Proton Dominance of Sub-LET Threshold GCR SEE Rate

We apply a Monte Carlo based integral rectangular parallel-piped (IRRP) approach to evaluate the impact of heavy ion reaction products on the Galactic Cosmic Ray (GCR) Single Event Effect (SEE) rate, concluding that owing to their similar high-energy (>100 MeV/n) SEE cross section and much larger...

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Veröffentlicht in:IEEE transactions on nuclear science 2017-01, Vol.64 (1), p.388-397
Hauptverfasser: Alia, Ruben Garcia, Brugger, Markus, Ferlet-Cavrois, Veronique, Brandenburg, Sytze, Calcutt, Jordan, Cerutti, Francesco, Daly, Eamonn, Ferrari, Alfredo, Muschitiello, Michele, Santin, Giovanni, Uznanski, Slawosz, Van Goethem, Marc-Jan, Zadeh, Ali
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container_end_page 397
container_issue 1
container_start_page 388
container_title IEEE transactions on nuclear science
container_volume 64
creator Alia, Ruben Garcia
Brugger, Markus
Ferlet-Cavrois, Veronique
Brandenburg, Sytze
Calcutt, Jordan
Cerutti, Francesco
Daly, Eamonn
Ferrari, Alfredo
Muschitiello, Michele
Santin, Giovanni
Uznanski, Slawosz
Van Goethem, Marc-Jan
Zadeh, Ali
description We apply a Monte Carlo based integral rectangular parallel-piped (IRRP) approach to evaluate the impact of heavy ion reaction products on the Galactic Cosmic Ray (GCR) Single Event Effect (SEE) rate, concluding that owing to their similar high-energy (>100 MeV/n) SEE cross section and much larger abundance, protons are expected to be the dominating contributor. In addition, a broad set of components, ions and energies is used to explore the sub-LET threshold experimental region for standard ground-level heavy ion test energies, identifying an overall decreasing trend in the 10-80 MeV/n range due to the decreased contribution of complete and break-up fusion, and pointing out the limitations associated to the application of Monte Carlo SEE models in this energy interval.
doi_str_mv 10.1109/TNS.2016.2628363
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subjects Abundance
Cosmic rays
Energy
FLUKA
Galactic cosmic rays
Heavy ions
indirect ionization
Ionization
Monte Carlo methods
MOSFET
nuclear reactions
Protons
radiation hardness assurance
Random access memory
Reaction products
Single Event Effects
single-event burnout (SEB)
single-event latchup (SEL)
single-event upset (SEU)
title Proton Dominance of Sub-LET Threshold GCR SEE Rate
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