entrant lines is developed using the so-called bottleneck workcenter model of systems at hand. Based on this method, open- and closed-loop raw material release policies, which ensure operating at the desired point of CC, are provided. The development is carried out in terms of the First Buffer First Served (FBFS) and Last Buffer First Served (LBFS) dispatch policies, although CCs for other dispatch policies can be investigated in a similar manner. In addition, it is shown by simulations that the method developed can be used for evaluating CC of a model of a scaled-down wafer fab, which includes multiple workcenters and batching, as long as the severity of the bottleneck workcenter is sufficiently high.</description><identifier>ISSN: 0894-6507</identifier><identifier>EISSN: 1558-2345</identifier><identifier>DOI: 10.1109/TSM.2019.2908721</identifier><identifier>CODEN: ITSMED</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Analytical models ; Buffers ; characteristic curves ; Computer simulation ; Cycle time ; Empirical analysis ; FBFS and LBFS dispatch ; Knee ; open- and closed-loop job release policies ; Policies ; Production systems ; Raw materials ; Re-entrant lines ; Semiconductor device modeling ; Shape ; Throughput</subject><ispartof>IEEE transactions on semiconductor manufacturing, 2019-05, Vol.32 (2), p.140-153</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-2c1f29e6143bcf662cf9cf9387ec1f99bd76d263307e29455aa1a3f63351670e3</citedby><cites>FETCH-LOGICAL-c291t-2c1f29e6143bcf662cf9cf9387ec1f99bd76d263307e29455aa1a3f63351670e3</cites><orcidid>0000-0003-2230-8463 ; 0000-0002-6396-0610</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8680697$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27922,27923,54756</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8680697$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yan, Chao-Bo</creatorcontrib><creatorcontrib>Monch, Lars</creatorcontrib><creatorcontrib>Meerkov, Semyon M.</creatorcontrib><title>Characteristic Curves and Cycle Time Control of Re-Entrant Lines</title><title>IEEE transactions on semiconductor manufacturing</title><addtitle>TSM</addtitle><description>The characteristic curve (CC) of a production system is a function describing the behavior of cycle time ( CT ) versus throughput ( TP ). In systems with unlimited buffers, this function typically has a knee-type shape. Operating the system below the knee is not efficient, since TP can be increased without an appreciable increase in CT . Operating above the knee is also counterproductive- CT becomes extremely large without a significant increase of TP . Thus, the desirable operating point is at the knee. In order to operate the system at or close to the knee, some knowledge of its CC is necessary. In this paper, an analytical/empirical method for calculating CCs of single-product re-entrant lines is developed using the so-called bottleneck workcenter model of systems at hand. Based on this method, open- and closed-loop raw material release policies, which ensure operating at the desired point of CC, are provided. The development is carried out in terms of the First Buffer First Served (FBFS) and Last Buffer First Served (LBFS) dispatch policies, although CCs for other dispatch policies can be investigated in a similar manner. In addition, it is shown by simulations that the method developed can be used for evaluating CC of a model of a scaled-down wafer fab, which includes multiple workcenters and batching, as long as the severity of the bottleneck workcenter is sufficiently high.</description><subject>Analytical models</subject><subject>Buffers</subject><subject>characteristic curves</subject><subject>Computer simulation</subject><subject>Cycle time</subject><subject>Empirical analysis</subject><subject>FBFS and LBFS dispatch</subject><subject>Knee</subject><subject>open- and closed-loop job release policies</subject><subject>Policies</subject><subject>Production systems</subject><subject>Raw materials</subject><subject>Re-entrant lines</subject><subject>Semiconductor device modeling</subject><subject>Shape</subject><subject>Throughput</subject><issn>0894-6507</issn><issn>1558-2345</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kN9LAzEMx4soOKfvgi8Fn2-m6bW9vimHv2Ai6HwuXZfDG9vdbG_C_ns7NoRASPL9JuTD2LWAiRBg72afbxMEYSdooTIoTthIKFUVKEt1ykZQ2bLQCsw5u0hpCSDK0poRu6-_ffRhoNimoQ283sZfStx3C17vwor4rF0Tr_tuiP2K9w3_oOIxF74b-LTtKF2ys8avEl0d85h9PT3O6pdi-v78Wj9Mi4BWDAUG0aAlLUo5D43WGBqbQ1aG8sTa-cLoBWopwRDaUinvhZdNbiihDZAcs9vD3k3sf7aUBrfst7HLJx1ifhwVSMwqOKhC7FOK1LhNbNc-7pwAt-fkMie35-SOnLLl5mBpiehfXukKtDXyDwOGYgA</recordid><startdate>20190501</startdate><enddate>20190501</enddate><creator>Yan, Chao-Bo</creator><creator>Monch, Lars</creator><creator>Meerkov, Semyon M.