Beam profile measurement at 30 GeV using optical transition radiation

Beam profile measurement at 30 GeV using optical transition radiation

We present results of measurements of spot size and angular divergence of a 30 GeV electron beam though use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm,...

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Hauptverfasser: Catravas, P., Leemans, W.P., Esarey, E., Zolotorev, M., Whittum, D., Iverson, R., Hogan, M., Walz, D.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Electron beams
Electron optics
Energy resolution
Forward contracts
Interference
Particle accelerators
Particle beams
Size measurement
Spatial resolution
Wavelength measurement
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Beschreibung
Zusammenfassung:We present results of measurements of spot size and angular divergence of a 30 GeV electron beam though use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 /spl mu/m rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized to extract electron beam angular divergences of /spl sim/100 /spl mu/rad.
DOI:10.1109/PAC.1999.794389