1 to 220 GHz Complex Permittivity Behavior of Flexible Polydimethylsiloxane Substrate

Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those extracted...

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Veröffentlicht in:IEEE microwave and wireless components letters 2014-04, Vol.24 (4), p.278-280
Hauptverfasser: Cresson, P-Y, Orlic, Y., Legier, J-F, Paleczny, E., Dubois, L., Tiercelin, N., Coquet, P., Pernod, P., Lasri, T.
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container_end_page 280
container_issue 4
container_start_page 278
container_title IEEE microwave and wireless components letters
container_volume 24
creator Cresson, P-Y
Orlic, Y.
Legier, J-F
Paleczny, E.
Dubois, L.
Tiercelin, N.
Coquet, P.
Pernod, P.
Lasri, T.
description Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those extracted by de-embedding techniques using S-parameters measurements. The real permittivity evolves from 2.9 to 2.55 while the loss tangent increases slowly to reach 0.048 at 210 GHz.
doi_str_mv 10.1109/LMWC.2013.2295230
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_6712937</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6712937</ieee_id><sourcerecordid>3271183311</sourcerecordid><originalsourceid>FETCH-LOGICAL-c433t-e5e3cf13e5e7751a0fc8cf8956ec09fd998c0376b4856984e4d8fd76a00f12303</originalsourceid><addsrcrecordid>eNpdkV-LUzEQxS-i4Lr6AcSXgAj6cOtM_tybPK7F3QoVF3TxMaRpQrPkNjW5LVs_vbm09MGnGWZ-czjDaZq3CDNEUJ-X33_PZxSQzShVgjJ41lyhELLFvuPPp55hiwzUy-ZVKY8AyCXHq-YByZgIpUDuFn_JPA276J7IvctDGMdwCOORfHEbcwgpk-TJbd2GVXTkPsXjOgxu3BxjCTE9ma0jP_erMmYzutfNC29icW_O9bp5uP36a75olz_uvs1vlq3ljI2tE45Zj6zWvhdowFtpvVSicxaUXyslLbC-W3EpOiW542vp131nADzWH9l18-mkuzFR73IYTD7qZIJe3Cz1NANQEqrEASv78cTucvqzd2XUQyjWxVidp33R2ElRXQjJK_r-P_Qx7fO2fqJRIGeUCqCVwhNlcyolO39xgKCnUPQUip5C0edQ6s2Hs7Ip1kSfzdaGcjmkkqtOqL5y705ccM5d1l2PVLGe_QN8fpLE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1514322502</pqid></control><display><type>article</type><title>1 to 220 GHz Complex Permittivity Behavior of Flexible Polydimethylsiloxane Substrate</title><source>IEEE Electronic Library (IEL)</source><creator>Cresson, P-Y ; Orlic, Y. ; Legier, J-F ; Paleczny, E. ; Dubois, L. ; Tiercelin, N. ; Coquet, P. ; Pernod, P. ; Lasri, T.</creator><creatorcontrib>Cresson, P-Y ; Orlic, Y. ; Legier, J-F ; Paleczny, E. ; Dubois, L. ; Tiercelin, N. ; Coquet, P. ; Pernod, P. ; Lasri, T.</creatorcontrib><description>Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those extracted by de-embedding techniques using S-parameters measurements. The real permittivity evolves from 2.9 to 2.55 while the loss tangent increases slowly to reach 0.048 at 210 GHz.</description><identifier>ISSN: 1531-1309</identifier><identifier>ISSN: 2771-957X</identifier><identifier>EISSN: 1558-1764</identifier><identifier>EISSN: 2771-9588</identifier><identifier>DOI: 10.1109/LMWC.2013.2295230</identifier><identifier>CODEN: IMWCBJ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit properties ; Complex permittivity ; Computer programs ; Constants ; Coplanar waveguides ; Dielectric constant ; Dielectrics ; Electric, optical and optoelectronic circuits ; Electromagnetism ; Electronics ; Engineering Sciences ; Exact sciences and technology ; Finite element analysis ; Flexible electronics ; Materials ; Mathematical analysis ; Micro and nanotechnologies ; Microelectronics ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Microwaves ; millimeter wave ; Permittivity ; Permittivity measurement ; polydimethylsiloxane (PDMS) ; polymer films ; Substrates ; Transmission line measurements ; Wave propagation</subject><ispartof>IEEE microwave and wireless components letters, 2014-04, Vol.24 (4), p.278-280</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2014</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c433t-e5e3cf13e5e7751a0fc8cf8956ec09fd998c0376b4856984e4d8fd76a00f12303</citedby><cites>FETCH-LOGICAL-c433t-e5e3cf13e5e7751a0fc8cf8956ec09fd998c0376b4856984e4d8fd76a00f12303</cites><orcidid>0000-0001-8989-0588 ; 0000-0001-7400-4272 ; 0000-0002-6708-8487</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6712937$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6712937$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=28496597$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-00980037$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Cresson, P-Y</creatorcontrib><creatorcontrib>Orlic, Y.