Alternative AlN based lossy ceramics for high power applications
Since the early 1980's, U.S. microwave tube industry has been using BeO-SiC lossy ceramic composite materials for microwave tube components. However, due to the toxicity of BeO during the production process (related to Chronic Beryllium Disease), U.S. currently does not have a BeO-SiC material...
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| creator | Mikijelj, B. |
| description | Since the early 1980's, U.S. microwave tube industry has been using BeO-SiC lossy ceramic composite materials for microwave tube components. However, due to the toxicity of BeO during the production process (related to Chronic Beryllium Disease), U.S. currently does not have a BeO-SiC material supplier, and no other commercially available material has yet been qualified for these applications. This necessitated research and development of safe, alternate lossy materials that could replace BeO-40% SiC material, used by three major U.S. tube manufacturers. This paper presents material requirements and development results obtained for lossy materials based on AlN. |
| doi_str_mv | 10.1109/OVE:EC.2000.847519 |
| format | Conference Proceeding |
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However, due to the toxicity of BeO during the production process (related to Chronic Beryllium Disease), U.S. currently does not have a BeO-SiC material supplier, and no other commercially available material has yet been qualified for these applications. This necessitated research and development of safe, alternate lossy materials that could replace BeO-40% SiC material, used by three major U.S. tube manufacturers. This paper presents material requirements and development results obtained for lossy materials based on AlN.</description><identifier>ISBN: 0780359879</identifier><identifier>ISBN: 9780780359871</identifier><identifier>DOI: 10.1109/OVE:EC.2000.847519</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bonding ; Ceramics ; Conducting materials ; Dielectric materials ; Manufacturing ; Materials testing ; Production ; Silicon carbide ; Temperature ; Thermal conductivity</subject><ispartof>Abstracts. International Vacuum Electronics Conference 2000 (Cat. 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However, due to the toxicity of BeO during the production process (related to Chronic Beryllium Disease), U.S. currently does not have a BeO-SiC material supplier, and no other commercially available material has yet been qualified for these applications. This necessitated research and development of safe, alternate lossy materials that could replace BeO-40% SiC material, used by three major U.S. tube manufacturers. This paper presents material requirements and development results obtained for lossy materials based on AlN.</description><subject>Bonding</subject><subject>Ceramics</subject><subject>Conducting materials</subject><subject>Dielectric materials</subject><subject>Manufacturing</subject><subject>Materials testing</subject><subject>Production</subject><subject>Silicon carbide</subject><subject>Temperature</subject><subject>Thermal conductivity</subject><isbn>0780359879</isbn><isbn>9780780359871</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tqwzAQRQWlkDbND2SlH7A7imRL01WNcR8Qmk3INqjSqFFxYiOZlvx9A-nqLg7nwGVsKaAUAvBxs-ueurZcAUBplK4E3rB70AZkhUbjjC1y_r5AqCqDUt2x56afKJ3sFH-IN_0H_7SZPO-HnM_cUbLH6DIPQ-KH-HXg4_BLidtx7KO7OMMpP7DbYPtMi_-ds-1Lt23fivXm9b1t1kU0OBVaeK19TU7XysAqoCUkpdB6csp6NMqTlDXVwmhwKF0g70NlqLYgSAY5Z8trNhLRfkzxaNN5f70o_wDlnkiT</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Mikijelj, B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2000</creationdate><title>Alternative AlN based lossy ceramics for high power applications</title><author>Mikijelj, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i89t-71d77d6ec764802f9ae9e449adec4ad984de336e61870c93cfeddf58e6a01e3f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Bonding</topic><topic>Ceramics</topic><topic>Conducting materials</topic><topic>Dielectric materials</topic><topic>Manufacturing</topic><topic>Materials testing</topic><topic>Production</topic><topic>Silicon carbide</topic><topic>Temperature</topic><topic>Thermal conductivity</topic><toplevel>online_resources</toplevel><creatorcontrib>Mikijelj, B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mikijelj, B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Alternative AlN based lossy ceramics for high power applications</atitle><btitle>Abstracts. International Vacuum Electronics Conference 2000 (Cat. No.00EX392)</btitle><stitle>IVELEC</stitle><date>2000</date><risdate>2000</risdate><spage>2 pp.</spage><pages>2 pp.-</pages><isbn>0780359879</isbn><isbn>9780780359871</isbn><abstract>Since the early 1980's, U.S. microwave tube industry has been using BeO-SiC lossy ceramic composite materials for microwave tube components. However, due to the toxicity of BeO during the production process (related to Chronic Beryllium Disease), U.S. currently does not have a BeO-SiC material supplier, and no other commercially available material has yet been qualified for these applications. This necessitated research and development of safe, alternate lossy materials that could replace BeO-40% SiC material, used by three major U.S. tube manufacturers. This paper presents material requirements and development results obtained for lossy materials based on AlN.</abstract><pub>IEEE</pub><doi>10.1109/OVE:EC.2000.847519</doi></addata></record> |
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| identifier | ISBN: 0780359879 |
| ispartof | Abstracts. International Vacuum Electronics Conference 2000 (Cat. No.00EX392), 2000, p.2 pp. |
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| language | eng |
| recordid | cdi_ieee_primary_847519 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Bonding Ceramics Conducting materials Dielectric materials Manufacturing Materials testing Production Silicon carbide Temperature Thermal conductivity |
| title | Alternative AlN based lossy ceramics for high power applications |
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