Hierarchical test generation for systems on a chip

The rapid increase in functionality on a single chip in the last few years has increased the gap between the complexity of the design and the capability of commercial test tools. In particular the test needs for systems on a chip (SOC) are not addressed by existing tools. Because some of the cores i...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tupuri, R.S., Abraham, J.A., Saab, D.G.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic test pattern generation Automatic testing Design for testability Hip Integrated circuit testing Jacobian matrices Microprocessors Moore's Law System testing System-on-a-chip
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