Non destructive crack detection at X-band
Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique show...
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creator | Das, Prosenjit Belamgi, Sharanbasappa B. Ray, Sudhabindu |
description | Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques. |
doi_str_mv | 10.1109/ICECI.2014.6767371 |
format | Conference Proceeding |
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This technique shows better resolution with compared to other reported microwave NDT techniques.</description><subject>Image resolution</subject><subject>metal crack detection</subject><subject>Microwave imaging</subject><subject>Microwave nondestructive testing</subject><subject>Surface cracks</subject><subject>Surface waves</subject><isbn>9781479939831</isbn><isbn>147993982X</isbn><isbn>1479939838</isbn><isbn>9781479939824</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2014</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj09Lw0AQxdeDUKn5AvWSq4fEmc52Z-cooWqg1EsP3spmM4H4p0qyCn57Fyw8eLz34AfPmBVCjQhy1zbbpq3XgLZ27JgYL0wh7NGyCIknXJhinl8BAMV5Yb4yt_vPU9nrnKbvmMYfLeMU4ltukuact5DKl6oLp_7aXA7hfdbi7EtzeNgemqdq9_zYNve7ahRIVQwuw5EssI-dF2_ZAdg4REs8uE1YB-kAQS17VlJQ6q3GDfS-E8pampt_7Kiqx69p_AjT7_H8h_4A4O8-7Q</recordid><startdate>201401</startdate><enddate>201401</enddate><creator>Das, Prosenjit</creator><creator>Belamgi, Sharanbasappa B.</creator><creator>Ray, Sudhabindu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201401</creationdate><title>Non destructive crack detection at X-band</title><author>Das, Prosenjit ; Belamgi, Sharanbasappa B. ; Ray, Sudhabindu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-ca6019134078cb898476004cfc437f65a2a9b010e4787e3e0e3d4ec50d8b93b93</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Image resolution</topic><topic>metal crack detection</topic><topic>Microwave imaging</topic><topic>Microwave nondestructive testing</topic><topic>Surface cracks</topic><topic>Surface waves</topic><toplevel>online_resources</toplevel><creatorcontrib>Das, Prosenjit</creatorcontrib><creatorcontrib>Belamgi, Sharanbasappa B.</creatorcontrib><creatorcontrib>Ray, Sudhabindu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Das, Prosenjit</au><au>Belamgi, Sharanbasappa B.</au><au>Ray, Sudhabindu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Non destructive crack detection at X-band</atitle><btitle>International Conference on Electronics, Communication and Instrumentation (ICECI)</btitle><stitle>ICECI</stitle><date>2014-01</date><risdate>2014</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><eisbn>9781479939831</eisbn><eisbn>147993982X</eisbn><eisbn>1479939838</eisbn><eisbn>9781479939824</eisbn><abstract>Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.</abstract><pub>IEEE</pub><doi>10.1109/ICECI.2014.6767371</doi><tpages>2</tpages></addata></record> |
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subjects | Image resolution metal crack detection Microwave imaging Microwave nondestructive testing Surface cracks Surface waves |
title | Non destructive crack detection at X-band |
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