Modeling mutually exclusive events in fault trees

A method is given for constructing fault tree gates to model mutually exclusive events. The gates are constructed from stochastically independent events, AND gates and NOT gates. Examples are presented to illustrate the technique. If the gate construction must be performed manually, the method adds...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Twigg, D.W., Ramesh, A.V., Sandadi, U.R., Sharma, T.C.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 13
container_issue
container_start_page 8
container_title
container_volume
creator Twigg, D.W.
Ramesh, A.V.
Sandadi, U.R.
Sharma, T.C.
description A method is given for constructing fault tree gates to model mutually exclusive events. The gates are constructed from stochastically independent events, AND gates and NOT gates. Examples are presented to illustrate the technique. If the gate construction must be performed manually, the method adds complexity to the fault tree model that may not be justified. Approximating mutually exclusive events by independent events may have little effect on computed gate probabilities. The method could easily be automated in a standard fault tree solver so that this gate construction goes on behind the scenes. This would permit users to specify disjoint events directly. The authors conjecture that the additional computational cost would be small, since the number of basic events in the tree does not increase and the new NOT gates are inserted at the bottom of the tree.
doi_str_mv 10.1109/RAMS.2000.816276
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_816276</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>816276</ieee_id><sourcerecordid>816276</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-c78444f939471312b86d8755de9cd9fbfade5e7c7ddb30c2e6db0d38e0415a633</originalsourceid><addsrcrecordid>eNotj8tKw0AUQAcfYFrdi6v5gcR75z3LUrQKLYIPcFcmmRsZSaNkkmL_XqGuzuocOIxdI1SI4G-fF5uXSgBA5dAIa05YIbS1JXgvT9kMrAOpnXJ4xgpA5UtU6v2CzXL-_JOsMFAw3HxF6lL_wXfTOIWuO3D6aboppz1x2lM_Zp563oapG_k4EOVLdt6GLtPVP-fs7f7udflQrp9Wj8vFukxoxVg21imlWi-9sihR1M5EZ7WO5Jvo27oNkTTZxsZYS2gEmVhDlI5AoQ5Gyjm7OXYTEW2_h7QLw2F7PJW_NW5FvQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Modeling mutually exclusive events in fault trees</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Twigg, D.W. ; Ramesh, A.V. ; Sandadi, U.R. ; Sharma, T.C.</creator><creatorcontrib>Twigg, D.W. ; Ramesh, A.V. ; Sandadi, U.R. ; Sharma, T.C.</creatorcontrib><description>A method is given for constructing fault tree gates to model mutually exclusive events. The gates are constructed from stochastically independent events, AND gates and NOT gates. Examples are presented to illustrate the technique. If the gate construction must be performed manually, the method adds complexity to the fault tree model that may not be justified. Approximating mutually exclusive events by independent events may have little effect on computed gate probabilities. The method could easily be automated in a standard fault tree solver so that this gate construction goes on behind the scenes. This would permit users to specify disjoint events directly. The authors conjecture that the additional computational cost would be small, since the number of basic events in the tree does not increase and the new NOT gates are inserted at the bottom of the tree.</description><identifier>ISSN: 0149-144X</identifier><identifier>ISBN: 0780358481</identifier><identifier>ISBN: 9780780358485</identifier><identifier>EISSN: 2577-0993</identifier><identifier>DOI: 10.1109/RAMS.2000.816276</identifier><language>eng</language><publisher>IEEE</publisher><subject>Computational efficiency ; Fault trees ; Layout ; Logic ; Probability ; Relays ; State-space methods</subject><ispartof>Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055), 2000, p.8-13</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/816276$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,4035,4036,27904,54899</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/816276$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Twigg, D.W.</creatorcontrib><creatorcontrib>Ramesh, A.V.</creatorcontrib><creatorcontrib>Sandadi, U.R.</creatorcontrib><creatorcontrib>Sharma, T.C.