Online Vce measurement method for wear-out monitoring of high power IGBT modules
A simple Vce online monitoring circuit is presented in this paper. It allows an accurate wear out prediction of IGBT modules, in high-power applications, during normal converter operation. Bipolar measurement allows monitoring of both IGBT and antiparallel diode. The circuit uses two serial connecte...
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| creator | Beczkowski, Szymon Ghimre, Pramod de Vega, Angel Ruiz Munk-Nielsen, Stig Rannestad, Bjorn Thogersen, Paul |
| description | A simple Vce online monitoring circuit is presented in this paper. It allows an accurate wear out prediction of IGBT modules, in high-power applications, during normal converter operation. Bipolar measurement allows monitoring of both IGBT and antiparallel diode. The circuit uses two serial connected diodes to sense the Vce voltage with millivolt accuracy. One diode acts as a protection to block high DC voltage present on input terminals. When the device is conducting the voltage on the second diode is measured to compensate for the voltage drop on the protection diode thus eliminating voltage offset due to diodes' forward voltage temperature dependency. Using four diodes one can monitor voltages on all power devices in a converter leg. |
| doi_str_mv | 10.1109/EPE.2013.6634390 |
| format | Conference Proceeding |
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It allows an accurate wear out prediction of IGBT modules, in high-power applications, during normal converter operation. Bipolar measurement allows monitoring of both IGBT and antiparallel diode. The circuit uses two serial connected diodes to sense the Vce voltage with millivolt accuracy. One diode acts as a protection to block high DC voltage present on input terminals. When the device is conducting the voltage on the second diode is measured to compensate for the voltage drop on the protection diode thus eliminating voltage offset due to diodes' forward voltage temperature dependency. Using four diodes one can monitor voltages on all power devices in a converter leg.</description><identifier>EISBN: 9781479901166</identifier><identifier>EISBN: 1479901164</identifier><identifier>DOI: 10.1109/EPE.2013.6634390</identifier><language>eng</language><publisher>IEEE</publisher><subject>ageing ; Current measurement ; diode ; IGBT ; Insulated gate bipolar transistors ; Measurement ; reliability ; Schottky diodes ; Sea measurements ; Temperature measurement ; Voltage measurement ; Wires</subject><ispartof>2013 15th European Conference on Power Electronics and Applications (EPE), 2013, p.1-7</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1790-c889e8f0e1b47418be8fdec03a57100545eb376de77cde0e1b74f048046c058d3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6634390$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,778,782,787,788,2054,27912,54907</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6634390$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Beczkowski, Szymon</creatorcontrib><creatorcontrib>Ghimre, Pramod</creatorcontrib><creatorcontrib>de Vega, Angel Ruiz</creatorcontrib><creatorcontrib>Munk-Nielsen, Stig</creatorcontrib><creatorcontrib>Rannestad, Bjorn</creatorcontrib><creatorcontrib>Thogersen, Paul</creatorcontrib><title>Online Vce measurement method for wear-out monitoring of high power IGBT modules</title><title>2013 15th European Conference on Power Electronics and Applications (EPE)</title><addtitle>EPE</addtitle><description>A simple Vce online monitoring circuit is presented in this paper. It allows an accurate wear out prediction of IGBT modules, in high-power applications, during normal converter operation. Bipolar measurement allows monitoring of both IGBT and antiparallel diode. The circuit uses two serial connected diodes to sense the Vce voltage with millivolt accuracy. One diode acts as a protection to block high DC voltage present on input terminals. When the device is conducting the voltage on the second diode is measured to compensate for the voltage drop on the protection diode thus eliminating voltage offset due to diodes' forward voltage temperature dependency. Using four diodes one can monitor voltages on all power devices in a converter leg.