A novel method to measure the contamination level of insulators-spot contamination measurement
A practical method and test instrument for measuring the pollution severity on outdoor electric insulators were developed. The method is called Spot Contamination Measurement (SCM). The method can be used to assess contamination severity quickly and easily on a wide variety of outdoor insulators wit...
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creator | Besztercey, G. Karady, G.G. Ruff, D.L. |
description | A practical method and test instrument for measuring the pollution severity on outdoor electric insulators were developed. The method is called Spot Contamination Measurement (SCM). The method can be used to assess contamination severity quickly and easily on a wide variety of outdoor insulators without removing them from the line. The method probes only a small area of the insulator surface, so it is useful to get information on the distribution of contamination deposition on the surface. The method takes into account the hydrophobic nature of contamination deposited on silicone rubber insulators. |
doi_str_mv | 10.1109/ELINSL.1998.694811 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_694811</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>694811</ieee_id><sourcerecordid>694811</sourcerecordid><originalsourceid>FETCH-LOGICAL-i104t-3d64bdb3e0ff745bb045344215771da55f402be2a3e60c0be2f1adb9f9c9ff193</originalsourceid><addsrcrecordid>eNpdUFFLwzAYDKjgmP0De8ofaE2apEkex5g6KPqggk-OpP3CIm0ymkzw31vZnjwO7h6O4ziEVpRUlBJ9v213z69tRbVWVaO5ovQKFVoqMpNxXUt1jRaUKF0SxT9uUZHSF5nBhSBMLtDnGof4DQMeIR9ij3OcnUmnCXA-AO5iyGb0wWQfAx7gLxkd9iGdBpPjlMp0jPlf7FIwQsh36MaZIUFx0SV6f9i-bZ7K9uVxt1m3paeE55L1Dbe9ZUCck1xYO-9jnNdUSEl7I4TjpLZQGwYN6cjsHDW91U532jmq2RKtzr0eAPbHyY9m-tmfD2G_fv1XPA</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A novel method to measure the contamination level of insulators-spot contamination measurement</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Besztercey, G. ; Karady, G.G. ; Ruff, D.L.</creator><creatorcontrib>Besztercey, G. ; Karady, G.G. ; Ruff, D.L.</creatorcontrib><description>A practical method and test instrument for measuring the pollution severity on outdoor electric insulators were developed. The method is called Spot Contamination Measurement (SCM). The method can be used to assess contamination severity quickly and easily on a wide variety of outdoor insulators without removing them from the line. The method probes only a small area of the insulator surface, so it is useful to get information on the distribution of contamination deposition on the surface. The method takes into account the hydrophobic nature of contamination deposited on silicone rubber insulators.</description><identifier>ISSN: 1089-084X</identifier><identifier>ISBN: 9780780349278</identifier><identifier>ISBN: 078034927X</identifier><identifier>DOI: 10.1109/ELINSL.1998.694811</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductivity measurement ; Density measurement ; Electrical resistance measurement ; Electrodes ; Insulation ; Pollution measurement ; Surface contamination ; Surface resistance ; Transmission line measurements ; Water pollution</subject><ispartof>Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239), 1998, Vol.2, p.369-372 vol.2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/694811$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/694811$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Besztercey, G.</creatorcontrib><creatorcontrib>Karady, G.G.</creatorcontrib><creatorcontrib>Ruff, D.L.</creatorcontrib><title>A novel method to measure the contamination level of insulators-spot contamination measurement</title><title>Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239)</title><addtitle>ELINSL</addtitle><description>A practical method and test instrument for measuring the pollution severity on outdoor electric insulators were developed. The method is called Spot Contamination Measurement (SCM). The method can be used to assess contamination severity quickly and easily on a wide variety of outdoor insulators without removing them from the line. The method probes only a small area of the insulator surface, so it is useful to get information on the distribution of contamination deposition on the surface. The method takes into account the hydrophobic nature of contamination deposited on silicone rubber insulators.