</creatorcontrib><title>Modeling mutually exclusive events in fault trees</title><title>Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)</title><addtitle>RAMS</addtitle><description>A method is given for constructing fault tree gates to model mutually exclusive events. The gates are constructed from stochastically independent events, AND gates and NOT gates. Examples are presented to illustrate the technique. If the gate construction must be performed manually, the method adds complexity to the fault tree model that may not be justified. Approximating mutually exclusive events by independent events may have little effect on computed gate probabilities. The method could easily be automated in a standard fault tree solver so that this gate construction goes on behind the scenes. This would permit users to specify disjoint events directly. The authors conjecture that the additional computational cost would be small, since the number of basic events in the tree does not increase and the new NOT gates are inserted at the bottom of the tree.</description><subject>Computational efficiency</subject><subject>Fault trees</subject><subject>Layout</subject><subject>Logic</subject><subject>Probability</subject><subject>Relays</subject><subject>State-space methods</subject><issn>0149-144X</issn><issn>2577-0993</issn><isbn>0780358481</isbn><isbn>9780780358485</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKw0AUQAcfYFrdi6v5gcR75z3LUrQKLYIPcFcmmRsZSaNkkmL_XqGuzuocOIxdI1SI4G-fF5uXSgBA5dAIa05YIbS1JXgvT9kMrAOpnXJ4xgpA5UtU6v2CzXL-_JOsMFAw3HxF6lL_wXfTOIWuO3D6aboppz1x2lM_Zp563oapG_k4EOVLdt6GLtPVP-fs7f7udflQrp9Wj8vFukxoxVg21imlWi-9sihR1M5EZ7WO5Jvo27oNkTTZxsZYS2gEmVhDlI5AoQ5Gyjm7OXYTEW2_h7QLw2F7PJW_NW5FvQ</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Twigg, D.W.</creator><creator>Ramesh, A.V.</creator><creator>Sandadi, U.R.</creator><creator>Sharma, T.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2000</creationdate><title>Modeling mutually exclusive events in fault trees</title><author>Twigg, D.W. ; Ramesh, A.V. ; Sandadi, U.R. ; Sharma, T.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-c78444f939471312b86d8755de9cd9fbfade5e7c7ddb30c2e6db0d38e0415a633</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Computational efficiency</topic><topic>Fault trees</topic><topic>Layout</topic><topic>Logic</topic><topic>Probability</topic><topic>Relays</topic><topic>State-space methods</topic><toplevel>online_resources</toplevel><creatorcontrib>Twigg, D.W.</creatorcontrib><creatorcontrib>Ramesh, A.V.</creatorcontrib><creatorcontrib>Sandadi, U.R.</creatorcontrib><creatorcontrib>Sharma, T.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Twigg, D.W.</au><au>Ramesh, A.V.</au><au>Sandadi, U.R.</au><au>Sharma, T.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Modeling mutually exclusive events in fault trees</atitle><btitle>Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)</btitle><stitle>RAMS</stitle><date>2000</date><risdate>2000</risdate><spage>8</spage><epage>13</epage><pages>8-13</pages><issn>0149-144X</issn><eissn>2577-0993</eissn><isbn>0780358481</isbn><isbn>9780780358485</isbn><abstract>A method is given for constructing fault tree gates to model mutually exclusive events. The gates are constructed from stochastically independent events, AND gates and NOT gates. Examples are presented to illustrate the technique. If the gate construction must be performed manually, the method adds complexity to the fault tree model that may not be justified. Approximating mutually exclusive events by independent events may have little effect on computed gate probabilities. The method could easily be automated in a standard fault tree solver so that this gate construction goes on behind the scenes. This would permit users to specify disjoint events directly. The authors conjecture that the additional computational cost would be small, since the number of basic events in the tree does not increase and the new NOT gates are inserted at the bottom of the tree.</abstract><pub>IEEE</pub><doi>10.1109/RAMS.2000.816276</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0149-144X
ispartof Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055), 2000, p.8-13
issn 0149-144X
2577-0993
language eng
recordid cdi_ieee_primary_816276
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Computational efficiency
Fault trees
Layout
Logic
Probability
Relays
State-space methods
title Modeling mutually exclusive events in fault trees
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T06%3A31%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Modeling%20mutually%20exclusive%20events%20in%20fault%20trees&rft.btitle=Annual%20Reliability%20and%20Maintainability%20Symposium.%202000%20Proceedings.%20International%20Symposium%20on%20Product%20Quality%20and%20Integrity%20(Cat.%20No.00CH37055)&rft.au=Twigg,%20D.W.&rft.date=2000&rft.spage=8&rft.epage=13&rft.pages=8-13&rft.issn=0149-144X&rft.eissn=2577-0993&rft.isbn=0780358481&rft.isbn_list=9780780358485&rft_id=info:doi/10.1109/RAMS.2000.816276&rft_dat=%3Cieee_6IE%3E816276%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=816276&rfr_iscdi=true