Warpage studies of HDI test vehicles during various thermal profiling
New techniques and technologies involved in the miniaturization of printed wiring board (PWB) fabrication are rapidly emerging. The quality, performance, and reliability of surface mount assemblies built on these next-generation boards will depend on many factors, including thermally induced warpage...
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creator | Petriccione, G.J. Ume, I.C. |
description | New techniques and technologies involved in the miniaturization of printed wiring board (PWB) fabrication are rapidly emerging. The quality, performance, and reliability of surface mount assemblies built on these next-generation boards will depend on many factors, including thermally induced warpage. Therefore, quantitative warpage measurement is critical in new PWB assembly design evaluation, and determining overall thermal performance characteristics. Using an automated infrared reflow oven simulation system, the warpage of six bare high density interconnect (HDI) samples is measured under two different heating profiles. Out-of-plane surface displacement is measured with a non-contact shadow moire technique and resolution enhancement method called phase-stepping. The two types of samples evaluated were built for the purpose of warpage study, where physical data could be used to validate finite element analysis (FEA) results. The warpage results obtained with the two thermal profiles will be presented. |
doi_str_mv | 10.1109/ECTC.2000.853438 |
format | Conference Proceeding |
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The quality, performance, and reliability of surface mount assemblies built on these next-generation boards will depend on many factors, including thermally induced warpage. Therefore, quantitative warpage measurement is critical in new PWB assembly design evaluation, and determining overall thermal performance characteristics. Using an automated infrared reflow oven simulation system, the warpage of six bare high density interconnect (HDI) samples is measured under two different heating profiles. Out-of-plane surface displacement is measured with a non-contact shadow moire technique and resolution enhancement method called phase-stepping. The two types of samples evaluated were built for the purpose of warpage study, where physical data could be used to validate finite element analysis (FEA) results. The warpage results obtained with the two thermal profiles will be presented.</description><identifier>ISBN: 9780780359086</identifier><identifier>ISBN: 0780359089</identifier><identifier>DOI: 10.1109/ECTC.2000.853438</identifier><language>eng</language><publisher>IEEE</publisher><subject>Assembly ; Density measurement ; Displacement measurement ; Fabrication ; Infrared heating ; Ovens ; Testing ; Thermal factors ; Vehicles ; Wiring</subject><ispartof>2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. 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No.00CH37070)</title><addtitle>ECTC</addtitle><description>New techniques and technologies involved in the miniaturization of printed wiring board (PWB) fabrication are rapidly emerging. The quality, performance, and reliability of surface mount assemblies built on these next-generation boards will depend on many factors, including thermally induced warpage. Therefore, quantitative warpage measurement is critical in new PWB assembly design evaluation, and determining overall thermal performance characteristics. Using an automated infrared reflow oven simulation system, the warpage of six bare high density interconnect (HDI) samples is measured under two different heating profiles. Out-of-plane surface displacement is measured with a non-contact shadow moire technique and resolution enhancement method called phase-stepping. The two types of samples evaluated were built for the purpose of warpage study, where physical data could be used to validate finite element analysis (FEA) results. The warpage results obtained with the two thermal profiles will be presented.</description><subject>Assembly</subject><subject>Density measurement</subject><subject>Displacement measurement</subject><subject>Fabrication</subject><subject>Infrared heating</subject><subject>Ovens</subject><subject>Testing</subject><subject>Thermal factors</subject><subject>Vehicles</subject><subject>Wiring</subject><isbn>9780780359086</isbn><isbn>0780359089</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj11LwzAYhQNDcMzei1f5A61J3nz1Ump1g4E3Ey9HtrzZIp0tSTvw31uYcOCB88CBQ8gjZxXnrH5um11TCcZYZRVIsAtS1MayOaBqZvU9KXL-nj2TSuraLEn75dLgTkjzOPmImfaBrl83dMQ80iue47GbSz-l-HOiV5diP2U6njFdXEeH1IfYzeaB3AXXZSz-uSKfb-2uWZfbj_dN87ItIzdiLCUA0waAcwHaw1E4qzh6cEwe1MEoZx1qUD4EF2rkzHhlpUahFeoQhIAVebrtRkTcDyleXPrd377CH3_rSVw</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Petriccione, G.J.</creator><creator>Ume, I.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2000</creationdate><title>Warpage studies of HDI test vehicles during various thermal profiling</title><author>Petriccione, G.J. ; Ume, I.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-4330673311236d3c2a851ed3a04b5b75a8ae635dffaf9e107d5846e265e6ff223</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Assembly</topic><topic>Density measurement</topic><topic>Displacement measurement</topic><topic>Fabrication</topic><topic>Infrared heating</topic><topic>Ovens</topic><topic>Testing</topic><topic>Thermal factors</topic><topic>Vehicles</topic><topic>Wiring</topic><toplevel>online_resources</toplevel><creatorcontrib>Petriccione, G.J.</creatorcontrib><creatorcontrib>Ume, I.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Petriccione, G.J.</au><au>Ume, I.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Warpage studies of HDI test vehicles during various thermal profiling</atitle><btitle>2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)</btitle><stitle>ECTC</stitle><date>2000</date><risdate>2000</risdate><spage>1640</spage><epage>1646</epage><pages>1640-1646</pages><isbn>9780780359086</isbn><isbn>0780359089</isbn><abstract>New techniques and technologies involved in the miniaturization of printed wiring board (PWB) fabrication are rapidly emerging. The quality, performance, and reliability of surface mount assemblies built on these next-generation boards will depend on many factors, including thermally induced warpage. Therefore, quantitative warpage measurement is critical in new PWB assembly design evaluation, and determining overall thermal performance characteristics. Using an automated infrared reflow oven simulation system, the warpage of six bare high density interconnect (HDI) samples is measured under two different heating profiles. Out-of-plane surface displacement is measured with a non-contact shadow moire technique and resolution enhancement method called phase-stepping. The two types of samples evaluated were built for the purpose of warpage study, where physical data could be used to validate finite element analysis (FEA) results. The warpage results obtained with the two thermal profiles will be presented.</abstract><pub>IEEE</pub><doi>10.1109/ECTC.2000.853438</doi><tpages>7</tpages></addata></record> |
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identifier | ISBN: 9780780359086 |
ispartof | 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070), 2000, p.1640-1646 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Assembly Density measurement Displacement measurement Fabrication Infrared heating Ovens Testing Thermal factors Vehicles Wiring |
title | Warpage studies of HDI test vehicles during various thermal profiling |
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