On the Investigation of the "Anode Side" SuperJunction IGBT Design Concept
In this letter, we present the "anode-side" SuperJunction trench field stop+ IGBT concept with drift region SuperJunction pillars placed at the anode side of the structure rather than the cathode side. The extent of the pillars toward the cathode side is shown to pose a tradeoff between fa...
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Veröffentlicht in: | IEEE electron device letters 2017-08, Vol.38 (8), p.1063-1066 |
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creator | Antoniou, Marina Lophitis, Neophytos Udrea, Florin Bauer, Friedhelm Vemulapati, Umamaheswara Reddy Badstuebner, Uwe |
description | In this letter, we present the "anode-side" SuperJunction trench field stop+ IGBT concept with drift region SuperJunction pillars placed at the anode side of the structure rather than the cathode side. The extent of the pillars toward the cathode side is shown to pose a tradeoff between fabrication technology capabilities (and cost) versus the device performance, by extensive TCAD simulations. The proposed device structure simplifies the fabrication requirements by steering clear from the need to align the cathode side features with the SuperJunction pillars. It also provides an extra degree of freedom by decoupling the cathode design from the SuperJunction structure. Additionally, the presence of SuperJunction technology in the drift region of the "anode-side" SJ Trench FS+ IGBT results in 20% reduction of ON-state losses for the same switching energy losses or, up to 30% switching losses reduction for the same ON-state voltage drop, compared with a 1.2-kV breakdown rated conventional FS+ Trench IGBT device. The proposed structure also finds applications in reverse conducting IGBTs, where a reduced snapback can be achieved, and in MOS-controlled thyristor devices. |
doi_str_mv | 10.1109/LED.2017.2718619 |
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The extent of the pillars toward the cathode side is shown to pose a tradeoff between fabrication technology capabilities (and cost) versus the device performance, by extensive TCAD simulations. The proposed device structure simplifies the fabrication requirements by steering clear from the need to align the cathode side features with the SuperJunction pillars. It also provides an extra degree of freedom by decoupling the cathode design from the SuperJunction structure. Additionally, the presence of SuperJunction technology in the drift region of the "anode-side" SJ Trench FS+ IGBT results in 20% reduction of ON-state losses for the same switching energy losses or, up to 30% switching losses reduction for the same ON-state voltage drop, compared with a 1.2-kV breakdown rated conventional FS+ Trench IGBT device. The proposed structure also finds applications in reverse conducting IGBTs, where a reduced snapback can be achieved, and in MOS-controlled thyristor devices.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2017.2718619</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Anodes ; Breakdown ; Cathodes ; Decoupling ; Drift ; Electric fields ; Fabrication ; field stop ; Insulated gate bipolar transistor ; Insulated gate bipolar transistors ; Performance evaluation ; Pillars ; point injection ; Steering ; SuperJunction (SJ) ; Switches ; Switching ; Voltage drop</subject><ispartof>IEEE electron device letters, 2017-08, Vol.38 (8), p.1063-1066</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c333t-d66b891acced4af2cfa7ba11219a565f66749a2897975bd01634856e10a3ef8c3</citedby><cites>FETCH-LOGICAL-c333t-d66b891acced4af2cfa7ba11219a565f66749a2897975bd01634856e10a3ef8c3</cites><orcidid>0000-0002-0901-0876 ; 0000-0002-7544-3784 ; 0000-0002-7288-3370</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7955014$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7955014$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Antoniou, Marina</creatorcontrib><creatorcontrib>Lophitis, Neophytos</creatorcontrib><creatorcontrib>Udrea, Florin</creatorcontrib><creatorcontrib>Bauer, Friedhelm</creatorcontrib><creatorcontrib>Vemulapati, Umamaheswara