High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials
Vertically aligned carbon nanotube (VACNT) array is an ideal form for heat dissipation in electronic packaging, due to its high-intrinsic thermal conductivity and robust mechanical properties. In this paper, we report the growth of high-quality VACNTs for the applications as thermal interface materi...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on components, packaging, and manufacturing technology (2011) packaging, and manufacturing technology (2011), 2014-02, Vol.4 (2), p.232-239 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 239 |
---|---|
container_issue | 2 |
container_start_page | 232 |
container_title | IEEE transactions on components, packaging, and manufacturing technology (2011) |
container_volume | 4 |
creator | Yagang Yao Ju Nie Tey Zhuo Li Jun Wei Bennett, Kathleen McNamara, Andrew Joshi, Yogendra Tan, Rachel Lee Siew Ling, Sharon Nai Mui Ching-Ping Wong |
description | Vertically aligned carbon nanotube (VACNT) array is an ideal form for heat dissipation in electronic packaging, due to its high-intrinsic thermal conductivity and robust mechanical properties. In this paper, we report the growth of high-quality VACNTs for the applications as thermal interface materials (TIMs). The high-quality VACNTs were grown and confirmed by the characterizations of Raman and thermogravimetric analyses. Metalized VACNT array was transferred and bonded to a metalized silicon or copper substrate. The VACNT-based TIM structure (Si-Ti/Ni/Au-In-Ti/Ni/Au-VACNT-Ti/Ni/Au-In-Ti/Ni/Au-Cu) was then successfully made after bonding to another substrate (copper or silicon). The total boundary resistance between the VACNT array and the surrounding materials was measured by an infrared thermal imaging method. Compared with the TIM sample made from carbon nanotubes grown in our laboratory chemical vapor deposition (CVD), the thermal boundary resistance of the TIM sample made from CNTs in the black magic CVD was greatly reduced from 11.6±0.5 to 3.4±0.1 mm 2 KW -1 . Overall, these high quality, and bonded VACNT arrays demonstrate properties promising for next-generation TIM applications. |
doi_str_mv | 10.1109/TCPMT.2013.2296370 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_6709667</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6709667</ieee_id><sourcerecordid>3240839201</sourcerecordid><originalsourceid>FETCH-LOGICAL-c295t-666c7ac319d225e0985cd7afe1b5afd87a0011291f0291a8196d9a8e5d8ae2b53</originalsourceid><addsrcrecordid>eNo9kE9PwzAMxSMEEtPYF4BLJM4dSUrS5jhVwCZt_JEK1-C27papa0fSHvbtyRiaD_Y7vGdbP0JuOZtyzvRDnr2v8qlgPJ4KoVWcsAsyElyqKNapvDxrya7JxPstCyVTlrB4RL7ndr2JPgZobH-gX-h6W0LTHOissesWK5qBK7qWvkLb9UOBntado7P9vgm-3natp-BpvkG3g4Yu2h5dDSXSFQRlofE35KoOAyf_c0w-n5_ybB4t314W2WwZlULLPlJKlQmUMdeVEBJZeLysEqiRFxLqKk2AMc6F5jULDVKuVaUhRVmlgKKQ8Zjcn_buXfczoO_NthtcG04aLpnkgj2qo0ucXKXrvHdYm72zO3AHw5k5wjR_MM0RpvmHGUJ3p5BFxHNAJUwrlcS_70Rwlg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1505120465</pqid></control><display><type>article</type><title>High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials</title><source>IEEE Electronic Library (IEL)</source><creator>Yagang Yao ; Ju Nie Tey ; Zhuo Li ; Jun Wei ; Bennett, Kathleen ; McNamara, Andrew ; Joshi, Yogendra ; Tan, Rachel Lee Siew ; Ling, Sharon Nai Mui ; Ching-Ping Wong</creator><creatorcontrib>Yagang Yao ; Ju Nie Tey ; Zhuo Li ; Jun Wei ; Bennett, Kathleen ; McNamara, Andrew ; Joshi, Yogendra ; Tan, Rachel Lee Siew ; Ling, Sharon Nai Mui ; Ching-Ping Wong</creatorcontrib><description>Vertically aligned carbon nanotube (VACNT) array is an ideal form for heat dissipation in electronic packaging, due to its high-intrinsic thermal conductivity and robust mechanical properties. In this paper, we report the growth of high-quality VACNTs for the applications as thermal interface materials (TIMs). The high-quality VACNTs were grown and confirmed by the characterizations of Raman and thermogravimetric analyses. Metalized VACNT array was transferred and bonded to a metalized silicon or copper substrate. The VACNT-based TIM structure (Si-Ti/Ni/Au-In-Ti/Ni/Au-VACNT-Ti/Ni/Au-In-Ti/Ni/Au-Cu) was then successfully made after bonding to another substrate (copper or silicon). The total boundary resistance between the VACNT array and the surrounding materials was measured by an infrared thermal imaging method. Compared with the TIM sample made from carbon nanotubes grown in our laboratory chemical vapor deposition (CVD), the thermal boundary resistance of the TIM sample made from CNTs in the black magic CVD was greatly reduced from 11.6±0.5 to 3.4±0.1 mm 2 KW -1 . Overall, these high quality, and bonded VACNT arrays demonstrate properties promising for next-generation TIM applications.