Automated synthesis of large phase shifters for built-in self-test

The paper introduces a new algorithm for the automated synthesis of phase shifters-circuits used to remove effects of structural dependencies featured by two-dimensional test generators. The algorithms presented in the paper synthesize in a time-efficient manner very large and fast phase shifters fo...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Rajski, J., Tamarapalli, N., Tyszer, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Built-in self-test Circuit faults Circuit synthesis Circuit testing Delay Flip-flops Graphics Hardware Phase shifters
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