Automatic component immunity testing

Schaffner EMC Ltd. has launched a series of test packages designed to test automotive components against the RF test specifications contained in ISO 11452 and SAE J1113. Each package is self-contained and complies with the highest test level specified in each standard. Significant cost savings can b...

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description Schaffner EMC Ltd. has launched a series of test packages designed to test automotive components against the RF test specifications contained in ISO 11452 and SAE J1113. Each package is self-contained and complies with the highest test level specified in each standard. Significant cost savings can be made when testing to more than one standard as many of the items are common to all test packages. The article looks at the variety of RF test methods and parameters that are called up in the vehicle manufacturers' requirements, and shows how a test system can be put together using Schaffner's Profline 5000 systems to carry out just those tests that are needed, and to create reports in just the format asked for.
doi_str_mv 10.1109/CEEM.2000.853913
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_853913</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>853913</ieee_id><sourcerecordid>853913</sourcerecordid><originalsourceid>FETCH-LOGICAL-i89t-8cbb2f1b357996d18b1d98c57b8de07b165c335ae75080457684013271941e033</originalsourceid><addsrcrecordid>eNotjz1rwzAUAAWlkDTNHjJ56Gr3PT89fYzBuB-Q0iV7sGQlKFR2iJUh_76FdLrh4OCEWCFUiGBfm7b9qmoAqAyTRXoQT5oVMcga1Ewsp-n0J4Gs1GDn4mVzzWPqcvSFH9N5HMKQi5jSdYj5VuQw5Tgcn8XjofuZwvKfC7F7a3fNR7n9fv9sNtsyGptL452rD-iItbWqR-Owt8azdqYPoB0q9kTcBc1gQLJWRgJSrdFKDEC0EOt7NoYQ9udLTN3ltr9v0C-bAjvW</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Automatic component immunity testing</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kunz, H.A.</creator><creatorcontrib>Kunz, H.A.</creatorcontrib><description>Schaffner EMC Ltd. has launched a series of test packages designed to test automotive components against the RF test specifications contained in ISO 11452 and SAE J1113. Each package is self-contained and complies with the highest test level specified in each standard. Significant cost savings can be made when testing to more than one standard as many of the items are common to all test packages. The article looks at the variety of RF test methods and parameters that are called up in the vehicle manufacturers' requirements, and shows how a test system can be put together using Schaffner's Profline 5000 systems to carry out just those tests that are needed, and to create reports in just the format asked for.</description><identifier>ISBN: 7563504206</identifier><identifier>ISBN: 9787563504206</identifier><identifier>DOI: 10.1109/CEEM.2000.853913</identifier><language>eng</language><publisher>IEEE</publisher><subject>Automatic testing ; Automotive components ; Costs ; Electromagnetic compatibility ; Immunity testing ; ISO standards ; Packaging ; Radio frequency ; System testing ; Vehicles</subject><ispartof>Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402), 2000, p.116-121</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/853913$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/853913$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kunz, H.A.</creatorcontrib><title>Automatic component immunity testing</title><title>Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)</title><addtitle>CEEM</addtitle><description>Schaffner EMC Ltd. has launched a series of test packages designed to test automotive components against the RF test specifications contained in ISO 11452 and SAE J1113. Each package is self-contained and complies with the highest test level specified in each standard. Significant cost savings can be made when testing to more than one standard as many of the items are common to all test packages. The article looks at the variety of RF test methods and parameters that are called up in the vehicle manufacturers' requirements, and shows how a test system can be put together using Schaffner's Profline 5000 systems to carry out just those tests that are needed, and to create reports in just the format asked for.</description><subject>Automatic testing</subject><subject>Automotive components</subject><subject>Costs</subject><subject>Electromagnetic compatibility</subject><subject>Immunity testing</subject><subject>ISO standards</subject><subject>Packaging</subject><subject>Radio frequency</subject><subject>System testing</subject><subject>Vehicles</subject><isbn>7563504206</isbn><isbn>9787563504206</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjz1rwzAUAAWlkDTNHjJ56Gr3PT89fYzBuB-Q0iV7sGQlKFR2iJUh_76FdLrh4OCEWCFUiGBfm7b9qmoAqAyTRXoQT5oVMcga1Ewsp-n0J4Gs1GDn4mVzzWPqcvSFH9N5HMKQi5jSdYj5VuQw5Tgcn8XjofuZwvKfC7F7a3fNR7n9fv9sNtsyGptL452rD-iItbWqR-Owt8azdqYPoB0q9kTcBc1gQLJWRgJSrdFKDEC0EOt7NoYQ9udLTN3ltr9v0C-bAjvW</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Kunz, H.A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2000</creationdate><title>Automatic component immunity testing</title><author>Kunz, H.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i89t-8cbb2f1b357996d18b1d98c57b8de07b165c335ae75080457684013271941e033</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Automatic testing</topic><topic>Automotive components</topic><topic>Costs</topic><topic>Electromagnetic compatibility</topic><topic>Immunity testing</topic><topic>ISO standards</topic><topic>Packaging</topic><topic>Radio frequency</topic><topic>System testing</topic><topic>Vehicles</topic><toplevel>online_resources</toplevel><creatorcontrib>Kunz, H.A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kunz, H.A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Automatic component immunity testing</atitle><btitle>Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)</btitle><stitle>CEEM</stitle><date>2000</date><risdate>2000</risdate><spage>116</spage><epage>121</epage><pages>116-121</pages><isbn>7563504206</isbn><isbn>9787563504206</isbn><abstract>Schaffner EMC Ltd. has launched a series of test packages designed to test automotive components against the RF test specifications contained in ISO 11452 and SAE J1113. Each package is self-contained and complies with the highest test level specified in each standard. Significant cost savings can be made when testing to more than one standard as many of the items are common to all test packages. The article looks at the variety of RF test methods and parameters that are called up in the vehicle manufacturers' requirements, and shows how a test system can be put together using Schaffner's Profline 5000 systems to carry out just those tests that are needed, and to create reports in just the format asked for.</abstract><pub>IEEE</pub><doi>10.1109/CEEM.2000.853913</doi><tpages>6</tpages></addata></record>
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identifier ISBN: 7563504206
ispartof Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402), 2000, p.116-121
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Automatic testing
Automotive components
Costs
Electromagnetic compatibility
Immunity testing
ISO standards
Packaging
Radio frequency
System testing
Vehicles
title Automatic component immunity testing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T15%3A07%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Automatic%20component%20immunity%20testing&rft.btitle=Proceedings.%20Asia-Pacific%20Conference%20on%20Environmental%20Electromagnetics.%20CEEM'2000%20(IEEE%20Cat.%20No.00EX402)&rft.au=Kunz,%20H.A.&rft.date=2000&rft.spage=116&rft.epage=121&rft.pages=116-121&rft.isbn=7563504206&rft.isbn_list=9787563504206&rft_id=info:doi/10.1109/CEEM.2000.853913&rft_dat=%3Cieee_6IE%3E853913%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=853913&rfr_iscdi=true