</description><subject>ageing</subject><subject>Current measurement</subject><subject>diode</subject><subject>IGBT</subject><subject>Insulated gate bipolar transistors</subject><subject>Measurement</subject><subject>reliability</subject><subject>Schottky diodes</subject><subject>Sea measurements</subject><subject>Temperature measurement</subject><subject>Voltage measurement</subject><subject>Wires</subject><isbn>9781479901166</isbn><isbn>1479901164</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT8tKw0AUHReCUrMX3MwPJN7rTOax1FJrodAuqtuSTG6akSRTJgnFvzdiV-fJgcPYI0KGCPZ5tV9lL4AiU0pIYeGGJVYblNpaQFTqjiXD8A0AqDXmUt6z_a5vfU_8yxHvqBimSB3148zHJlS8DpFfqIhpmGYv9H4M0fcnHmre-FPDz-FCkW_Wb4c5raaWhgd2WxftQMkVF-zzfXVYfqTb3XqzfN2mDrWF1BljydRAWEot0ZSzqMiBKHKNALnMqRRaVaS1q-ivpmUN0oBUDnJTiQV7-t_1RHQ8R98V8ed4_S1-AXt6TUc</recordid><startdate>201309</startdate><enddate>201309</enddate><creator>Beczkowski, Szymon</creator><creator>Ghimre, Pramod</creator><creator>de Vega, Angel Ruiz</creator><creator>Munk-Nielsen, Stig</creator><creator>Rannestad, Bjorn</creator><creator>Thogersen, Paul</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201309</creationdate><title>Online Vce measurement method for wear-out monitoring of high power IGBT modules</title><author>Beczkowski, Szymon ; Ghimre, Pramod ; de Vega, Angel Ruiz ; Munk-Nielsen, Stig ; Rannestad, Bjorn ; Thogersen, Paul</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1790-c889e8f0e1b47418be8fdec03a57100545eb376de77cde0e1b74f048046c058d3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>ageing</topic><topic>Current measurement</topic><topic>diode</topic><topic>IGBT</topic><topic>Insulated gate bipolar transistors</topic><topic>Measurement</topic><topic>reliability</topic><topic>Schottky diodes</topic><topic>Sea measurements</topic><topic>Temperature measurement</topic><topic>Voltage measurement</topic><topic>Wires</topic><toplevel>online_resources</toplevel><creatorcontrib>Beczkowski, Szymon</creatorcontrib><creatorcontrib>Ghimre, Pramod</creatorcontrib><creatorcontrib>de Vega, Angel Ruiz</creatorcontrib><creatorcontrib>Munk-Nielsen, Stig</creatorcontrib><creatorcontrib>Rannestad, Bjorn</creatorcontrib><creatorcontrib>Thogersen, Paul</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Beczkowski, Szymon</au><au>Ghimre, Pramod</au><au>de Vega, Angel Ruiz</au><au>Munk-Nielsen, Stig</au><au>Rannestad, Bjorn</au><au>Thogersen, Paul</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Online Vce measurement method for wear-out monitoring of high power IGBT modules</atitle><btitle>2013 15th European Conference on Power Electronics and Applications (EPE)</btitle><stitle>EPE</stitle><date>2013-09</date><risdate>2013</risdate><spage>1</spage><epage>7</epage><pages>1-7</pages><eisbn>9781479901166</eisbn><eisbn>1479901164</eisbn><abstract>A simple Vce online monitoring circuit is presented in this paper. It allows an accurate wear out prediction of IGBT modules, in high-power applications, during normal converter operation. Bipolar measurement allows monitoring of both IGBT and antiparallel diode. The circuit uses two serial connected diodes to sense the Vce voltage with millivolt accuracy. One diode acts as a protection to block high DC voltage present on input terminals. When the device is conducting the voltage on the second diode is measured to compensate for the voltage drop on the protection diode thus eliminating voltage offset due to diodes' forward voltage temperature dependency. Using four diodes one can monitor voltages on all power devices in a converter leg.</abstract><pub>IEEE</pub><doi>10.1109/EPE.2013.6634390</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
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| ispartof | 2013 15th European Conference on Power Electronics and Applications (EPE), 2013, p.1-7 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | ageing Current measurement diode IGBT Insulated gate bipolar transistors Measurement reliability Schottky diodes Sea measurements Temperature measurement Voltage measurement Wires |
| title | Online Vce measurement method for wear-out monitoring of high power IGBT modules |
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