Non destructive crack detection at X-band

Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique show...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Das, Prosenjit, Belamgi, Sharanbasappa B., Ray, Sudhabindu
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2
container_issue
container_start_page 1
container_title
container_volume
creator Das, Prosenjit
Belamgi, Sharanbasappa B.
Ray, Sudhabindu
description Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.
doi_str_mv 10.1109/ICECI.2014.6767371
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6767371</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6767371</ieee_id><sourcerecordid>6767371</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-ca6019134078cb898476004cfc437f65a2a9b010e4787e3e0e3d4ec50d8b93b93</originalsourceid><addsrcrecordid>eNotj09Lw0AQxdeDUKn5AvWSq4fEmc52Z-cooWqg1EsP3spmM4H4p0qyCn57Fyw8eLz34AfPmBVCjQhy1zbbpq3XgLZ27JgYL0wh7NGyCIknXJhinl8BAMV5Yb4yt_vPU9nrnKbvmMYfLeMU4ltukuact5DKl6oLp_7aXA7hfdbi7EtzeNgemqdq9_zYNve7ahRIVQwuw5EssI-dF2_ZAdg4REs8uE1YB-kAQS17VlJQ6q3GDfS-E8pampt_7Kiqx69p_AjT7_H8h_4A4O8-7Q</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Non destructive crack detection at X-band</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Das, Prosenjit ; Belamgi, Sharanbasappa B. ; Ray, Sudhabindu</creator><creatorcontrib>Das, Prosenjit ; Belamgi, Sharanbasappa B. ; Ray, Sudhabindu</creatorcontrib><description>Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.</description><identifier>EISBN: 9781479939831</identifier><identifier>EISBN: 147993982X</identifier><identifier>EISBN: 1479939838</identifier><identifier>EISBN: 9781479939824</identifier><identifier>DOI: 10.1109/ICECI.2014.6767371</identifier><language>eng</language><publisher>IEEE</publisher><subject>Image resolution ; metal crack detection ; Microwave imaging ; Microwave nondestructive testing ; Surface cracks ; Surface waves</subject><ispartof>International Conference on Electronics, Communication and Instrumentation (ICECI), 2014, p.1-2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6767371$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6767371$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Das, Prosenjit</creatorcontrib><creatorcontrib>Belamgi, Sharanbasappa B.</creatorcontrib><creatorcontrib>Ray, Sudhabindu</creatorcontrib><title>Non destructive crack detection at X-band</title><title>International Conference on Electronics, Communication and Instrumentation (ICECI)</title><addtitle>ICECI</addtitle><description>Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.</description><subject>Image resolution</subject><subject>metal crack detection</subject><subject>Microwave imaging</subject><subject>Microwave nondestructive testing</subject><subject>Surface cracks</subject><subject>Surface waves</subject><isbn>9781479939831</isbn><isbn>147993982X</isbn><isbn>1479939838</isbn><isbn>9781479939824</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2014</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj09Lw0AQxdeDUKn5AvWSq4fEmc52Z-cooWqg1EsP3spmM4H4p0qyCn57Fyw8eLz34AfPmBVCjQhy1zbbpq3XgLZ27JgYL0wh7NGyCIknXJhinl8BAMV5Yb4yt_vPU9nrnKbvmMYfLeMU4ltukuact5DKl6oLp_7aXA7hfdbi7EtzeNgemqdq9_zYNve7ahRIVQwuw5EssI-dF2_ZAdg4REs8uE1YB-kAQS17VlJQ6q3GDfS-E8pampt_7Kiqx69p_AjT7_H8h_4A4O8-7Q</recordid><startdate>201401</startdate><enddate>201401</enddate><creator>Das, Prosenjit</creator><creator>Belamgi, Sharanbasappa B.</creator><creator>Ray, Sudhabindu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201401</creationdate><title>Non destructive crack detection at X-band</title><author>Das, Prosenjit ; Belamgi, Sharanbasappa B. ; Ray, Sudhabindu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-ca6019134078cb898476004cfc437f65a2a9b010e4787e3e0e3d4ec50d8b93b93</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Image resolution</topic><topic>metal crack detection</topic><topic>Microwave imaging</topic><topic>Microwave nondestructive testing</topic><topic>Surface cracks</topic><topic>Surface waves</topic><toplevel>online_resources</toplevel><creatorcontrib>Das, Prosenjit</creatorcontrib><creatorcontrib>Belamgi, Sharanbasappa B.</creatorcontrib><creatorcontrib>Ray, Sudhabindu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Das, Prosenjit</au><au>Belamgi, Sharanbasappa B.</au><au>Ray, Sudhabindu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Non destructive crack detection at X-band</atitle><btitle>International Conference on Electronics, Communication and Instrumentation (ICECI)</btitle><stitle>ICECI</stitle><date>2014-01</date><risdate>2014</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><eisbn>9781479939831</eisbn><eisbn>147993982X</eisbn><eisbn>1479939838</eisbn><eisbn>9781479939824</eisbn><abstract>Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.</abstract><pub>IEEE</pub><doi>10.1109/ICECI.2014.6767371</doi><tpages>2</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier EISBN: 9781479939831
ispartof International Conference on Electronics, Communication and Instrumentation (ICECI), 2014, p.1-2
issn
language eng
recordid cdi_ieee_primary_6767371
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Image resolution
metal crack detection
Microwave imaging
Microwave nondestructive testing
Surface cracks
Surface waves
title Non destructive crack detection at X-band
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T19%3A31%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Non%20destructive%20crack%20detection%20at%20X-band&rft.btitle=International%20Conference%20on%20Electronics,%20Communication%20and%20Instrumentation%20(ICECI)&rft.au=Das,%20Prosenjit&rft.date=2014-01&rft.spage=1&rft.epage=2&rft.pages=1-2&rft_id=info:doi/10.1109/ICECI.2014.6767371&rft_dat=%3Cieee_6IE%3E6767371%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781479939831&rft.eisbn_list=147993982X&rft.eisbn_list=1479939838&rft.eisbn_list=9781479939824&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6767371&rfr_iscdi=true