Product Level Accelerated Reliability Testing of Motor Drives With Input Power Interruptions

Motor drives utilizing power semiconductors play an important role in modern day electric motor control. Although the reliability of power semiconductors is widely studied, the product level reliability of motor drives has been studied markedly less even though their more complex control and measuri...

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Veröffentlicht in:	IEEE transactions on power electronics 2015-05, Vol.30 (5), p.2614-2622
Hauptverfasser:	Pippola, Juha, Vaalasranta, Ilkka, Marttila, Tuomas, Kiilunen, Janne, Frisk, Laura
Format:	Artikel
Sprache:	eng
Schlagworte:	Accelerated tests Electric power generation Electronics Humidity Insulated gate bipolar transistors Interruption MOSFET Motor drives Motors Relative humidity Reliability Semiconductors Stresses Temperature measurement Testing
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