Normal incidence polarization interferometer for measuring flying height of magnetic heads
In this paper, we give a brief review and analysis to the two currently most powerful methods for flying height testing of magnetic heads-intensity interferometry and polarization interferometry. Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disad...
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| Veröffentlicht in: | IEEE transactions on magnetics 1999-09, Vol.35 (5), p.2457-2459 |
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| container_end_page | 2459 |
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| container_title | IEEE transactions on magnetics |
| container_volume | 35 |
| creator | Xinqun Liu Clegg, W. Bo Liu |
| description | In this paper, we give a brief review and analysis to the two currently most powerful methods for flying height testing of magnetic heads-intensity interferometry and polarization interferometry. Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disadvantages of the above two methods. The proposed method not only has the advantages of both the above methods, but also can be used to measure the pitch and roll of the head-slider dynamically. Design details and analysis of the relationship between the optical parameters of the tester and its testing accuracy are given. |
| doi_str_mv | 10.1109/20.800857 |
| format | Article |
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Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disadvantages of the above two methods. The proposed method not only has the advantages of both the above methods, but also can be used to measure the pitch and roll of the head-slider dynamically. Design details and analysis of the relationship between the optical parameters of the tester and its testing accuracy are given.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.800857</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Glass ; Magnetic analysis ; Magnetic devices ; Magnetic heads ; Manufacturing industries ; Memory ; Optical interferometry ; Optical refraction ; Optical variables control ; Other magnetic recording and storage devices (including tapes, disks, and drums) ; Polarization ; Semiconductor electronics. Microelectronics. Optoelectronics. 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Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disadvantages of the above two methods. The proposed method not only has the advantages of both the above methods, but also can be used to measure the pitch and roll of the head-slider dynamically. Design details and analysis of the relationship between the optical parameters of the tester and its testing accuracy are given.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Glass</subject><subject>Magnetic analysis</subject><subject>Magnetic devices</subject><subject>Magnetic heads</subject><subject>Manufacturing industries</subject><subject>Memory</subject><subject>Optical interferometry</subject><subject>Optical refraction</subject><subject>Optical variables control</subject><subject>Other magnetic recording and storage devices (including tapes, disks, and drums)</subject><subject>Polarization</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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Microelectronics. Optoelectronics. Solid state devices</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Xinqun Liu</creatorcontrib><creatorcontrib>Clegg, W.</creatorcontrib><creatorcontrib>Bo Liu</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Xinqun Liu</au><au>Clegg, W.</au><au>Bo Liu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Normal incidence polarization interferometer for measuring flying height of magnetic heads</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1999-09-01</date><risdate>1999</risdate><volume>35</volume><issue>5</issue><spage>2457</spage><epage>2459</epage><pages>2457-2459</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>In this paper, we give a brief review and analysis to the two currently most powerful methods for flying height testing of magnetic heads-intensity interferometry and polarization interferometry. Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disadvantages of the above two methods. The proposed method not only has the advantages of both the above methods, but also can be used to measure the pitch and roll of the head-slider dynamically. Design details and analysis of the relationship between the optical parameters of the tester and its testing accuracy are given.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.800857</doi><tpages>3</tpages></addata></record> |
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| ispartof | IEEE transactions on magnetics, 1999-09, Vol.35 (5), p.2457-2459 |
| issn | 0018-9464 1941-0069 |
| language | eng |
| recordid | cdi_ieee_primary_800857 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Electronics Exact sciences and technology Glass Magnetic analysis Magnetic devices Magnetic heads Manufacturing industries Memory Optical interferometry Optical refraction Optical variables control Other magnetic recording and storage devices (including tapes, disks, and drums) Polarization Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Testing |
| title | Normal incidence polarization interferometer for measuring flying height of magnetic heads |
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