Bit Cell Aspect Ratio: An SNR And Detection Perspective

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1. Verfasser:	Arnoldussen, T.C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Eigenvalues and eigenfunctions Noise level Signal to noise ratio Space vector pulse width modulation Thermal stability Timing jitter Voltage
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creator	Arnoldussen, T.C.
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doi_str_mv	10.1109/INTMAG.1998.742627
format	Conference Proceeding
fullrecord	<record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_742627</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>742627</ieee_id><sourcerecordid>742627</sourcerecordid><originalsourceid>FETCH-ieee_primary_7426273</originalsourceid><addsrcrecordid>eNpjYJAyNNAzNDSw1Pf0C_F1dNcztLS00DM3MTIzMmdm4DIwtzAwNjU0tDDlYOAtLs4yMDAwNDczNjM34mQwd8osUXBOzclRcCwuSE0uUQhKLMnMt1JwzFMI9gsCUikKLqklQInM_DyFgNQisKLMslQeBta0xJziVF4ozc0g5eYa4uyhm5mamhpfUJSZm1hUGQ9xgjFeSQC7WzPo</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Bit Cell Aspect Ratio: An SNR And Detection Perspective</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Arnoldussen, T.C.</creator><creatorcontrib>Arnoldussen, T.C.</creatorcontrib><identifier>ISBN: 0780351185</identifier><identifier>ISBN: 9780780351189</identifier><identifier>DOI: 10.1109/INTMAG.1998.742627</identifier><language>eng</language><publisher>IEEE</publisher><subject>Eigenvalues and eigenfunctions ; Noise level ; Signal to noise ratio ; Space vector pulse width modulation ; Thermal stability ; Timing jitter ; Voltage</subject><ispartof>7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275), 1998, p.349-349</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/742627$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,781,785,790,791,2059,4051,4052,27927,54922</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/742627$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Arnoldussen, T.C.</creatorcontrib><title>Bit Cell Aspect Ratio: An SNR And Detection Perspective</title><title>7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275)</title><addtitle>INTMAG</addtitle><subject>Eigenvalues and eigenfunctions</subject><subject>Noise level</subject><subject>Signal to noise ratio</subject><subject>Space vector pulse width modulation</subject><subject>Thermal stability</subject><subject>Timing jitter</subject><subject>Voltage</subject><isbn>0780351185</isbn><isbn>9780780351189</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpjYJAyNNAzNDSw1Pf0C_F1dNcztLS00DM3MTIzMmdm4DIwtzAwNjU0tDDlYOAtLs4yMDAwNDczNjM34mQwd8osUXBOzclRcCwuSE0uUQhKLMnMt1JwzFMI9gsCUikKLqklQInM_DyFgNQisKLMslQeBta0xJziVF4ozc0g5eYa4uyhm5mamhpfUJSZm1hUGQ9xgjFeSQC7WzPo</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Arnoldussen, T.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>1998</creationdate><title>Bit Cell Aspect Ratio: An SNR And Detection Perspective</title><author>Arnoldussen, T.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_7426273</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Eigenvalues and eigenfunctions</topic><topic>Noise level</topic><topic>Signal to noise ratio</topic><topic>Space vector pulse width modulation</topic><topic>Thermal stability</topic><topic>Timing jitter</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Arnoldussen, T.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Arnoldussen, T.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Bit Cell Aspect Ratio: An SNR And Detection Perspective</atitle><btitle>7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275)</btitle><stitle>INTMAG</stitle><date>1998</date><risdate>1998</risdate><spage>349</spage><epage>349</epage><pages>349-349</pages><isbn>0780351185</isbn><isbn>9780780351189</isbn><pub>IEEE</pub><doi>10.1109/INTMAG.1998.742627</doi></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISBN: 0780351185
ispartof	7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275), 1998, p.349-349
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language	eng
recordid	cdi_ieee_primary_742627
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Eigenvalues and eigenfunctions Noise level Signal to noise ratio Space vector pulse width modulation Thermal stability Timing jitter Voltage
title	Bit Cell Aspect Ratio: An SNR And Detection Perspective
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T23%3A40%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Bit%20Cell%20Aspect%20Ratio:%20An%20SNR%20And%20Detection%20Perspective&rft.btitle=7th%20Joint%20MMM-Intermag%20Conference.%20Abstracts%20(Cat.%20No.98CH36275)&rft.au=Arnoldussen,%20T.C.&rft.date=1998&rft.spage=349&rft.epage=349&rft.pages=349-349&rft.isbn=0780351185&rft.isbn_list=9780780351189&rft_id=info:doi/10.1109/INTMAG.1998.742627&rft_dat=%3Cieee_6IE%3E742627%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=742627&rfr_iscdi=true