Electrical Hole Transport Properties of an Ambipolar Organic Compound With Zn-Atoms on a Crystalline Silicon Heterostructure

In this paper, we investigate the electrical hole transport properties of an organic/inorganic heterostructure consisting of a thin organic film, that combines hole and electron conducting molecules around a bridging Zn-atom, deposited on top of an n-type crystalline silicon substrate. Current-volta...

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Veröffentlicht in:IEEE journal of the Electron Devices Society 2014-11, Vol.2 (6), p.179-181
Hauptverfasser: Landi, G., Fahrner, W. R., Concilio, S., Sessa, L., Neitzert, H. C.
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container_end_page 181
container_issue 6
container_start_page 179
container_title IEEE journal of the Electron Devices Society
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creator Landi, G.
Fahrner, W. R.
Concilio, S.
Sessa, L.
Neitzert, H. C.
description In this paper, we investigate the electrical hole transport properties of an organic/inorganic heterostructure consisting of a thin organic film, that combines hole and electron conducting molecules around a bridging Zn-atom, deposited on top of an n-type crystalline silicon substrate. Current-voltage characteristics and capacitance voltage measurements have been used for the determination of the organic layer dielectric and hole conduction parameters.
doi_str_mv 10.1109/JEDS.2014.2346584
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subjects Capacitance-voltage characteristics
Charge carrier mobility
Crystalline materials
Dielectric constant
Electron traps
Silicon
title Electrical Hole Transport Properties of an Ambipolar Organic Compound With Zn-Atoms on a Crystalline Silicon Heterostructure
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