</creatorcontrib><creatorcontrib>Legier, J-F</creatorcontrib><creatorcontrib>Paleczny, E.</creatorcontrib><creatorcontrib>Dubois, L.</creatorcontrib><creatorcontrib>Tiercelin, N.</creatorcontrib><creatorcontrib>Coquet, P.</creatorcontrib><creatorcontrib>Pernod, P.</creatorcontrib><creatorcontrib>Lasri, T.</creatorcontrib><title>1 to 220 GHz Complex Permittivity Behavior of Flexible Polydimethylsiloxane Substrate</title><title>IEEE microwave and wireless components letters</title><addtitle>LMWC</addtitle><description>Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those extracted by de-embedding techniques using S-parameters measurements. The real permittivity evolves from 2.9 to 2.55 while the loss tangent increases slowly to reach 0.048 at 210 GHz.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Complex permittivity</subject><subject>Computer programs</subject><subject>Constants</subject><subject>Coplanar waveguides</subject><subject>Dielectric constant</subject><subject>Dielectrics</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electromagnetism</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Exact sciences and technology</subject><subject>Finite element analysis</subject><subject>Flexible electronics</subject><subject>Materials</subject><subject>Mathematical analysis</subject><subject>Micro and nanotechnologies</subject><subject>Microelectronics</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Microwaves</subject><subject>millimeter wave</subject><subject>Permittivity</subject><subject>Permittivity measurement</subject><subject>polydimethylsiloxane (PDMS)</subject><subject>polymer films</subject><subject>Substrates</subject><subject>Transmission line measurements</subject><subject>Wave propagation</subject><issn>1531-1309</issn><issn>2771-957X</issn><issn>1558-1764</issn><issn>2771-9588</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkV-LUzEQxS-i4Lr6AcSXgAj6cOtM_tybPK7F3QoVF3TxMaRpQrPkNjW5LVs_vbm09MGnGWZ-czjDaZq3CDNEUJ-X33_PZxSQzShVgjJ41lyhELLFvuPPp55hiwzUy-ZVKY8AyCXHq-YByZgIpUDuFn_JPA276J7IvctDGMdwCOORfHEbcwgpk-TJbd2GVXTkPsXjOgxu3BxjCTE9ma0jP_erMmYzutfNC29icW_O9bp5uP36a75olz_uvs1vlq3ljI2tE45Zj6zWvhdowFtpvVSicxaUXyslLbC-W3EpOiW542vp131nADzWH9l18-mkuzFR73IYTD7qZIJe3Cz1NANQEqrEASv78cTucvqzd2XUQyjWxVidp33R2ElRXQjJK_r-P_Qx7fO2fqJRIGeUCqCVwhNlcyolO39xgKCnUPQUip5C0edQ6s2Hs7Ip1kSfzdaGcjmkkqtOqL5y705ccM5d1l2PVLGe_QN8fpLE</recordid><startdate>20140401</startdate><enddate>20140401</enddate><creator>Cresson, P-Y</creator><creator>Orlic, Y.</creator><creator>Legier, J-F</creator><creator>Paleczny, E.</creator><creator>Dubois, L.</creator><creator>Tiercelin, N.</creator><creator>Coquet, P.</creator><creator>Pernod, P.</creator><creator>Lasri, T.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0001-8989-0588</orcidid><orcidid>https://orcid.org/0000-0001-7400-4272</orcidid><orcidid>https://orcid.org/0000-0002-6708-8487</orcidid></search><sort><creationdate>20140401</creationdate><title>1 to 220 GHz Complex Permittivity Behavior of Flexible Polydimethylsiloxane Substrate</title><author>Cresson, P-Y ; Orlic, Y. ; Legier, J-F ; Paleczny, E. ; Dubois, L. ; Tiercelin, N. ; Coquet, P. ; Pernod, P. ; Lasri, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c433t-e5e3cf13e5e7751a0fc8cf8956ec09fd998c0376b4856984e4d8fd76a00f12303</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Complex permittivity</topic><topic>Computer programs</topic><topic>Constants</topic><topic>Coplanar waveguides</topic><topic>Dielectric constant</topic><topic>Dielectrics</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electromagnetism</topic><topic>Electronics</topic><topic>Engineering