Simulation results on A/D converter dithering

Dithering improves the linearity of A/D converters (ADCs). Wagdy and Goff (1994) have developed a criterion for assessing the deviation of ADC transfer characteristics from the unity-gain line. This criterion is based on a closed-form formula for the deviation factor "D" derived from the c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Wagdy, M.F.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 83 vol.1
container_issue
container_start_page 78
container_title
container_volume 1
creator Wagdy, M.F.
description Dithering improves the linearity of A/D converters (ADCs). Wagdy and Goff (1994) have developed a criterion for assessing the deviation of ADC transfer characteristics from the unity-gain line. This criterion is based on a closed-form formula for the deviation factor "D" derived from the characteristic function of the ADC quantization error function. This approach was extended further by Wagdy (1996) to include nonideal ADCs. The results in that work pertain to additive dither, but a closed-form formula for subtractive dither may be very difficult to derive. In this paper, the ADC is modeled and dither is simulated using a software random number generator. First, additive dithering with continuous (analog) uniform (rectangular) probability density function (RPDF) is considered. The cases of an ADC with no errors, single-bit error, or multi-bit errors are investigated. Results are in excellent agreement with the previous ones, which validates the formulae therein. Second, the author presents new results using discrete (digital) rectangular dither (DRPDF). This dither type is generated via a D/A converter (DAC) whose number of bits, k, is greater by "del" than the ADC number of bits, m. For various values of "del", subtractively-dithered ADCs outperform additively-dithered ones as far as "D" is concerned. Also, the effect of increasing "del" on "D" for an ADC is investigated for the subtractive dither case, thus providing some quantitative results which are useful for the designer.
doi_str_mv 10.1109/IMTC.1998.679716
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_679716</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>679716</ieee_id><sourcerecordid>679716</sourcerecordid><originalsourceid>FETCH-LOGICAL-i104t-8c926e964906d41cd5983f3c1708aa162f894fc00b3eaee81000e9696695d2833</originalsourceid><addsrcrecordid>eNotj09LAzEUxAMq2Fbv4mm_wG7f22STvGNZ_xUqHqznErNvNbLdSrIV_PYG6mlm4McwI8QNQoUItFw_b9sKiWylDRnUZ2IOxoJUOdlzMcsMlk1t8VLMU_oCAK2MmYnyNeyPg5vCYSwip-MwpSLb1fKu8Ifxh-PEsejC9MkxjB9X4qJ3Q-Lrf12It4f7bftUbl4e1-1qUwYENZXWU62ZtCLQnULfNWRlLz0asM6hrntLqvcA75Ids8U8J-OkNTVdbaVciNtTb2Dm3XcMexd_d6dn8g-EDUCj</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Simulation results on A/D converter dithering</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Wagdy, M.F.</creator><creatorcontrib>Wagdy, M.F.</creatorcontrib><description>Dithering improves the linearity of A/D converters (ADCs). Wagdy and Goff (1994) have developed a criterion for assessing the deviation of ADC transfer characteristics from the unity-gain line. This criterion is based on a closed-form formula for the deviation factor "D" derived from the characteristic function of the ADC quantization error function. This approach was extended further by Wagdy (1996) to include nonideal ADCs. The results in that work pertain to additive dither, but a closed-form formula for subtractive dither may be very difficult to derive. In this paper, the ADC is modeled and dither is simulated using a software random number generator. First, additive dithering with continuous (analog) uniform (rectangular) probability density function (RPDF) is considered. The cases of an ADC with no errors, single-bit error, or multi-bit errors are investigated. Results are in excellent agreement with the previous ones, which validates the formulae therein. Second, the author presents new results using discrete (digital) rectangular dither (DRPDF). This dither type is generated via a D/A converter (DAC) whose number of bits, k, is greater by "del" than the ADC number of bits, m. For various values of "del", subtractively-dithered ADCs outperform additively-dithered ones as far as "D" is concerned. Also, the effect of increasing "del" on "D" for an ADC is investigated for the subtractive dither case, thus providing some quantitative results which are useful for the designer.</description><identifier>ISSN: 1091-5281</identifier><identifier>ISBN: 0780347978</identifier><identifier>ISBN: 9780780347977</identifier><identifier>DOI: 10.1109/IMTC.1998.679716</identifier><language>eng</language><publisher>IEEE</publisher><subject>Additives ; Computer errors ; Computer simulation ; Density functional theory ; Linearity ; MATLAB ; Quantization ; Random number generation ; Voltage</subject><ispartof>IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222), 1998, Vol.1, p.78-83 vol.1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/679716$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2052,4036,4037,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/679716$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wagdy, M.F.