Single event functional interrupt (SEFI) sensitivity in microcircuits

Single event functional interrupt (SEFI) sensitivity in microcircuits

The single event functional interrupt (SEFI) sensitivity of several types of microcircuits is measured with heavy ions. While simple microcircuits have not been affected by SEFI, many complex microcircuits are vulnerable to it in varying degrees. Although there are many causes for SEFIs, ion irradia...

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Bibliographische Detailangaben
Hauptverfasser: Koga, R., Penzin, S.H., Crawford, K.B., Crain, W.R.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
CMOS process
Computer errors
Digital signal processing
EPROM
Laboratories
Microprocessors
Random access memory
Single event transient
Single event upset
Testing
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Beschreibung
Zusammenfassung:The single event functional interrupt (SEFI) sensitivity of several types of microcircuits is measured with heavy ions. While simple microcircuits have not been affected by SEFI, many complex microcircuits are vulnerable to it in varying degrees. Although there are many causes for SEFIs, ion irradiation testing in conjunction with an understanding of device architecture helps refine techniques which can be used to lessen the ill effects caused by SEFI.
DOI:10.1109/RADECS.1997.698915