Redundant-Configuration Scrubbing of SRAM-Based FPGAs

Static RAM-based field programmable gate arrays (SRAM-based FPGAs) are widely adopted in trigger and data acquisition systems of high-energy physics detectors for implementing fast logic due to their reconfigurability, large real-time processing capabilities and embedded high-speed serial IOs. These devices are sensitive to radiation-induced upsets, which may alter the functionality of the implemented circuit. Presently, their usage on-detector is limited and there is a strong interest in finding solutions for improving their tolerance to radiation-induced upsets. In this paper, we show a novel configuration-redundancy generation and scrubbing technique for SRAM-based FPGAs. It leads to a power saving with respect to other solutions in the literature. Moreover, our technique is compatible with several Xilinx FPGA families. Our solution does not require neither the usage of external memories nor third-party layout tools. We describe an example of our solution applied to a benchmark design implemented in a Xilinx Kintex-7 FPGA. In order to prove the effectiveness of the solution, we present results from a proton irradiation test.