Estimation of parameter fluctuations for robust operation in analogue circuits and systems
The design of an analogue circuit consists of assigning values to a set of designed parameters so that the circuit meets design objectives while satisfying a set of performance specifications. Due to inherent fluctuations in IC manufacturing processes, manufactured circuits exhibit a spread in perfo...
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| creator | Kadim, H.J. Harvey, D.M. |
| description | The design of an analogue circuit consists of assigning values to a set of designed parameters so that the circuit meets design objectives while satisfying a set of performance specifications. Due to inherent fluctuations in IC manufacturing processes, manufactured circuits exhibit a spread in performance values. However, While a circuit's manufacturing yield is high it might be very sensitive to variations in environmental conditions such as power supply and temperature. Such sensitivity causes the circuit to have low operating performance. In this paper an estimation method of parameter fluctuations is proposed, based on analytical modelling equations, independent of simulation. |
| doi_str_mv | 10.1109/ISCAS.2000.856435 |
| format | Conference Proceeding |
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Due to inherent fluctuations in IC manufacturing processes, manufactured circuits exhibit a spread in performance values. However, While a circuit's manufacturing yield is high it might be very sensitive to variations in environmental conditions such as power supply and temperature. Such sensitivity causes the circuit to have low operating performance. In this paper an estimation method of parameter fluctuations is proposed, based on analytical modelling equations, independent of simulation.</description><identifier>ISBN: 9780780354821</identifier><identifier>ISBN: 0780354826</identifier><identifier>DOI: 10.1109/ISCAS.2000.856435</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit faults ; Circuit stability ; Circuit testing ; Circuits and systems ; Fluctuations ; Parameter estimation ; Robust stability ; Robustness ; Transfer functions ; Uncertainty</subject><ispartof>2000 IEEE International Symposium on Circuits and Systems (ISCAS), 2000, Vol.2, p.741-744 vol.2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/856435$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/856435$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kadim, H.J.</creatorcontrib><creatorcontrib>Harvey, D.M.</creatorcontrib><title>Estimation of parameter fluctuations for robust operation in analogue circuits and systems</title><title>2000 IEEE International Symposium on Circuits and Systems (ISCAS)</title><addtitle>ISCAS</addtitle><description>The design of an analogue circuit consists of assigning values to a set of designed parameters so that the circuit meets design objectives while satisfying a set of performance specifications. Due to inherent fluctuations in IC manufacturing processes, manufactured circuits exhibit a spread in performance values. However, While a circuit's manufacturing yield is high it might be very sensitive to variations in environmental conditions such as power supply and temperature. Such sensitivity causes the circuit to have low operating performance. In this paper an estimation method of parameter fluctuations is proposed, based on analytical modelling equations, independent of simulation.</description><subject>Circuit faults</subject><subject>Circuit stability</subject><subject>Circuit testing</subject><subject>Circuits and systems</subject><subject>Fluctuations</subject><subject>Parameter estimation</subject><subject>Robust stability</subject><subject>Robustness</subject><subject>Transfer functions</subject><subject>Uncertainty</subject><isbn>9780780354821</isbn><isbn>0780354826</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj81KxDAcxAMiKGsfQE95gdZ8NE1yXMqqCwsedk9elrT5RyJtU5L0sG9vscLAwPyGgUHomZKKUqJfj-d2f64YIaRSoqm5uEOFloqs4qJWjD6gIqWflZNaEE3FI_o6pOxHk32YcHB4NtGMkCFiNyx9Xv5Awi5EHEO3pIzDDHGr-wmbyQzhewHc-9gvPqc1sTjdUoYxPaF7Z4YExb_v0OXtcGk_ytPn-7Hdn0qvZC4bxpiqmW2cUtoxSqBjnVKgO15LLQ2zzjnLO-UIJ8Yyao1gVGoQfS9kD3yHXrZZDwDXOa5v4u26_ee_-o1S_A</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Kadim, H.J.</creator><creator>Harvey, D.M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2000</creationdate><title>Estimation of parameter fluctuations for robust operation in analogue circuits and systems</title><author>Kadim, H.J. ; Harvey, D.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i87t-6222842d6f889f210eb2b88e9b34797a2dfffd3b8f030ad21da52179e5cc57ce3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Circuit faults</topic><topic>Circuit stability</topic><topic>Circuit testing</topic><topic>Circuits and systems</topic><topic>Fluctuations</topic><topic>Parameter estimation</topic><topic>Robust stability</topic><topic>Robustness</topic><topic>Transfer functions</topic><topic>Uncertainty</topic><toplevel>online_resources</toplevel><creatorcontrib>Kadim, H.J.</creatorcontrib><creatorcontrib>Harvey, D.M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kadim, H.J.</au><au>Harvey, D.M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Estimation of parameter fluctuations for robust operation in analogue circuits and systems</atitle><btitle>2000 IEEE International Symposium on Circuits and Systems (ISCAS)</btitle><stitle>ISCAS</stitle><date>2000</date><risdate>2000</risdate><volume>2</volume><spage>741</spage><epage>744 vol.2</epage><pages>741-744 vol.2</pages><isbn>9780780354821</isbn><isbn>0780354826</isbn><abstract>The design of an analogue circuit consists of assigning values to a set of designed parameters so that the circuit meets design objectives while satisfying a set of performance specifications. Due to inherent fluctuations in IC manufacturing processes, manufactured circuits exhibit a spread in performance values. However, While a circuit's manufacturing yield is high it might be very sensitive to variations in environmental conditions such as power supply and temperature. Such sensitivity causes the circuit to have low operating performance. In this paper an estimation method of parameter fluctuations is proposed, based on analytical modelling equations, independent of simulation.</abstract><pub>IEEE</pub><doi>10.1109/ISCAS.2000.856435</doi></addata></record> |
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| identifier | ISBN: 9780780354821 |
| ispartof | 2000 IEEE International Symposium on Circuits and Systems (ISCAS), 2000, Vol.2, p.741-744 vol.2 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit faults Circuit stability Circuit testing Circuits and systems Fluctuations Parameter estimation Robust stability Robustness Transfer functions Uncertainty |
| title | Estimation of parameter fluctuations for robust operation in analogue circuits and systems |
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