Parameter Design of a Three-Level Converter Based on Series-Connected HV-IGBTs

Although the maximum collector-emitter voltage of a high-voltage insulated-gate bipolar transistor (HV-IGBT) reaches 3300 V or higher, it still cannot satisfy the requirements of some high-voltage high-power converters. Applying power semiconductor devices in series connection can effectively improv...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on industry applications 2014-11, Vol.50 (6), p.3943-3954
Hauptverfasser: Lu, Ting, Zhao, Zhengming, Yu, Hualong, Ji, Shiqi, Yuan, Liqiang, He, Fanbo
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Although the maximum collector-emitter voltage of a high-voltage insulated-gate bipolar transistor (HV-IGBT) reaches 3300 V or higher, it still cannot satisfy the requirements of some high-voltage high-power converters. Applying power semiconductor devices in series connection can effectively improve the voltage rating and power rating of a power electronic converter. The key issue of device series connection is voltage balancing in static switching state and dynamic switching state. In this paper, a three-level converter based on series-connected HV-IGBTs is presented, its voltage-balancing subcircuits are analyzed, and the parameter design method for the converter is proposed. During the design process, key performance indexes of the series connection circuit, such as the voltage-balancing effect, loss of the voltage-balancing circuit, switching loss, and switching time, are comprehensively considered. Moreover, component parameters of the three-level converter are calculated considering the influence of the voltage-balancing circuit. The proposed parameter design method is applied in the development of a three-level HV-IGBT (4500 V/600 A) series connection test platform with 10 000-V rated dc-link voltage. Experimental results verify the validity of the proposed method.
ISSN:0093-9994
1939-9367
DOI:10.1109/TIA.2014.2315439