X-ray spectroscopy on Double Eagle and DM-2
Summary form only given. The radial distribution of the ion density and electron temperature in a Z-pinch has been inferred by comparing the measured values of the X-ray power and the ratio of optically thick spectral line intensities with calculated ones for a range of assumed radial distributions....
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| creator | Yadlowsky, E.J. Carlson, E.P. Niemel, J. Barakat, F. Hazelton, R.C. Klepper, C.C. Riordan, J. Failor, B. Coleman, P. Levine, J. Song, Y. Whitton, B. Apruzese, J. Davis, J. Cochran, F. Whitney, K. |
| description | Summary form only given. The radial distribution of the ion density and electron temperature in a Z-pinch has been inferred by comparing the measured values of the X-ray power and the ratio of optically thick spectral line intensities with calculated ones for a range of assumed radial distributions. This procedure provided evidence for an on-axis dip in the ion density. A complementary procedure is described to analyze spectra obtained on the DM-2 and Double Eagle accelerators at Maxwell Physics International. In this case, the radially resolved intensities of optically thin dopants added to the pinch were measured using a high resolution Johann spectrometer, the line intensities were Abel inverted and the radial distribution of two line ratios [L/sub /spl alpha//(He/sub /spl alpha//+IC) and IC/He/sub /spl alpha//] were obtained from which the localized electron temperature and density were inferred. |
| doi_str_mv | 10.1109/PLASMA.1999.829590 |
| format | Conference Proceeding |
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The radial distribution of the ion density and electron temperature in a Z-pinch has been inferred by comparing the measured values of the X-ray power and the ratio of optically thick spectral line intensities with calculated ones for a range of assumed radial distributions. This procedure provided evidence for an on-axis dip in the ion density. A complementary procedure is described to analyze spectra obtained on the DM-2 and Double Eagle accelerators at Maxwell Physics International. 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No.99CH36297)</title><addtitle>PLASMA</addtitle><description>Summary form only given. The radial distribution of the ion density and electron temperature in a Z-pinch has been inferred by comparing the measured values of the X-ray power and the ratio of optically thick spectral line intensities with calculated ones for a range of assumed radial distributions. This procedure provided evidence for an on-axis dip in the ion density. A complementary procedure is described to analyze spectra obtained on the DM-2 and Double Eagle accelerators at Maxwell Physics International. In this case, the radially resolved intensities of optically thin dopants added to the pinch were measured using a high resolution Johann spectrometer, the line intensities were Abel inverted and the radial distribution of two line ratios [L/sub /spl alpha//(He/sub /spl alpha//+IC) and IC/He/sub /spl alpha//] were obtained from which the localized electron temperature and density were inferred.</description><subject>Density measurement</subject><subject>Electron optics</subject><subject>Helium</subject><subject>Ion accelerators</subject><subject>Particle beam optics</subject><subject>Physics</subject><subject>Power measurement</subject><subject>Spectroscopy</subject><subject>Temperature distribution</subject><subject>Thickness measurement</subject><issn>0730-9244</issn><issn>2576-7208</issn><isbn>0780352246</isbn><isbn>9780780352247</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1999</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tOwzAURC0eEmnpD3SVPXJ6fW3H9jLqA5BSgUQX7CrHvkFBpYmSssjfE6nMYs5udIaxpYBMCHCr97L42BeZcM5lFp12cMMS1CbnBsHeshkYC1IjqvyOJWAkcIdKPbDFMHzDFKUFoEzY0yfv_ZgOHYVL3w6h7ca0Paeb9rc6Ubr1X1P7c0w3e46P7L72p4EW_5yzw257WL_w8u35dV2UvLHmwlFFG0nYKmJ0OUIIAgWhVl7WwSOZKCIgQWVBSxHyOjiYVGTua2OEITlny-tsQ0THrm9-fD8ery_lHx6RQhM</recordid><startdate>1999</startdate><enddate>1999</enddate><creator>Yadlowsky, E.J.</creator><creator>Carlson, E.P.</creator><creator>Niemel, J.</creator><creator>Barakat, F.