Design of Fuse-MOSFET Pair for Fault-Tolerant DC/DC Converters
This letter presents a method for selecting an appropriate rating of fuse and MOSFET in a fault-tolerant dc/dc converter to protect the circuit in a short-circuit operating condition. The proposed method is based on the Joule-integral principle to calculate the amount of energy associated with the f...
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| Veröffentlicht in: | IEEE transactions on power electronics 2016-09, Vol.31 (9), p.6069-6074 |
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| creator | Soon, John Long Lu, Dylan Dah-Chuan |
| description | This letter presents a method for selecting an appropriate rating of fuse and MOSFET in a fault-tolerant dc/dc converter to protect the circuit in a short-circuit operating condition. The proposed method is based on the Joule-integral principle to calculate the amount of energy associated with the fuse. Different fuse melting characteristics are used to select the appropriate melting time by comparing them with the thermal characteristics of the circuit. The tests performed demonstrate consistent behavior with simulation results and they show that the fuse current rating must be lower than the current rating of the switch in order to provide a safe and reliable operation of the converter. |
| doi_str_mv | 10.1109/TPEL.2016.2535279 |
| format | Article |
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The proposed method is based on the Joule-integral principle to calculate the amount of energy associated with the fuse. Different fuse melting characteristics are used to select the appropriate melting time by comparing them with the thermal characteristics of the circuit. The tests performed demonstrate consistent behavior with simulation results and they show that the fuse current rating must be lower than the current rating of the switch in order to provide a safe and reliable operation of the converter.</description><identifier>ISSN: 0885-8993</identifier><identifier>EISSN: 1941-0107</identifier><identifier>DOI: 10.1109/TPEL.2016.2535279</identifier><identifier>CODEN: ITPEE8</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuit faults ; Circuits ; Converters ; DC/DC converter ; Electric currents ; Electrical equipment ; Fault tolerance ; Fault tolerant systems ; fault-tolerant ; fuse ; Fuses ; hort circuit fault ; Mathematical analysis ; Melting ; MOSFET ; MOSFETs ; open circuit fault ; Ratings ; RLC circuits ; Simulation ; Surges</subject><ispartof>IEEE transactions on power electronics, 2016-09, Vol.31 (9), p.6069-6074</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Sep 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c326t-5c0b4ad94b7cf4998666a131c42505bfdefec1359069148ad698cc5fc97f31943</citedby><cites>FETCH-LOGICAL-c326t-5c0b4ad94b7cf4998666a131c42505bfdefec1359069148ad698cc5fc97f31943</cites><orcidid>0000-0002-6894-8901</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7420714$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,781,785,797,27926,27927,54760</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7420714$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Soon, John Long</creatorcontrib><creatorcontrib>Lu, Dylan Dah-Chuan</creatorcontrib><title>Design of Fuse-MOSFET Pair for Fault-Tolerant DC/DC Converters</title><title>IEEE transactions on power electronics</title><addtitle>TPEL</addtitle><description>This letter presents a method for selecting an appropriate rating of fuse and MOSFET in a fault-tolerant dc/dc converter to protect the circuit in a short-circuit operating condition. The proposed method is based on the Joule-integral principle to calculate the amount of energy associated with the fuse. Different fuse melting characteristics are used to select the appropriate melting time by comparing them with the thermal characteristics of the circuit. The tests performed demonstrate consistent behavior with simulation results and they show that the fuse current rating must be lower than the current rating of the switch in order to provide a safe and reliable operation of the converter.