Local spectra and field distributions on the surfaces of rough nanometer-structured metal films

Summary form only given.Recent advances in photon scanning tunneling microscopy made it possible to image with subwavelength resolution near-field intensity distributions of EM fields near rough surfaces irradiated by external light. This technique allows one to study localization and amplification...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Markel, V.A., Shalaev, V.M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Image resolution Microscopy Nonlinear optics Optical films Rough surfaces Silver Stimulated emission Surface roughness Surface treatment Tunneling
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