</description><identifier>ISSN: 2156-3950</identifier><identifier>EISSN: 2156-3985</identifier><identifier>DOI: 10.1109/TCPMT.2013.2296370</identifier><identifier>CODEN: ITCPC8</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Arrays ; Chemical vapor deposition ; Electronic packaging thermal management ; High quality ; Indium ; low-thermal resistance ; Nanotechnology ; Nanotubes ; Nickel ; Silicon ; Substrates ; thermal interface materials (TIMs) ; vertically aligned carbon nanotubes (VACNTs)</subject><ispartof>IEEE transactions on components, packaging, and manufacturing technology (2011), 2014-02, Vol.4 (2), p.232-239</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Feb 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c295t-666c7ac319d225e0985cd7afe1b5afd87a0011291f0291a8196d9a8e5d8ae2b53</citedby><cites>FETCH-LOGICAL-c295t-666c7ac319d225e0985cd7afe1b5afd87a0011291f0291a8196d9a8e5d8ae2b53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6709667$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27922,27923,54756</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6709667$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yagang Yao</creatorcontrib><creatorcontrib>Ju Nie Tey</creatorcontrib><creatorcontrib>Zhuo Li</creatorcontrib><creatorcontrib>Jun Wei</creatorcontrib><creatorcontrib>Bennett, Kathleen</creatorcontrib><creatorcontrib>McNamara, Andrew</creatorcontrib><creatorcontrib>Joshi, Yogendra</creatorcontrib><creatorcontrib>Tan, Rachel Lee Siew</creatorcontrib><creatorcontrib>Ling, Sharon Nai Mui</creatorcontrib><creatorcontrib>Ching-Ping Wong</creatorcontrib><title>High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials</title><title>IEEE transactions on components, packaging, and manufacturing technology (2011)</title><addtitle>TCPMT</addtitle><description>Vertically aligned carbon nanotube (VACNT) array is an ideal form for heat dissipation in electronic packaging, due to its high-intrinsic thermal conductivity and robust mechanical properties. In this paper, we report the growth of high-quality VACNTs for the applications as thermal interface materials (TIMs). The high-quality VACNTs were grown and confirmed by the characterizations of Raman and thermogravimetric analyses. Metalized VACNT array was transferred and bonded to a metalized silicon or copper substrate. The VACNT-based TIM structure (Si-Ti/Ni/Au-In-Ti/Ni/Au-VACNT-Ti/Ni/Au-In-Ti/Ni/Au-Cu) was then successfully made after bonding to another substrate (copper or silicon). The total boundary resistance between the VACNT array and the surrounding materials was measured by an infrared thermal imaging method. Compared with the TIM sample made from carbon nanotubes grown in our laboratory chemical vapor deposition (CVD), the thermal boundary resistance of the TIM sample made from CNTs in the black magic CVD was greatly reduced from 11.6±0.5 to 3.4±0.1 mm 2 KW -1 . Overall, these high quality, and bonded VACNT arrays demonstrate properties promising for next-generation TIM applications.</description><subject>Arrays</subject><subject>Chemical vapor deposition</subject><subject>Electronic packaging thermal management</subject><subject>High quality</subject><subject>Indium</subject><subject>low-thermal resistance</subject><subject>Nanotechnology</subject><subject>Nanotubes</subject><subject>Nickel</subject><subject>Silicon</subject><subject>Substrates</subject><subject>thermal interface materials (TIMs)</subject><subject>vertically aligned carbon nanotubes (VACNTs)</subject><issn>2156-3950</issn><issn>2156-3985</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE9PwzAMxSMEEtPYF4BLJM4dSUrS5jhVwCZt_JEK1-C27papa0fSHvbtyRiaD_Y7vGdbP0JuOZtyzvRDnr2v8qlgPJ4KoVWcsAsyElyqKNapvDxrya7JxPstCyVTlrB4RL7ndr2JPgZobH-gX-h6W0LTHOissesWK5qBK7qWvkLb9UOBntado7P9vgm-3natp-BpvkG3g4Yu2h5dDSXSFQRlofE35KoOAyf_c0w-n5_ybB4t314W2WwZlULLPlJKlQmUMdeVEBJZeLysEqiRFxLqKk2AMc6F5jULDVKuVaUhRVmlgKKQ8Zjcn_buXfczoO_NthtcG04aLpnkgj2qo0ucXKXrvHdYm72zO3AHw5k5wjR_MM0RpvmHGUJ3p5BFxHNAJUwrlcS_70Rwlg</recordid><startdate>20140201</startdate><enddate>20140201</enddate><creator>Yagang Yao</creator><creator>Ju Nie Tey</creator><creator>Zhuo Li</creator><creator>Jun Wei</creator><creator>Bennett, Kathleen</creator><creator>McNamara, Andrew</creator><creator>Joshi, Yogendra</creator><creator>Tan, Rachel Lee Siew</creator><creator>Ling, Sharon Nai Mui</creator><creator>Ching-Ping Wong</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20140201</creationdate><title>High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials</title><author>Yagang