Integration of non-classical faults in standard March tests

New fault models like the unrestored write and the false write through faults and suitable test algorithms have recently been developed by several authors. These tests are applied in addition to March tests. Since a March test algorithm can be implemented in many different ways and still be effectiv...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Niggemeyer, D., Redeker, M., Otterstedt, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Circuit testing Driver circuits Electrical fault detection Fault detection Logic testing MOS devices MOSFETs Random access memory Read-write memory
Online-Zugang:	Volltext bestellen
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