On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories

The development of new generation nonvolatile memories, such as Phase Change Memories (PCMs) and Resistive-RAMs (ReRAMs), calls for accurate and controllable programming pulses, which are fundamental to adequately characterize the memory cell. Indeed, the final cell state depends on parameters of th...

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Veröffentlicht in:	IEEE transactions on semiconductor manufacturing 2014-05, Vol.27 (2), p.134-150
Hauptverfasser:	Covi, Erika, Cabrini, Alessandro, Vendrame, Loris, Bortesi, Luca, Gastaldi, Roberto, Torelli, Guido
Format:	Artikel
Sprache:	eng
Schlagworte:	Accuracy Amplitudes analog circuits Calibration Computer architecture Integrated circuits Lanes memory testing Microprocessors Programming Pulse generation Pulse generators Semiconductors Spreads Switches Test equipment Testing
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