</creator><creator>Hazelton, R.C.</creator><creator>Klepper, C.C.</creator><creator>Riordan, J.</creator><creator>Failor, B.</creator><creator>Coleman, P.</creator><creator>Levine, J.</creator><creator>Song, Y.</creator><creator>Whitton, B.</creator><creator>Apruzese, J.</creator><creator>Davis, J.</creator><creator>Cochran, F.</creator><creator>Whitney, K.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>1999</creationdate><title>X-ray spectroscopy on Double Eagle and DM-2</title><author>Yadlowsky, E.J. ; Carlson, E.P. ; Niemel, J. ; Barakat, F. ; Hazelton, R.C. ; Klepper, C.C. ; Riordan, J. ; Failor, B. ; Coleman, P. ; Levine, J. ; Song, Y. ; Whitton, B. ; Apruzese, J. ; Davis, J. ; Cochran, F. ; Whitney, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i87t-24d8de18bd2d9620cc121e254a3fca2e7d1d02e0b80531c6fc9002336af7717e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Density measurement</topic><topic>Electron optics</topic><topic>Helium</topic><topic>Ion accelerators</topic><topic>Particle beam optics</topic><topic>Physics</topic><topic>Power measurement</topic><topic>Spectroscopy</topic><topic>Temperature distribution</topic><topic>Thickness measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Yadlowsky, E.J.</creatorcontrib><creatorcontrib>Carlson, E.P.</creatorcontrib><creatorcontrib>Niemel, J.</creatorcontrib><creatorcontrib>Barakat, F.</creatorcontrib><creatorcontrib>Hazelton, R.C.</creatorcontrib><creatorcontrib>Klepper, C.C.</creatorcontrib><creatorcontrib>Riordan, J.</creatorcontrib><creatorcontrib>Failor, B.</creatorcontrib><creatorcontrib>Coleman, P.</creatorcontrib><creatorcontrib>Levine, J.</creatorcontrib><creatorcontrib>Song, Y.</creatorcontrib><creatorcontrib>Whitton, B.</creatorcontrib><creatorcontrib>Apruzese, J.</creatorcontrib><creatorcontrib>Davis, J.</creatorcontrib><creatorcontrib>Cochran, F.</creatorcontrib><creatorcontrib>Whitney, K.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yadlowsky, E.J.</au><au>Carlson, E.P.</au><au>Niemel, J.</au><au>Barakat, F.</au><au>Hazelton, R.C.</au><au>Klepper, C.C.</au><au>Riordan, J.</au><au>Failor, B.</au><au>Coleman, P.</au><au>Levine, J.</au><au>Song, Y.</au><au>Whitton, B.</au><au>Apruzese, J.</au><au>Davis, J.</au><au>Cochran, F.</au><au>Whitney, K.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>X-ray spectroscopy on Double Eagle and DM-2</atitle><btitle>IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297)</btitle><stitle>PLASMA</stitle><date>1999</date><risdate>1999</risdate><spage>259</spage><pages>259-</pages><issn>0730-9244</issn><eissn>2576-7208</eissn><isbn>0780352246</isbn><isbn>9780780352247</isbn><abstract>Summary form only given. The radial distribution of the ion density and electron temperature in a Z-pinch has been inferred by comparing the measured values of the X-ray power and the ratio of optically thick spectral line intensities with calculated ones for a range of assumed radial distributions. This procedure provided evidence for an on-axis dip in the ion density. A complementary procedure is described to analyze spectra obtained on the DM-2 and Double Eagle accelerators at Maxwell Physics International. In this case, the radially resolved intensities of optically thin dopants added to the pinch were measured using a high resolution Johann spectrometer, the line intensities were Abel inverted and the radial distribution of two line ratios [L/sub /spl alpha//(He/sub /spl alpha//+IC) and IC/He/sub /spl alpha//] were obtained from which the localized electron temperature and density were inferred.</abstract><pub>IEEE</pub><doi>10.1109/PLASMA.1999.829590</doi></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0730-9244 |
| ispartof | IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297), 1999, p.259 |
| issn | 0730-9244 2576-7208 |
| language | eng |
| recordid | cdi_ieee_primary_829590 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Density measurement Electron optics Helium Ion accelerators Particle beam optics Physics Power measurement Spectroscopy Temperature distribution Thickness measurement |
| title | X-ray spectroscopy on Double Eagle and DM-2 |
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