Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition
The effects of inhomogeneous critical current (I c ) and n-value on the degradation or permanent damage of REBCO coated conductors (CCs) were investigated through repetitive quench tests and overcurrent tests. In the repetitive quench tests, the I c values of the REBCO CC samples at the sections wit...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2015-06, Vol.25 (3), p.1-5 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Choi, Ju Hui Choi, Yoon Hyuck Kang, Dong-Hyung Park, Yeonjoo Song, Jung-Bin Ha, Sun-Kyoung Park, Minwon Lee, Haigun |
| description | The effects of inhomogeneous critical current (I c ) and n-value on the degradation or permanent damage of REBCO coated conductors (CCs) were investigated through repetitive quench tests and overcurrent tests. In the repetitive quench tests, the I c values of the REBCO CC samples at the sections with the high n-values were degraded easily due to the existence of thermal stress. Furthermore, the overcurrent test results showed that the REBCO CC samples burned out only at the section with the highest n-value, regardless of their I c values and the manufacturing process. Therefore, this study confirmed that the n-value of an REBCO CC is one of the essential factors affecting the degradation or permanent damage of CCs in the overcurrent condition. |
| doi_str_mv | 10.1109/TASC.2014.2365110 |
| format | Article |
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In the repetitive quench tests, the I c values of the REBCO CC samples at the sections with the high n-values were degraded easily due to the existence of thermal stress. Furthermore, the overcurrent test results showed that the REBCO CC samples burned out only at the section with the highest n-value, regardless of their I c values and the manufacturing process. Therefore, this study confirmed that the n-value of an REBCO CC is one of the essential factors affecting the degradation or permanent damage of CCs in the overcurrent condition.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2014.2365110</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductors ; Critical current ; damage ; Degradation ; Heating ; inhomogeneity ; Integrated circuits ; n-value ; Nonhomogeneous media ; REBCO CC ; Yttrium barium copper oxide</subject><ispartof>IEEE transactions on applied superconductivity, 2015-06, Vol.25 (3), p.1-5</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c265t-97a757b97b0b96feb5eddb301da7befec2dfd974312ca18abf91e74fa1178cd83</citedby><cites>FETCH-LOGICAL-c265t-97a757b97b0b96feb5eddb301da7befec2dfd974312ca18abf91e74fa1178cd83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6936875$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6936875$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Choi, Ju Hui</creatorcontrib><creatorcontrib>Choi, Yoon Hyuck</creatorcontrib><creatorcontrib>Kang, Dong-Hyung</creatorcontrib><creatorcontrib>Park, Yeonjoo</creatorcontrib><creatorcontrib>Song, Jung-Bin</creatorcontrib><creatorcontrib>Ha, Sun-Kyoung</creatorcontrib><creatorcontrib>Park, Minwon</creatorcontrib><creatorcontrib>Lee, Haigun</creatorcontrib><title>Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>The effects of inhomogeneous critical current (I c ) and n-value on the degradation or permanent damage of REBCO coated conductors (CCs) were investigated through repetitive quench tests and overcurrent tests. In the repetitive quench tests, the I c values of the REBCO CC samples at the sections with the high n-values were degraded easily due to the existence of thermal stress. Furthermore, the overcurrent test results showed that the REBCO CC samples burned out only at the section with the highest n-value, regardless of their I c values and the manufacturing process. Therefore, this study confirmed that the n-value of an REBCO CC is one of the essential factors affecting the degradation or permanent damage of CCs in the overcurrent condition.