</description><subject>Conductivity measurement</subject><subject>Density measurement</subject><subject>Electrical resistance measurement</subject><subject>Electrodes</subject><subject>Insulation</subject><subject>Pollution measurement</subject><subject>Surface contamination</subject><subject>Surface resistance</subject><subject>Transmission line measurements</subject><subject>Water pollution</subject><issn>1089-084X</issn><isbn>9780780349278</isbn><isbn>078034927X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpdUFFLwzAYDKjgmP0De8ofaE2apEkex5g6KPqggk-OpP3CIm0ymkzw31vZnjwO7h6O4ziEVpRUlBJ9v213z69tRbVWVaO5ovQKFVoqMpNxXUt1jRaUKF0SxT9uUZHSF5nBhSBMLtDnGof4DQMeIR9ij3OcnUmnCXA-AO5iyGb0wWQfAx7gLxkd9iGdBpPjlMp0jPlf7FIwQsh36MaZIUFx0SV6f9i-bZ7K9uVxt1m3paeE55L1Dbe9ZUCck1xYO-9jnNdUSEl7I4TjpLZQGwYN6cjsHDW91U532jmq2RKtzr0eAPbHyY9m-tmfD2G_fv1XPA</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Besztercey, G.</creator><creator>Karady, G.G.</creator><creator>Ruff, D.L.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>1998</creationdate><title>A novel method to measure the contamination level of insulators-spot contamination measurement</title><author>Besztercey, G. ; Karady, G.G. ; Ruff, D.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-3d64bdb3e0ff745bb045344215771da55f402be2a3e60c0be2f1adb9f9c9ff193</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Conductivity measurement</topic><topic>Density measurement</topic><topic>Electrical resistance measurement</topic><topic>Electrodes</topic><topic>Insulation</topic><topic>Pollution measurement</topic><topic>Surface contamination</topic><topic>Surface resistance</topic><topic>Transmission line measurements</topic><topic>Water pollution</topic><toplevel>online_resources</toplevel><creatorcontrib>Besztercey, G.</creatorcontrib><creatorcontrib>Karady, G.G.</creatorcontrib><creatorcontrib>Ruff, D.L.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Besztercey, G.</au><au>Karady, G.G.</au><au>Ruff, D.L.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A novel method to measure the contamination level of insulators-spot contamination measurement</atitle><btitle>Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239)</btitle><stitle>ELINSL</stitle><date>1998</date><risdate>1998</risdate><volume>2</volume><spage>369</spage><epage>372 vol.2</epage><pages>369-372 vol.2</pages><issn>1089-084X</issn><isbn>9780780349278</isbn><isbn>078034927X</isbn><abstract>A practical method and test instrument for measuring the pollution severity on outdoor electric insulators were developed. The method is called Spot Contamination Measurement (SCM). The method can be used to assess contamination severity quickly and easily on a wide variety of outdoor insulators without removing them from the line. The method probes only a small area of the insulator surface, so it is useful to get information on the distribution of contamination deposition on the surface. The method takes into account the hydrophobic nature of contamination deposited on silicone rubber insulators.</abstract><pub>IEEE</pub><doi>10.1109/ELINSL.1998.694811</doi></addata></record> |
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identifier | ISSN: 1089-084X |
ispartof | Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239), 1998, Vol.2, p.369-372 vol.2 |
issn | 1089-084X |
language | eng |
recordid | cdi_ieee_primary_694811 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Conductivity measurement Density measurement Electrical resistance measurement Electrodes Insulation Pollution measurement Surface contamination Surface resistance Transmission line measurements Water pollution |
title | A novel method to measure the contamination level of insulators-spot contamination measurement |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T22%3A24%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20novel%20method%20to%20measure%20the%20contamination%20level%20of%20insulators-spot%20contamination%20measurement&rft.btitle=Conference%20Record%20of%20the%201998%20IEEE%20International%20Symposium%20on%20Electrical%20Insulation%20(Cat.%20No.98CH36239)&rft.au=Besztercey,%20G.&rft.date=1998&rft.volume=2&rft.spage=369&rft.epage=372%20vol.2&rft.pages=369-372%20vol.2&rft.issn=1089-084X&rft.isbn=9780780349278&rft.isbn_list=078034927X&rft_id=info:doi/10.1109/ELINSL.1998.694811&rft_dat=%3Cieee_6IE%3E694811%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=694811&rfr_iscdi=true |