Validation and extension of the temperature extraction method of conductive filaments in resistive switching materials

The resistive switching (RS) effect is among the leading future non-volatile memory technologies; however, its implementation is hampered by the lack of full understanding of the switching and conduction mechanism. The switching is generally attributed to the formation and rupture of conductive fila...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Yalon, E., Gavrilov, A., Cohen, S., Ritter, D.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Charge carrier processes Current measurement Heating Materials Switches Temperature measurement Tunneling
Online-Zugang:	Volltext bestellen
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