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2230-8463</orcidid><orcidid>https://orcid.org/0000-0002-6396-0610</orcidid></search><sort><creationdate>20190501</creationdate><title>Characteristic Curves and Cycle Time Control of Re-Entrant Lines</title><author>Yan, Chao-Bo ; Monch, Lars ; Meerkov, Semyon M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-2c1f29e6143bcf662cf9cf9387ec1f99bd76d263307e29455aa1a3f63351670e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Analytical models</topic><topic>Buffers</topic><topic>characteristic curves</topic><topic>Computer simulation</topic><topic>Cycle time</topic><topic>Empirical analysis</topic><topic>FBFS and LBFS dispatch</topic><topic>Knee</topic><topic>open- and closed-loop job release policies</topic><topic>Policies</topic><topic>Production systems</topic><topic>Raw materials</topic><topic>Re-entrant lines</topic><topic>Semiconductor device modeling</topic><topic>Shape</topic><topic>Throughput</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yan, Chao-Bo</creatorcontrib><creatorcontrib>Monch, Lars</creatorcontrib><creatorcontrib>Meerkov, Semyon M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on semiconductor manufacturing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yan, Chao-Bo</au><au>Monch, Lars</au><au>Meerkov, Semyon M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characteristic Curves and Cycle Time Control of Re-Entrant Lines</atitle><jtitle>IEEE transactions on semiconductor manufacturing</jtitle><stitle>TSM</stitle><date>2019-05-01</date><risdate>2019</risdate><volume>32</volume><issue>2</issue><spage>140</spage><epage>153</epage><pages>140-153</pages><issn>0894-6507</issn><eissn>1558-2345</eissn><coden>ITSMED</coden><abstract>The characteristic curve (CC) of a production system is a function describing the behavior of cycle time ( CT ) versus throughput ( TP ). In systems with unlimited buffers, this function typically has a knee-type shape. Operating the system below the knee is not efficient, since TP can be increased without an appreciable increase in CT . Operating above the knee is also counterproductive- CT becomes extremely large without a significant increase of TP . Thus, the desirable operating point is at the knee. In order to operate the system at or close to the knee, some knowledge of its CC is necessary. In this paper, an analytical/empirical method for calculating CCs of single-product re-entrant lines is developed using the so-called bottleneck workcenter model of systems at hand. Based on this method, open- and closed-loop raw material release policies, which ensure operating at the desired point of CC, are provided. The development is carried out in terms of the First Buffer First Served (FBFS) and Last Buffer First Served (LBFS) dispatch policies, although CCs for other dispatch policies can be investigated in a similar manner. In addition, it is shown by simulations that the method developed can be used for evaluating CC of a model of a scaled-down wafer fab, which includes multiple workcenters and batching, as long as the severity of the bottleneck workcenter is sufficiently high.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TSM.2019.2908721</doi><tpages>14</tpages><orcidid>https://orcid.org/0000-0003-2230-8463</orcidid><orcidid>https://orcid.org/0000-0002-6396-0610</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0894-6507
ispartof IEEE transactions on semiconductor manufacturing, 2019-05, Vol.32 (2), p.140-153
issn 0894-6507
1558-2345
language eng
recordid cdi_ieee_primary_8680697
source IEEE Electronic Library (IEL)
subjects Analytical models
Buffers
characteristic curves
Computer simulation
Cycle time
Empirical analysis
FBFS and LBFS dispatch
Knee
open- and closed-loop job release policies
Policies
Production systems
Raw materials
Re-entrant lines
Semiconductor device modeling
Shape
Throughput
title Characteristic Curves and Cycle Time Control of Re-Entrant Lines
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T05%3A43%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characteristic%20Curves%20and%20Cycle%20Time%20Control%20of%20Re-Entrant%20Lines&rft.jtitle=IEEE%20transactions%20on%20semiconductor%20manufacturing&rft.au=Yan,%20Chao-Bo&rft.date=2019-05-01&rft.volume=32&rft.issue=2&rft.spage=140&rft.epage=153&rft.pages=140-153&rft.issn=0894-6507&rft.eissn=1558-2345&rft.coden=ITSMED&rft_id=info:doi/10.1109/TSM.2019.2908721&rft_dat=%3Cproquest_RIE%3E2220125032%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2220125032&rft_id=info:pmid/&rft_ieee_id=8680697&rfr_iscdi=true