Comprehensive Analysis of Distortion in the Passive FET Sample-and-Hold Circuit
Analysis simplified with circuit insights reveals the major sources of distortion in a passive FET-switch-based sampling circuit: 1) R_{\mathrm{\scriptscriptstyle ON}} -modulation; 2) turn-OFF-time instant; and 3) signal-dependent charge-injection. Explicit expressions for second- and third-order di...
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| Veröffentlicht in: | IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2018-04, Vol.65 (4), p.1157-1173 |
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| container_title | IEEE transactions on circuits and systems. I, Regular papers |
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| creator | Iizuka, Tetsuya Ito, Takaaki Abidi, Asad A. |
| description | Analysis simplified with circuit insights reveals the major sources of distortion in a passive FET-switch-based sampling circuit: 1) R_{\mathrm{\scriptscriptstyle ON}} -modulation; 2) turn-OFF-time instant; and 3) signal-dependent charge-injection. Explicit expressions for second- and third-order distortions advance intuitive understanding of the processes of distortion. Circuit simulations and measurement results establish the accuracy of the analysis. Since the three sources of distortion each have a unique dependence on circuit parameters and the input signal frequency, a systematic method is shown to optimize an S/H circuit for least distortion. |
| doi_str_mv | 10.1109/TCSI.2018.2797987 |
| format | Article |
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Explicit expressions for second- and third-order distortions advance intuitive understanding of the processes of distortion. Circuit simulations and measurement results establish the accuracy of the analysis. 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| subjects | Analytical models Charge injection Circuits Distortion Field effect transistor Field effect transistors harmonic distortion Integrated circuit modeling intermodulation distortion Logic gates Nonlinear distortion ON resistance sample-and-hold sampling sampling timing Switches |
| title | Comprehensive Analysis of Distortion in the Passive FET Sample-and-Hold Circuit |
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