Automated synthesis of large phase shifters for built-in self-test
The paper introduces a new algorithm for the automated synthesis of phase shifters-circuits used to remove effects of structural dependencies featured by two-dimensional test generators. The algorithms presented in the paper synthesize in a time-efficient manner very large and fast phase shifters fo...
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| creator | Rajski, J. Tamarapalli, N. Tyszer, J. |
| description | The paper introduces a new algorithm for the automated synthesis of phase shifters-circuits used to remove effects of structural dependencies featured by two-dimensional test generators. The algorithms presented in the paper synthesize in a time-efficient manner very large and fast phase shifters for built in self-test environment, with guaranteed minimal phase shifts between scan chains, and very low delay and area of virtually one 2-way XOR gate per channel. |
| doi_str_mv | 10.1109/TEST.1998.743303 |
| format | Conference Proceeding |
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No.98CH36270)</btitle><stitle>TEST</stitle><date>1998</date><risdate>1998</risdate><spage>1047</spage><epage>1056</epage><pages>1047-1056</pages><issn>1089-3539</issn><eissn>2378-2250</eissn><isbn>9780780350939</isbn><isbn>0780350936</isbn><abstract>The paper introduces a new algorithm for the automated synthesis of phase shifters-circuits used to remove effects of structural dependencies featured by two-dimensional test generators. The algorithms presented in the paper synthesize in a time-efficient manner very large and fast phase shifters for built in self-test environment, with guaranteed minimal phase shifts between scan chains, and very low delay and area of virtually one 2-way XOR gate per channel.</abstract><pub>IEEE</pub><doi>10.1109/TEST.1998.743303</doi><tpages>10</tpages></addata></record> |
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| identifier | ISSN: 1089-3539 |
| ispartof | Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270), 1998, p.1047-1056 |
| issn | 1089-3539 2378-2250 |
| language | eng |
| recordid | cdi_ieee_primary_743303 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Automatic testing Built-in self-test Circuit faults Circuit synthesis Circuit testing Delay Flip-flops Graphics Hardware Phase shifters |
| title | Automated synthesis of large phase shifters for built-in self-test |
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