</description><subject>Circuit faults</subject><subject>Circuits</subject><subject>Converters</subject><subject>DC/DC converter</subject><subject>Electric currents</subject><subject>Electrical equipment</subject><subject>Fault tolerance</subject><subject>Fault tolerant systems</subject><subject>fault-tolerant</subject><subject>fuse</subject><subject>Fuses</subject><subject>hort circuit fault</subject><subject>Mathematical analysis</subject><subject>Melting</subject><subject>MOSFET</subject><subject>MOSFETs</subject><subject>open circuit fault</subject><subject>Ratings</subject><subject>RLC circuits</subject><subject>Simulation</subject><subject>Surges</subject><issn>0885-8993</issn><issn>1941-0107</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQQIMoWKs_QLwsePGybWbzfRFk26pQacF6DmmayJbtpia7gv_eLS0ePM3lvWHmIXQLeASA1Xi1nM5HBQY-KhhhhVBnaACKQo4Bi3M0wFKyXCpFLtFVSluMgTIMA_Q4can6bLLgs1mXXP62eJ9NV9nSVDHzIWYz09Vtvgq1i6Zps0k5npRZGZpvF1sX0zW68KZO7uY0h-ij18uXfL54fi2f5rklBW9zZvGamo2ia2E9VUpyzg0QsLRgmK39xnlngTCFuQIqzYYraS3zVglP-jfIED0c9-5j-OpcavWuStbVtWlc6JIGCRwTToH16P0_dBu62PTXaRCyLyQYyJ6CI2VjSCk6r_ex2pn4owHrQ1F9KKoPRfWpaO_cHZ3KOffHC1pgAZT8AnFEbnE</recordid><startdate>201609</startdate><enddate>201609</enddate><creator>Soon, John Long</creator><creator>Lu, Dylan Dah-Chuan</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>F28</scope><orcidid>https://orcid.org/0000-0002-6894-8901</orcidid></search><sort><creationdate>201609</creationdate><title>Design of Fuse-MOSFET Pair for Fault-Tolerant DC/DC Converters</title><author>Soon, John Long ; Lu, Dylan Dah-Chuan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-5c0b4ad94b7cf4998666a131c42505bfdefec1359069148ad698cc5fc97f31943</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Circuit faults</topic><topic>Circuits</topic><topic>Converters</topic><topic>DC/DC converter</topic><topic>Electric currents</topic><topic>Electrical equipment</topic><topic>Fault tolerance</topic><topic>Fault tolerant systems</topic><topic>fault-tolerant</topic><topic>fuse</topic><topic>Fuses</topic><topic>hort circuit fault</topic><topic>Mathematical analysis</topic><topic>Melting</topic><topic>MOSFET</topic><topic>MOSFETs</topic><topic>open circuit fault</topic><topic>Ratings</topic><topic>RLC circuits</topic><topic>Simulation</topic><topic>Surges</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Soon, John Long</creatorcontrib><creatorcontrib>Lu, Dylan Dah-Chuan</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><jtitle>IEEE transactions on power electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Soon, John Long</au><au>Lu, Dylan Dah-Chuan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Design of Fuse-MOSFET Pair for Fault-Tolerant DC/DC Converters</atitle><jtitle>IEEE transactions on power electronics</jtitle><stitle>TPEL</stitle><date>2016-09</date><risdate>2016</risdate><volume>31</volume><issue>9</issue><spage>6069</spage><epage>6074</epage><pages>6069-6074</pages><issn>0885-8993</issn><eissn>1941-0107</eissn><coden>ITPEE8</coden><abstract>This letter presents a method for selecting an appropriate rating of fuse and MOSFET in a fault-tolerant dc/dc converter to protect the circuit in a short-circuit operating condition. 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| identifier | ISSN: 0885-8993 |
| ispartof | IEEE transactions on power electronics, 2016-09, Vol.31 (9), p.6069-6074 |
| issn | 0885-8993 1941-0107 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Circuit faults Circuits Converters DC/DC converter Electric currents Electrical equipment Fault tolerance Fault tolerant systems fault-tolerant fuse Fuses hort circuit fault Mathematical analysis Melting MOSFET MOSFETs open circuit fault Ratings RLC circuits Simulation Surges |
| title | Design of Fuse-MOSFET Pair for Fault-Tolerant DC/DC Converters |
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