An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages
The effects of changing the physical design parameters of field-induced charged device model (FCDM) ESD simulators have been investigated experimentally and theoretically. The most critical parameter is the DUT-to-field plate spacing, followed by the DUT surface area. Total inductance is also import...
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creator | Carey, R.E. DeChiaro, L.F. |
description | The effects of changing the physical design parameters of field-induced charged device model (FCDM) ESD simulators have been investigated experimentally and theoretically. The most critical parameter is the DUT-to-field plate spacing, followed by the DUT surface area. Total inductance is also important if the discharge loop is underdamped. These effects can help explain the differences observed between results achieved with the ESDA and JEDEC test modules and will assist the FCDM standardization effort. |
doi_str_mv | 10.1109/EOSESD.1998.737020 |
format | Conference Proceeding |
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These effects can help explain the differences observed between results achieved with the ESDA and JEDEC test modules and will assist the FCDM standardization effort.</description><subject>Biological system modeling</subject><subject>Current measurement</subject><subject>Dielectric measurements</subject><subject>Electric variables</subject><subject>Electrostatic discharge</subject><subject>Inductance</subject><subject>Integrated circuit modeling</subject><subject>Predictive models</subject><subject>Testing</subject><subject>Voltage</subject><isbn>9781878303912</isbn><isbn>1878303910</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotUMtOwzAQtISQQKU_0JN_IMWPBtvHqpSHVKmHwrly7HVjlDiR7Rb6W3whBrp7GK12Z2Y1CM0omVNK1P16u1vvHudUKTkXXBBGrtBUCUmlkJxwRdkNmqb0QUrVtWQLcYu-lwHD1wjR9xCy7rAOFucWhgjZmzKbISRvIersh4AHh8f2nP42FpI_BDzqqHvIEBP2ATsPna18sEcDFptWx0NBCydvAPeDhQ6XH3Hy_bHTeSiki6GP2PejNhkfx2LUg07HWKifPrcp_x6dhi7rA6Q7dO10l2B6wQl6f1q_rV6qzfb5dbXcVJ6SRa4kq01pDQIM0w1vKKuVXDQEgMmGW6KUMLUDp5xllEoijGGOM3BcPghb8wma_et6ANiPJSEdz_v_YPkPkiZ0YQ</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Carey, R.E.</creator><creator>DeChiaro, L.F.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1998</creationdate><title>An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages</title><author>Carey, R.E. ; DeChiaro, L.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-825c5c5ae7ec2ab3b125984b0ee28b3d0997c5fef9fd211807cc2f32ef3867d53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Biological system modeling</topic><topic>Current measurement</topic><topic>Dielectric measurements</topic><topic>Electric variables</topic><topic>Electrostatic discharge</topic><topic>Inductance</topic><topic>Integrated circuit modeling</topic><topic>Predictive models</topic><topic>Testing</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Carey, R.E.</creatorcontrib><creatorcontrib>DeChiaro, L.F.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Carey, R.E.</au><au>DeChiaro, L.F.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages</atitle><btitle>Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)</btitle><stitle>EOSESD</stitle><date>1998</date><risdate>1998</risdate><spage>40</spage><epage>53</epage><pages>40-53</pages><isbn>9781878303912</isbn><isbn>1878303910</isbn><abstract>The effects of changing the physical design parameters of field-induced charged device model (FCDM) ESD simulators have been investigated experimentally and theoretically. The most critical parameter is the DUT-to-field plate spacing, followed by the DUT surface area. Total inductance is also important if the discharge loop is underdamped. These effects can help explain the differences observed between results achieved with the ESDA and JEDEC test modules and will assist the FCDM standardization effort.</abstract><pub>IEEE</pub><doi>10.1109/EOSESD.1998.737020</doi><tpages>14</tpages></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Biological system modeling Current measurement Dielectric measurements Electric variables Electrostatic discharge Inductance Integrated circuit modeling Predictive models Testing Voltage |
title | An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages |
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