The differential absorption hard x-ray spectrometer at the Z facility

The differential absorption hard X-ray (DAHX) spectrometer is a diagnostic developed to measure time-resolved radiation between 60 keV and 2 MeV at the Z Facility. It consists of an array of seven Si PIN diodes in a tungsten housing that provides collimation and coarse spectral resolution through di...

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Veröffentlicht in:	IEEE transactions on plasma science 2017-08, Vol.45 (8), p.2393-2398
Hauptverfasser:	Bell, Kate S., Coverdale, Christine A., Ampleford, David J., Bailey, James E., Loisel, Guillaume, Harper-Slaboszewicz, Victor, Schwarz, Jens, Moy, Kenneth
Format:	Artikel
Sprache:	eng
Schlagworte:	70 PLASMA PHYSICS AND FUSION TECHNOLOGY Arrays Collimators Photonics PIN photodiodes Plasma measurements plasma pinch pulsed-power systems radiation detectors Silicon silicon radiation detectors Tungsten Wires X-ray detectors
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Beschreibung
Zusammenfassung:	The differential absorption hard X-ray (DAHX) spectrometer is a diagnostic developed to measure time-resolved radiation between 60 keV and 2 MeV at the Z Facility. It consists of an array of seven Si PIN diodes in a tungsten housing that provides collimation and coarse spectral resolution through differential filters. DAHX is a revitalization of the hard X-ray spectrometer that was fielded on Z prior to refurbishment in 2006. DAHX has been tailored to the present radiation environment in Z to provide information on the power, spectral shape, and time profile of the hard emission by plasma radiation sources driven by the Z machine.
ISSN:	0093-3813 1939-9375
DOI:	10.1109/TPS.2017.2723347