Novel edge suppression technique for planar avalanche photodiodes

We present an advanced drift diffusion simulation of the joint opening effect (JOE) avalanche photodiode (APD). The joint opening effect APD is a new design for achieving edge breakdown suppression in planar avalanche photodiodes. It is a single growth process that achieves center breakdown dominanc...

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Veröffentlicht in:	IEEE journal of quantum electronics 1999-12, Vol.35 (12), p.1863-1869
Hauptverfasser:	Haralson, J.N., Brennan, K.F.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Avalanche breakdown Avalanche photodiodes Avalanches Biomedical optical imaging BREAKDOWN DESIGN Design methodology Diffusion Dominance Electric breakdown Electronics ENGINEERING Exact sciences and technology Guards Impact ionization INSTRUMENTATION Optoelectronic devices PHOTODETECTORS PHOTODIODES Photodiodes phototransistors photoresistors RANGE FINDERS SCINTILLATION COUNTERS Semiconductor device noise Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Semiconductor optical amplifiers Simulation Solid scintillation detectors Stimulated emission Surface chemistry USES
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