Yao ; Ju Nie Tey ; Zhuo Li ; Jun Wei ; Bennett, Kathleen ; McNamara, Andrew ; Joshi, Yogendra ; Tan, Rachel Lee Siew ; Ling, Sharon Nai Mui ; Ching-Ping Wong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c295t-666c7ac319d225e0985cd7afe1b5afd87a0011291f0291a8196d9a8e5d8ae2b53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Arrays</topic><topic>Chemical vapor deposition</topic><topic>Electronic packaging thermal management</topic><topic>High quality</topic><topic>Indium</topic><topic>low-thermal resistance</topic><topic>Nanotechnology</topic><topic>Nanotubes</topic><topic>Nickel</topic><topic>Silicon</topic><topic>Substrates</topic><topic>thermal interface materials (TIMs)</topic><topic>vertically aligned carbon nanotubes (VACNTs)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yagang Yao</creatorcontrib><creatorcontrib>Ju Nie Tey</creatorcontrib><creatorcontrib>Zhuo Li</creatorcontrib><creatorcontrib>Jun Wei</creatorcontrib><creatorcontrib>Bennett, Kathleen</creatorcontrib><creatorcontrib>McNamara, Andrew</creatorcontrib><creatorcontrib>Joshi, Yogendra</creatorcontrib><creatorcontrib>Tan, Rachel Lee Siew</creatorcontrib><creatorcontrib>Ling, Sharon Nai Mui</creatorcontrib><creatorcontrib>Ching-Ping Wong</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on components, packaging, and manufacturing technology (2011)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yagang Yao</au><au>Ju Nie Tey</au><au>Zhuo Li</au><au>Jun Wei</au><au>Bennett, Kathleen</au><au>McNamara, Andrew</au><au>Joshi, Yogendra</au><au>Tan, Rachel Lee Siew</au><au>Ling, Sharon Nai Mui</au><au>Ching-Ping Wong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials</atitle><jtitle>IEEE transactions on components, packaging, and manufacturing technology (2011)</jtitle><stitle>TCPMT</stitle><date>2014-02-01</date><risdate>2014</risdate><volume>4</volume><issue>2</issue><spage>232</spage><epage>239</epage><pages>232-239</pages><issn>2156-3950</issn><eissn>2156-3985</eissn><coden>ITCPC8</coden><abstract>Vertically aligned carbon nanotube (VACNT) array is an ideal form for heat dissipation in electronic packaging, due to its high-intrinsic thermal conductivity and robust mechanical properties. In this paper, we report the growth of high-quality VACNTs for the applications as thermal interface materials (TIMs). The high-quality VACNTs were grown and confirmed by the characterizations of Raman and thermogravimetric analyses. Metalized VACNT array was transferred and bonded to a metalized silicon or copper substrate. The VACNT-based TIM structure (Si-Ti/Ni/Au-In-Ti/Ni/Au-VACNT-Ti/Ni/Au-In-Ti/Ni/Au-Cu) was then successfully made after bonding to another substrate (copper or silicon). The total boundary resistance between the VACNT array and the surrounding materials was measured by an infrared thermal imaging method. Compared with the TIM sample made from carbon nanotubes grown in our laboratory chemical vapor deposition (CVD), the thermal boundary resistance of the TIM sample made from CNTs in the black magic CVD was greatly reduced from 11.6±0.5 to 3.4±0.1 mm 2 KW -1 . Overall, these high quality, and bonded VACNT arrays demonstrate properties promising for next-generation TIM applications.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/TCPMT.2013.2296370</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 2156-3950 |
ispartof | IEEE transactions on components, packaging, and manufacturing technology (2011), 2014-02, Vol.4 (2), p.232-239 |
issn | 2156-3950 2156-3985 |
language | eng |
recordid | cdi_ieee_primary_6709667 |
source | IEEE Electronic Library (IEL) |
subjects | Arrays Chemical vapor deposition Electronic packaging thermal management High quality Indium low-thermal resistance Nanotechnology Nanotubes Nickel Silicon Substrates thermal interface materials (TIMs) vertically aligned carbon nanotubes (VACNTs) |
title | High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T09%3A05%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-Quality%20Vertically%20Aligned%20Carbon%20Nanotubes%20for%20Applications%20as%20Thermal%20Interface%20Materials&rft.jtitle=IEEE%20transactions%20on%20components,%20packaging,%20and%20manufacturing%20technology%20(2011)&rft.au=Yagang%20Yao&rft.date=2014-02-01&rft.volume=4&rft.issue=2&rft.spage=232&rft.epage=239&rft.pages=232-239&rft.issn=2156-3950&rft.eissn=2156-3985&rft.coden=ITCPC8&rft_id=info:doi/10.1109/TCPMT.2013.2296370&rft_dat=%3Cproquest_RIE%3E3240839201%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1505120465&rft_id=info:pmid/&rft_ieee_id=6709667&rfr_iscdi=true |