Fault characterization of low capacitance full-swing BiCMOS logic circuits

An analysis of the testability of a class of low capacitance full-swing BiCMOS logic circuits is presented in this paper. It is shown that the stuck-open faults in the bipolar drivers of these circuits are masked by the additional MOS devices used to obtain full output logic swing. However, the stuc...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Aziz, S.M., Kamruzzaman, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	BiCMOS integrated circuits Capacitance Circuit faults Circuit testing Driver circuits Fault detection Logic circuits Logic devices Logic testing MOS devices
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!