Minimum Average Cost Testing for Partially Ordered Components

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Lipman, M.J., Abrahams, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Binary search trees Costs Fault diagnosis Search problems Testing
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	216
container_issue
container_start_page	216
container_title
container_volume
creator	Lipman, M.J. Abrahams, J.
description
doi_str_mv	10.1109/ISIT.1993.748530
format	Conference Proceeding
fullrecord	<record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_748530</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>748530</ieee_id><sourcerecordid>748530</sourcerecordid><originalsourceid>FETCH-LOGICAL-i87t-1fd401f742a9bce9025f1ebc2190fcf1cc0dc617abf737b8e286ef614f3855653</originalsourceid><addsrcrecordid>eNotj8tqwzAURAWl0JJ6X7rSD9i9siRLWnQRTB-GhBTqfZDlq6DiR5DcQv6-hnQYOJvhwBDyyKBgDMxz89W0BTOGF0poyeGGZEZpWMtBK63uSJbSN6wREkwl7snLPkxh_Bnp9hejPSGt57TQFtMSphP1c6SfNi7BDsOFHmKPEft1Mp7nCaclPZBbb4eE2T83pH17beuPfHd4b-rtLg9aLTnzvQDmlSit6RwaKKVn2LmSGfDOM-egdxVTtvOKq05jqSv0FROeaykryTfk6aoNiHg8xzDaeDleL_I_-SxG9A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Minimum Average Cost Testing for Partially Ordered Components</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Lipman, M.J. ; Abrahams, J.</creator><creatorcontrib>Lipman, M.J. ; Abrahams, J.</creatorcontrib><identifier>ISBN: 9780780308787</identifier><identifier>ISBN: 0780308786</identifier><identifier>DOI: 10.1109/ISIT.1993.748530</identifier><language>eng</language><publisher>IEEE</publisher><subject>Binary search trees ; Costs ; Fault diagnosis ; Search problems ; Testing</subject><ispartof>Proceedings. IEEE International Symposium on Information Theory, 1993, p.216-216</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/748530$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/748530$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lipman, M.J.</creatorcontrib><creatorcontrib>Abrahams, J.</creatorcontrib><title>Minimum Average Cost Testing for Partially Ordered Components</title><title>Proceedings. IEEE International Symposium on Information Theory</title><addtitle>ISIT</addtitle><subject>Binary search trees</subject><subject>Costs</subject><subject>Fault diagnosis</subject><subject>Search problems</subject><subject>Testing</subject><isbn>9780780308787</isbn><isbn>0780308786</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tqwzAURAWl0JJ6X7rSD9i9siRLWnQRTB-GhBTqfZDlq6DiR5DcQv6-hnQYOJvhwBDyyKBgDMxz89W0BTOGF0poyeGGZEZpWMtBK63uSJbSN6wREkwl7snLPkxh_Bnp9hejPSGt57TQFtMSphP1c6SfNi7BDsOFHmKPEft1Mp7nCaclPZBbb4eE2T83pH17beuPfHd4b-rtLg9aLTnzvQDmlSit6RwaKKVn2LmSGfDOM-egdxVTtvOKq05jqSv0FROeaykryTfk6aoNiHg8xzDaeDleL_I_-SxG9A</recordid><startdate>1993</startdate><enddate>1993</enddate><creator>Lipman, M.J.</creator><creator>Abrahams, J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>Minimum Average Cost Testing for Partially Ordered Components</title><author>Lipman, M.J. ; Abrahams, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i87t-1fd401f742a9bce9025f1ebc2190fcf1cc0dc617abf737b8e286ef614f3855653</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Binary search trees</topic><topic>Costs</topic><topic>Fault diagnosis</topic><topic>Search problems</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Lipman, M.J.</creatorcontrib><creatorcontrib>Abrahams, J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lipman, M.J.</au><au>Abrahams, J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Minimum Average Cost Testing for Partially Ordered Components</atitle><btitle>Proceedings. IEEE International Symposium on Information Theory</btitle><stitle>ISIT</stitle><date>1993</date><risdate>1993</risdate><spage>216</spage><epage>216</epage><pages>216-216</pages><isbn>9780780308787</isbn><isbn>0780308786</isbn><pub>IEEE</pub><doi>10.1109/ISIT.1993.748530</doi><tpages>1</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISBN: 9780780308787
ispartof	Proceedings. IEEE International Symposium on Information Theory, 1993, p.216-216
issn
language	eng
recordid	cdi_ieee_primary_748530
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Binary search trees Costs Fault diagnosis Search problems Testing
title	Minimum Average Cost Testing for Partially Ordered Components
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T20%3A09%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Minimum%20Average%20Cost%20Testing%20for%20Partially%20Ordered%20Components&rft.btitle=Proceedings.%20IEEE%20International%20Symposium%20on%20Information%20Theory&rft.au=Lipman,%20M.J.&rft.date=1993&rft.spage=216&rft.epage=216&rft.pages=216-216&rft.isbn=9780780308787&rft.isbn_list=0780308786&rft_id=info:doi/10.1109/ISIT.1993.748530&rft_dat=%3Cieee_6IE%3E748530%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=748530&rfr_iscdi=true