True Random Number Generation by Variability of Resistive Switching in Oxide-Based Devices

Scalable, low-power random number generator (RNG) blocks are essential for encryption in today's communication systems. To allow for true RNG, a system must display an inherently-random physical phenomenon, such as the timing of individual fluctuations in random telegraph noise or the random tr...

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Veröffentlicht in:	IEEE journal on emerging and selected topics in circuits and systems 2015-06, Vol.5 (2), p.214-221
Hauptverfasser:	Balatti, Simone, Ambrogio, Stefano, Zhongqiang Wang, Ielmini, Daniele
Format:	Artikel
Sprache:	eng
Schlagworte:	Electrical resistance measurement Immune system Memory reliability nonvolatile memory Pulse measurements random number generation Resistance resistive-switching memory (RRAM) Switches Transistors Voltage measurement
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