</creatorcontrib><title>Simulation results on A/D converter dithering</title><title>IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)</title><addtitle>IMTC</addtitle><description>Dithering improves the linearity of A/D converters (ADCs). Wagdy and Goff (1994) have developed a criterion for assessing the deviation of ADC transfer characteristics from the unity-gain line. This criterion is based on a closed-form formula for the deviation factor "D" derived from the characteristic function of the ADC quantization error function. This approach was extended further by Wagdy (1996) to include nonideal ADCs. The results in that work pertain to additive dither, but a closed-form formula for subtractive dither may be very difficult to derive. In this paper, the ADC is modeled and dither is simulated using a software random number generator. First, additive dithering with continuous (analog) uniform (rectangular) probability density function (RPDF) is considered. The cases of an ADC with no errors, single-bit error, or multi-bit errors are investigated. Results are in excellent agreement with the previous ones, which validates the formulae therein. Second, the author presents new results using discrete (digital) rectangular dither (DRPDF). This dither type is generated via a D/A converter (DAC) whose number of bits, k, is greater by "del" than the ADC number of bits, m. For various values of "del", subtractively-dithered ADCs outperform additively-dithered ones as far as "D" is concerned. Also, the effect of increasing "del" on "D" for an ADC is investigated for the subtractive dither case, thus providing some quantitative results which are useful for the designer.</description><subject>Additives</subject><subject>Computer errors</subject><subject>Computer simulation</subject><subject>Density functional theory</subject><subject>Linearity</subject><subject>MATLAB</subject><subject>Quantization</subject><subject>Random number generation</subject><subject>Voltage</subject><issn>1091-5281</issn><isbn>0780347978</isbn><isbn>9780780347977</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj09LAzEUxAMq2Fbv4mm_wG7f22STvGNZ_xUqHqznErNvNbLdSrIV_PYG6mlm4McwI8QNQoUItFw_b9sKiWylDRnUZ2IOxoJUOdlzMcsMlk1t8VLMU_oCAK2MmYnyNeyPg5vCYSwip-MwpSLb1fKu8Ifxh-PEsejC9MkxjB9X4qJ3Q-Lrf12It4f7bftUbl4e1-1qUwYENZXWU62ZtCLQnULfNWRlLz0asM6hrntLqvcA75Ids8U8J-OkNTVdbaVciNtTb2Dm3XcMexd_d6dn8g-EDUCj</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Wagdy, M.F.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>1998</creationdate><title>Simulation results on A/D converter dithering</title><author>Wagdy, M.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-8c926e964906d41cd5983f3c1708aa162f894fc00b3eaee81000e9696695d2833</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Additives</topic><topic>Computer errors</topic><topic>Computer simulation</topic><topic>Density functional theory</topic><topic>Linearity</topic><topic>MATLAB</topic><topic>Quantization</topic><topic>Random number generation</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Wagdy, M.F.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wagdy, M.F.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Simulation results on A/D converter dithering</atitle><btitle>IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)</btitle><stitle>IMTC</stitle><date>1998</date><risdate>1998</risdate><volume>1</volume><spage>78</spage><epage>83 vol.1</epage><pages>78-83 vol.1</pages><issn>1091-5281</issn><isbn>0780347978</isbn><isbn>9780780347977</isbn><abstract>Dithering improves the linearity of A/D converters (ADCs). Wagdy and Goff (1994) have developed a criterion for assessing the deviation of ADC transfer characteristics from the unity-gain line. This criterion is based on a closed-form formula for the deviation factor "D" derived from the characteristic function of the ADC quantization error function. This approach was extended further by Wagdy (1996) to include nonideal ADCs. The results in that work pertain to additive dither, but a closed-form formula for subtractive dither may be very difficult to derive. In this paper, the ADC is modeled and dither is simulated using a software random number generator. First, additive dithering with continuous (analog) uniform (rectangular) probability density function (RPDF) is considered. The cases of an ADC with no errors, single-bit error, or multi-bit errors are investigated. Results are in excellent agreement with the previous ones, which validates the formulae therein. Second, the author presents new results using discrete (digital) rectangular dither (DRPDF). This dither type is generated via a D/A converter (DAC) whose number of bits, k, is greater by "del" than the ADC number of bits, m. For various values of "del", subtractively-dithered ADCs outperform additively-dithered ones as far as "D" is concerned. Also, the effect of increasing "del" on "D" for an ADC is investigated for the subtractive dither case, thus providing some quantitative results which are useful for the designer.</abstract><pub>IEEE</pub><doi>10.1109/IMTC.1998.679716</doi></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1091-5281
ispartof IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222), 1998, Vol.1, p.78-83 vol.1
issn 1091-5281
language eng
recordid cdi_ieee_primary_679716
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Additives
Computer errors
Computer simulation
Density functional theory
Linearity
MATLAB
Quantization
Random number generation
Voltage
title Simulation results on A/D converter dithering
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T22%3A52%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Simulation%20results%20on%20A/D%20converter%20dithering&rft.btitle=IMTC/98%20Conference%20Proceedings.%20IEEE%20Instrumentation%20and%20Measurement%20Technology%20Conference.%20Where%20Instrumentation%20is%20Going%20(Cat.%20No.98CH36222)&rft.au=Wagdy,%20M.F.&rft.date=1998&rft.volume=1&rft.spage=78&rft.epage=83%20vol.1&rft.pages=78-83%20vol.1&rft.issn=1091-5281&rft.isbn=0780347978&rft.isbn_list=9780780347977&rft_id=info:doi/10.1109/IMTC.1998.679716&rft_dat=%3Cieee_6IE%3E679716%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=679716&rfr_iscdi=true