</description><subject>Conductors</subject><subject>Critical current</subject><subject>damage</subject><subject>Degradation</subject><subject>Heating</subject><subject>inhomogeneity</subject><subject>Integrated circuits</subject><subject>n-value</subject><subject>Nonhomogeneous media</subject><subject>REBCO CC</subject><subject>Yttrium barium copper oxide</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kNFOwzAMRSMEEmPwAYiX_EBHnDZN-zgKg4lJQzCeq6RxRhFLUZpN2t_TsMGTLd97bOsScg1sAsDK29X0rZpwBtmEp7kYRidkBEIUCRcgToeeCUgKztNzctH3n2xwFpkYkd3c7bAP7VqFtnO0szR8IH3GPZ2pJnS-p1NrsQmtW_8qL-g3yqEL9F5t1Br_iNeHu2pJq04FNENxZhtp2jq63KFvtt5HJgptPHRJzqz66vHqWMfkffawqp6SxfJxXk0XScNzEZJSKimkLqVmuswtaoHG6JSBUVLj8Bc31pQyS4E3CgqlbQkoM6sAZNGYIh0TOOxtfNf3Hm397duN8vsaWB2Dq2NwdQyuPgY3MDcHpkXEf39epnkhRfoDKoVsBA</recordid><startdate>201506</startdate><enddate>201506</enddate><creator>Choi, Ju Hui</creator><creator>Choi, Yoon Hyuck</creator><creator>Kang, Dong-Hyung</creator><creator>Park, Yeonjoo</creator><creator>Song, Jung-Bin</creator><creator>Ha, Sun-Kyoung</creator><creator>Park, Minwon</creator><creator>Lee, Haigun</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201506</creationdate><title>Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition</title><author>Choi, Ju Hui ; Choi, Yoon Hyuck ; Kang, Dong-Hyung ; Park, Yeonjoo ; Song, Jung-Bin ; Ha, Sun-Kyoung ; Park, Minwon ; Lee, Haigun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c265t-97a757b97b0b96feb5eddb301da7befec2dfd974312ca18abf91e74fa1178cd83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Conductors</topic><topic>Critical current</topic><topic>damage</topic><topic>Degradation</topic><topic>Heating</topic><topic>inhomogeneity</topic><topic>Integrated circuits</topic><topic>n-value</topic><topic>Nonhomogeneous media</topic><topic>REBCO CC</topic><topic>Yttrium barium copper oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Choi, Ju Hui</creatorcontrib><creatorcontrib>Choi, Yoon Hyuck</creatorcontrib><creatorcontrib>Kang, Dong-Hyung</creatorcontrib><creatorcontrib>Park, Yeonjoo</creatorcontrib><creatorcontrib>Song, Jung-Bin</creatorcontrib><creatorcontrib>Ha, Sun-Kyoung</creatorcontrib><creatorcontrib>Park, Minwon</creatorcontrib><creatorcontrib>Lee, Haigun</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Choi, Ju Hui</au><au>Choi, Yoon Hyuck</au><au>Kang, Dong-Hyung</au><au>Park, Yeonjoo</au><au>Song, Jung-Bin</au><au>Ha, Sun-Kyoung</au><au>Park, Minwon</au><au>Lee, Haigun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2015-06</date><risdate>2015</risdate><volume>25</volume><issue>3</issue><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>The effects of inhomogeneous critical current (I c ) and n-value on the degradation or permanent damage of REBCO coated conductors (CCs) were investigated through repetitive quench tests and overcurrent tests. In the repetitive quench tests, the I c values of the REBCO CC samples at the sections with the high n-values were degraded easily due to the existence of thermal stress. Furthermore, the overcurrent test results showed that the REBCO CC samples burned out only at the section with the highest n-value, regardless of their I c values and the manufacturing process. Therefore, this study confirmed that the n-value of an REBCO CC is one of the essential factors affecting the degradation or permanent damage of CCs in the overcurrent condition.</abstract><pub>IEEE</pub><doi>10.1109/TASC.2014.2365110</doi><tpages>5</tpages></addata></record> |
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| subjects | Conductors Critical current damage Degradation Heating inhomogeneity Integrated circuits n-value Nonhomogeneous media REBCO CC Yttrium barium copper oxide |
| title | Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition |
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