Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data

Model mis-specification is of great importance in reliability assessment. Different choices of probability models for fitting data may result in substantially different inferential results on some lifetime characteristics of interest. Gamma and Weibull models have been used extensively for modeling...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on reliability 2017-09, Vol.66 (3), p.641-650
Hauptverfasser:	Man Ho Ling, Balakrishnan, Narayanaswamy
Format:	Artikel
Sprache:	eng
Schlagworte:	Accelerated life-tests Akaike information criterion (AIC) Analytical models Data models distance-based test Distribution functions gamma distribution likelihood inference model mis-specification one-shot devices Reliability Shape specification test Stress Weibull distribution
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!