A structural matching for two-dimensional visual pattern inspection
A structural matching method to inspect the two-dimensional visual pattern is proposed. The pattern is represented by a tree where its nodes contain the polygonal-boundary information derived from the pattern image. To inspect whether or not the inspected pattern is defective, the matching process f...
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| container_end_page | 4434 vol.5 |
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| creator | Koo, J.H. Yoo, S.I. |
| description | A structural matching method to inspect the two-dimensional visual pattern is proposed. The pattern is represented by a tree where its nodes contain the polygonal-boundary information derived from the pattern image. To inspect whether or not the inspected pattern is defective, the matching process first checks if the tree constructed from the pattern is isomorphic to the one constructed from the standard defect-free. If they are not isomorphic, the process stops and concludes that the pattern is defective. Otherwise, it performs the second matching step using the polygonal-boundary matching function. The suggested method is illustrated for the PCB inspection and shown to have the much lower time complexity than the conventional methods using graph matching. |
| doi_str_mv | 10.1109/ICSMC.1998.727547 |
| format | Conference Proceeding |
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The suggested method is illustrated for the PCB inspection and shown to have the much lower time complexity than the conventional methods using graph matching.</description><identifier>ISSN: 1062-922X</identifier><identifier>ISBN: 9780780347786</identifier><identifier>ISBN: 0780347781</identifier><identifier>EISSN: 2577-1655</identifier><identifier>DOI: 10.1109/ICSMC.1998.727547</identifier><language>eng</language><publisher>IEEE</publisher><subject>Charge coupled devices ; Charge-coupled image sensors ; Computer science ; Feature extraction ; Image segmentation ; Inspection ; Pattern matching ; Tree graphs</subject><ispartof>Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics, 1998, Vol.5, p.4429-4434 vol.5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/727547$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/727547$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Koo, J.H.</creatorcontrib><creatorcontrib>Yoo, S.I.</creatorcontrib><title>A structural matching for two-dimensional visual pattern inspection</title><title>Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics</title><addtitle>ICSMC</addtitle><description>A structural matching method to inspect the two-dimensional visual pattern is proposed. The pattern is represented by a tree where its nodes contain the polygonal-boundary information derived from the pattern image. To inspect whether or not the inspected pattern is defective, the matching process first checks if the tree constructed from the pattern is isomorphic to the one constructed from the standard defect-free. If they are not isomorphic, the process stops and concludes that the pattern is defective. Otherwise, it performs the second matching step using the polygonal-boundary matching function. The suggested method is illustrated for the PCB inspection and shown to have the much lower time complexity than the conventional methods using graph matching.</description><subject>Charge coupled devices</subject><subject>Charge-coupled image sensors</subject><subject>Computer science</subject><subject>Feature extraction</subject><subject>Image segmentation</subject><subject>Inspection</subject><subject>Pattern matching</subject><subject>Tree graphs</subject><issn>1062-922X</issn><issn>2577-1655</issn><isbn>9780780347786</isbn><isbn>0780347781</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkEtLxDAYRYMPcBznB-iqK3etSZrnciiODoy4UMFdiclXjfRlkir-ewsVLpzFPdzFReiS4IIQrG_21dNDVRCtVSGp5EweoRXlUuZEcH6MNloqPKdkUipxglYEC5prSl_P0HmMnxhTzIhaoWqbxRQmm6Zg2qwzyX74_j1rhpClnyF3voM--qGfy28fpxmjSQlCn_k-jmDT3F2g08a0ETb_XKOX3e1zdZ8fHu_21faQe1LylDOMNXMac4c5uMZwYaymjXbMMd4Y6kAQqohmpaXMYAvCvoEWynGrFANartH1sjuG4WuCmOrORwtta3oYplhToYiQiszi1SJ6AKjH4DsTfuvlp_IPKhJa9g</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Koo, J.H.</creator><creator>Yoo, S.I.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>1998</creationdate><title>A structural matching for two-dimensional visual pattern inspection</title><author>Koo, J.H. ; Yoo, S.I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i135t-40094d905d05edfa56ac92f9d4d45fa2de61281943c24a0ce6cbe968d5c884e23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Charge coupled devices</topic><topic>Charge-coupled image sensors</topic><topic>Computer science</topic><topic>Feature extraction</topic><topic>Image segmentation</topic><topic>Inspection</topic><topic>Pattern matching</topic><topic>Tree graphs</topic><toplevel>online_resources</toplevel><creatorcontrib>Koo, J.H.</creatorcontrib><creatorcontrib>Yoo, S.I.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Koo, J.H.</au><au>Yoo, S.I.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A structural matching for two-dimensional visual pattern inspection</atitle><btitle>Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics</btitle><stitle>ICSMC</stitle><date>1998</date><risdate>1998</risdate><volume>5</volume><spage>4429</spage><epage>4434 vol.5</epage><pages>4429-4434 vol.5</pages><issn>1062-922X</issn><eissn>2577-1655</eissn><isbn>9780780347786</isbn><isbn>0780347781</isbn><abstract>A structural matching method to inspect the two-dimensional visual pattern is proposed. The pattern is represented by a tree where its nodes contain the polygonal-boundary information derived from the pattern image. To inspect whether or not the inspected pattern is defective, the matching process first checks if the tree constructed from the pattern is isomorphic to the one constructed from the standard defect-free. If they are not isomorphic, the process stops and concludes that the pattern is defective. Otherwise, it performs the second matching step using the polygonal-boundary matching function. The suggested method is illustrated for the PCB inspection and shown to have the much lower time complexity than the conventional methods using graph matching.</abstract><pub>IEEE</pub><doi>10.1109/ICSMC.1998.727547</doi><tpages>6</tpages></addata></record> |
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| identifier | ISSN: 1062-922X |
| ispartof | Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics, 1998, Vol.5, p.4429-4434 vol.5 |
| issn | 1062-922X 2577-1655 |
| language | eng |
| recordid | cdi_ieee_primary_727547 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Charge coupled devices Charge-coupled image sensors Computer science Feature extraction Image segmentation Inspection Pattern matching Tree graphs |
| title | A structural matching for two-dimensional visual pattern inspection |
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