Reddy</creatorcontrib><creatorcontrib>Badstuebner, Uwe</creatorcontrib><title>On the Investigation of the "Anode Side" SuperJunction IGBT Design Concept</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description>In this letter, we present the "anode-side" SuperJunction trench field stop+ IGBT concept with drift region SuperJunction pillars placed at the anode side of the structure rather than the cathode side. The extent of the pillars toward the cathode side is shown to pose a tradeoff between fabrication technology capabilities (and cost) versus the device performance, by extensive TCAD simulations. The proposed device structure simplifies the fabrication requirements by steering clear from the need to align the cathode side features with the SuperJunction pillars. It also provides an extra degree of freedom by decoupling the cathode design from the SuperJunction structure. Additionally, the presence of SuperJunction technology in the drift region of the "anode-side" SJ Trench FS+ IGBT results in 20% reduction of ON-state losses for the same switching energy losses or, up to 30% switching losses reduction for the same ON-state voltage drop, compared with a 1.2-kV breakdown rated conventional FS+ Trench IGBT device. The proposed structure also finds applications in reverse conducting IGBTs, where a reduced snapback can be achieved, and in MOS-controlled thyristor devices.</description><subject>Anodes</subject><subject>Breakdown</subject><subject>Cathodes</subject><subject>Decoupling</subject><subject>Drift</subject><subject>Electric fields</subject><subject>Fabrication</subject><subject>field stop</subject><subject>Insulated gate bipolar transistor</subject><subject>Insulated gate bipolar transistors</subject><subject>Performance evaluation</subject><subject>Pillars</subject><subject>point injection</subject><subject>Steering</subject><subject>SuperJunction (SJ)</subject><subject>Switches</subject><subject>Switching</subject><subject>Voltage drop</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1PwkAQhjdGExG9m3hp8Fzc6X51jwiIEBIO4HmzbKdYoru1HyT-e8tHPE0yed53Jg8hj0CHAFS_LKeTYUJBDRMFqQR9RXogRBpTIdk16VHFIWZA5S25q-s9pcC54j2yWPmo-cRo7g9YN8XONkXwUchPy8HIhwyjdZHhIFq3JVaL1rsTMZ-9bqIJ1sXOR-PgHZbNPbnJ7VeND5fZJx9v0834PV6uZvPxaBk7xlgTZ1JuUw3WOcy4zROXW7W1AAloK6TIpVRc2yTVSiuxzShIxlMhEahlmKeO9cnzubeswk_bfW32oa18d9KATphiQoHuKHqmXBXqusLclFXxbatfA9QcjZnOmDkaMxdjXeTpHCkQ8R9XWojOFvsDwi5k7Q</recordid><startdate>20170801</startdate><enddate>20170801</enddate><creator>Antoniou, Marina</creator><creator>Lophitis, Neophytos</creator><creator>Udrea, Florin</creator><creator>Bauer, Friedhelm</creator><creator>Vemulapati, Umamaheswara Reddy</creator><creator>Badstuebner, Uwe</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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The extent of the pillars toward the cathode side is shown to pose a tradeoff between fabrication technology capabilities (and cost) versus the device performance, by extensive TCAD simulations. The proposed device structure simplifies the fabrication requirements by steering clear from the need to align the cathode side features with the SuperJunction pillars. It also provides an extra degree of freedom by decoupling the cathode design from the SuperJunction structure. Additionally, the presence of SuperJunction technology in the drift region of the "anode-side" SJ Trench FS+ IGBT results in 20% reduction of ON-state losses for the same switching energy losses or, up to 30% switching losses reduction for the same ON-state voltage drop, compared with a 1.2-kV breakdown rated conventional FS+ Trench IGBT device. 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subjects | Anodes Breakdown Cathodes Decoupling Drift Electric fields Fabrication field stop Insulated gate bipolar transistor Insulated gate bipolar transistors Performance evaluation Pillars point injection Steering SuperJunction (SJ) Switches Switching Voltage drop |
title | On the Investigation of the "Anode Side" SuperJunction IGBT Design Concept |
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