The statistics of IC failures for multipulse electromagnetic irradiation

The statistics of IC failures for multipulse electromagnetic irradiation

The results of integrated circuit (IC) failure investigation under electromagnetic irradiation are presented. The probability of IC damage is determined as a function of number of electromagnetic pulses N and intensity of radiation. A theoretical model of the damage accumulation is presented.

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Bibliographische Detailangaben
Hauptverfasser: Vasilyev, K.B., Klyuchnik, A.V., Solodov, A.V.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Degradation
Electromagnetic radiation
Electromigration
EMP radiation effects
Fluctuations
Frequency
Magnetic susceptibility
Probability
Pulse width modulation
Statistics
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Beschreibung
Zusammenfassung:The results of integrated circuit (IC) failure investigation under electromagnetic irradiation are presented. The probability of IC damage is determined as a function of number of electromagnetic pulses N and intensity of radiation. A theoretical model of the damage accumulation is presented.
DOI:10.1109/CRMICO.1999.815255