Sciences</topic><topic>Exact sciences and technology</topic><topic>Finite element analysis</topic><topic>Flexible electronics</topic><topic>Materials</topic><topic>Mathematical analysis</topic><topic>Micro and nanotechnologies</topic><topic>Microelectronics</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Microwaves</topic><topic>millimeter wave</topic><topic>Permittivity</topic><topic>Permittivity measurement</topic><topic>polydimethylsiloxane (PDMS)</topic><topic>polymer films</topic><topic>Substrates</topic><topic>Transmission line measurements</topic><topic>Wave propagation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cresson, P-Y</creatorcontrib><creatorcontrib>Orlic, Y.</creatorcontrib><creatorcontrib>Legier, J-F</creatorcontrib><creatorcontrib>Paleczny, E.</creatorcontrib><creatorcontrib>Dubois, L.</creatorcontrib><creatorcontrib>Tiercelin, N.</creatorcontrib><creatorcontrib>Coquet, P.</creatorcontrib><creatorcontrib>Pernod, P.</creatorcontrib><creatorcontrib>Lasri, T.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>IEEE microwave and wireless components letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cresson, P-Y</au><au>Orlic, Y.</au><au>Legier, J-F</au><au>Paleczny, E.</au><au>Dubois, L.</au><au>Tiercelin, N.</au><au>Coquet, P.</au><au>Pernod, P.</au><au>Lasri, T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>1 to 220 GHz Complex Permittivity Behavior of Flexible Polydimethylsiloxane Substrate</atitle><jtitle>IEEE microwave and wireless components letters</jtitle><stitle>LMWC</stitle><date>2014-04-01</date><risdate>2014</risdate><volume>24</volume><issue>4</issue><spage>278</spage><epage>280</epage><pages>278-280</pages><issn>1531-1309</issn><issn>2771-957X</issn><eissn>1558-1764</eissn><eissn>2771-9588</eissn><coden>IMWCBJ</coden><abstract>Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those extracted by de-embedding techniques using S-parameters measurements. The real permittivity evolves from 2.9 to 2.55 while the loss tangent increases slowly to reach 0.048 at 210 GHz.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LMWC.2013.2295230</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0001-8989-0588</orcidid><orcidid>https://orcid.org/0000-0001-7400-4272</orcidid><orcidid>https://orcid.org/0000-0002-6708-8487</orcidid><oa>free_for_read</oa></addata></record>
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identifier ISSN: 1531-1309
ispartof IEEE microwave and wireless components letters, 2014-04, Vol.24 (4), p.278-280
issn 1531-1309
2771-957X
1558-1764
2771-9588
language eng
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source IEEE Electronic Library (IEL)
subjects Applied sciences
Circuit properties
Complex permittivity
Computer programs
Constants
Coplanar waveguides
Dielectric constant
Dielectrics
Electric, optical and optoelectronic circuits
Electromagnetism
Electronics
Engineering Sciences
Exact sciences and technology
Finite element analysis
Flexible electronics
Materials
Mathematical analysis
Micro and nanotechnologies
Microelectronics
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Microwaves
millimeter wave
Permittivity
Permittivity measurement
polydimethylsiloxane (PDMS)
polymer films
Substrates
Transmission line measurements
Wave propagation
title 1 to 220 GHz Complex Permittivity Behavior of Flexible Polydimethylsiloxane Substrate
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T09%3A47%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=1%20to%20220%20GHz%20Complex%20Permittivity%20Behavior%20of%20Flexible%20Polydimethylsiloxane%20Substrate&rft.jtitle=IEEE%20microwave%20and%20wireless%20components%20letters&rft.au=Cresson,%20P-Y&rft.date=2014-04-01&rft.volume=24&rft.issue=4&rft.spage=278&rft.epage=280&rft.pages=278-280&rft.issn=1531-1309&rft.eissn=1558-1764&rft.coden=IMWCBJ&rft_id=info:doi/10.1109/LMWC.2013.2295230&rft_dat=%3Cproquest_RIE%3E3271183311%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1514322502&rft_id=info:pmid/&rft_ieee_id=6712937&rfr_iscdi=true