Development of a Thermally Aware-Compact Model With an Optimized Heat Sink for FinFETs

In this letter, we develop a compact thermal model that can predict changes in the threshold voltage and drain current because of the junction temperature, Δ J , and its effect on a circuit performance by using circuit simulators. In addition, we propose a thermally aware layout methodology for FinF...

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Veröffentlicht in:IEEE transactions on nanotechnology 2019, Vol.18, p.51-54
Hauptverfasser: Jin, Minhyun, Lee, Yong Ju, Song, Minkyu, Kim, Soo Youn
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Sprache:eng
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